Temperature Dependent Remanence Loops of Ion-Milled Bit Patterned Media
Magnetic multilayered thin films with perpendicular anisotropy have been patterned into nanoscale islands by ion-milling with an oxygen-plasma patterned carbon hard mask. The islands have been studied by scanning electron microscopy (SEM) and magnetic force microscopy (MFM) to determine the switchin...
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| Veröffentlicht in: | IEEE transactions on magnetics 2008-11, Vol.44 (11), p.3468-3471 |
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| container_title | IEEE transactions on magnetics |
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| creator | Belle, B.D. Schedin, F. Ashworth, T.V. Nutter, P.W. Hill, E.W. Hug, H.J. Miles, J.J. |
| description | Magnetic multilayered thin films with perpendicular anisotropy have been patterned into nanoscale islands by ion-milling with an oxygen-plasma patterned carbon hard mask. The islands have been studied by scanning electron microscopy (SEM) and magnetic force microscopy (MFM) to determine the switching field distribution and its origin. Larger islands exhibit coercivities of ~ 450 kA/m (5.6 kOe), but coercivity falls rapidly when island diameter falls below 40 nm. The switching field distribution becomes larger in absolute terms and as a fraction of the coercivity as island diameter falls. The origin of these effects is thought to be edge damage during ion milling and intrinsic defects (grain boundaries or dislocations) in the original magnetic thin film. |
| doi_str_mv | 10.1109/TMAG.2008.2001791 |
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The islands have been studied by scanning electron microscopy (SEM) and magnetic force microscopy (MFM) to determine the switching field distribution and its origin. Larger islands exhibit coercivities of ~ 450 kA/m (5.6 kOe), but coercivity falls rapidly when island diameter falls below 40 nm. The switching field distribution becomes larger in absolute terms and as a fraction of the coercivity as island diameter falls. 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The islands have been studied by scanning electron microscopy (SEM) and magnetic force microscopy (MFM) to determine the switching field distribution and its origin. Larger islands exhibit coercivities of ~ 450 kA/m (5.6 kOe), but coercivity falls rapidly when island diameter falls below 40 nm. The switching field distribution becomes larger in absolute terms and as a fraction of the coercivity as island diameter falls. The origin of these effects is thought to be edge damage during ion milling and intrinsic defects (grain boundaries or dislocations) in the original magnetic thin film.</description><subject>Anisotropic magnetoresistance</subject><subject>Bit patterned media</subject><subject>Coercive force</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Magnetic films</subject><subject>Magnetic force microscopy</subject><subject>Magnetic forces</subject><subject>magnetic recording magnetic thin films</subject><subject>Magnetic switching</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Milling</subject><subject>nanostructures</subject><subject>Other topics in materials science</subject><subject>Physics</subject><subject>Remanence</subject><subject>Scanning electron microscopy</subject><subject>switching field distributions</subject><subject>temperature</subject><subject>Temperature dependence</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkFFLwzAQgIMoOKc_QHwpgr51Jk3SNo9z6hxsKDKfQ5pcoaNLatI--O9N2diDEC7c3XfH8SF0S_CMECyetpv5cpZhXI6BFIKcoQkRjKQY5-IcTWKxTAXL2SW6CmEXU8YJnqDlFvYdeNUPHpIX6MAasH3yBXtlwWpI1s51IXF1snI23TRtCyZ5bvrkU_U9eBuzDZhGXaOLWrUBbo7_FH2_vW4X7-n6Y7lazNepppz2qSmUrkluKOc0q0tR1YIKo4GUhmPOmK4gVyUGZRhXVXyVKZmocq3ysshwRafo8bC38-5ngNDLfRM0tG081w1BUsY5zzMRwft_4M4N3sbbpBgVMcJphMgB0t6F4KGWnW_2yv9KguXoVY5e5ehVHr3GmYfjYhW0amuvrG7CaTAjmGFWZJG7O3ANAJzarCAFZRn9A1G-f-4</recordid><startdate>20081101</startdate><enddate>20081101</enddate><creator>Belle, B.D.</creator><creator>Schedin, F.</creator><creator>Ashworth, T.V.</creator><creator>Nutter, P.W.</creator><creator>Hill, E.W.</creator><creator>Hug, H.J.</creator><creator>Miles, J.J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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The islands have been studied by scanning electron microscopy (SEM) and magnetic force microscopy (MFM) to determine the switching field distribution and its origin. Larger islands exhibit coercivities of ~ 450 kA/m (5.6 kOe), but coercivity falls rapidly when island diameter falls below 40 nm. The switching field distribution becomes larger in absolute terms and as a fraction of the coercivity as island diameter falls. The origin of these effects is thought to be edge damage during ion milling and intrinsic defects (grain boundaries or dislocations) in the original magnetic thin film.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2008.2001791</doi><tpages>4</tpages></addata></record> |
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| subjects | Anisotropic magnetoresistance Bit patterned media Coercive force Cross-disciplinary physics: materials science rheology Exact sciences and technology Magnetic films Magnetic force microscopy Magnetic forces magnetic recording magnetic thin films Magnetic switching Magnetism Materials science Methods of deposition of films and coatings film growth and epitaxy Milling nanostructures Other topics in materials science Physics Remanence Scanning electron microscopy switching field distributions temperature Temperature dependence |
| title | Temperature Dependent Remanence Loops of Ion-Milled Bit Patterned Media |
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