Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting

3D integration is the key to advanced microelectronic systems. Die-to-wafer assembly is a necessary step to reach full integration. Self-assembly methods are promising due to their parallel aspect, which overcomes the main difficulties of the current techniques. Especially promising are the self-ass...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Sensors & transducers 2011-12, Vol.13, p.44
Hauptverfasser: Berthier, Jean, Brakke, Kenneth, Mermoz, Sébastien, Sanchez, Loïc, Fretigny, Christian, Di Cioccio, Léa
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page 44
container_title Sensors & transducers
container_volume 13
creator Berthier, Jean
Brakke, Kenneth
Mermoz, Sébastien
Sanchez, Loïc
Fretigny, Christian
Di Cioccio, Léa
description 3D integration is the key to advanced microelectronic systems. Die-to-wafer assembly is a necessary step to reach full integration. Self-assembly methods are promising due to their parallel aspect, which overcomes the main difficulties of the current techniques. Especially promising are the self-assembly methods based on capillary alignment. In such a method, capillary forces are used to align the chip and evaporation of the liquid droplet eventually leads to contact and direct bonding of the chip on the fixed pad. In a preceding work, the stable and unstable displacement modes have been investigated, assuming that the fluid completely wets the surfaces of the chip and the fixed pad, and that the liquid is anchored to the all the edges. However, it appears that these assumptions are the most favorable case, which is not always reached. Poor spreading and/or occasional overflow of the liquid are the causes of poor alignment. In this work we focus on the mechanisms of spreading and overflow, and analyze the motion of the chip during the spreading. [PUBLICATION ABSTRACT]
format Article
fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_917548330</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2569073291</sourcerecordid><originalsourceid>FETCH-LOGICAL-p97t-552afdaa4111d9b04d1c1ecb55e0951cdb9ac87fae3fe76e131367b162d9c6b93</originalsourceid><addsrcrecordid>eNotjk9LwzAYxoMoOOa-Q_BeyNs0TeNNytTB0MMGO463yZsus0trm_n5LczT8zs8_-7YAnReZqrQ5p4tcinKrFKgHtlqms5CCBBam1ws2PeOOp9hF9p4oZh47_kudMH2kdenMEx8hgN6GqcXjvzzeqExWOz4Jv7SlEKLKcyOOZVOxNfek711DCOhC7HlGB0_UEozP7EHj91Eq39dsv3bel9_ZNuv9039us0Go1OmVI7eIRYA4EwjCgcWyDZKkTAKrGsM2kp7JOlJlwQSZKkbKHNnbNkYuWTPt9ph7H-u88vjub-OcV48GtCqqKQU8g_KJ1YN</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>917548330</pqid></control><display><type>article</type><title>Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting</title><source>EZB-FREE-00999 freely available EZB journals</source><source>Alma/SFX Local Collection</source><creator>Berthier, Jean ; Brakke, Kenneth ; Mermoz, Sébastien ; Sanchez, Loïc ; Fretigny, Christian ; Di Cioccio, Léa</creator><creatorcontrib>Berthier, Jean ; Brakke, Kenneth ; Mermoz, Sébastien ; Sanchez, Loïc ; Fretigny, Christian ; Di Cioccio, Léa</creatorcontrib><description>3D integration is the key to advanced microelectronic systems. Die-to-wafer assembly is a necessary step to reach full integration. Self-assembly methods are promising due to their parallel aspect, which overcomes the main difficulties of the current techniques. Especially promising are the self-assembly methods based on capillary alignment. In such a method, capillary forces are used to align the chip and evaporation of the liquid droplet eventually leads to contact and direct bonding of the chip on the fixed pad. In a preceding work, the stable and unstable displacement modes have been investigated, assuming that the fluid completely wets the surfaces of the chip and the fixed pad, and that the liquid is anchored to the all the edges. However, it appears that these assumptions are the most favorable case, which is not always reached. Poor spreading and/or occasional overflow of the liquid are the causes of poor alignment. In this work we focus on the mechanisms of spreading and overflow, and analyze the motion of the chip during the spreading. [PUBLICATION ABSTRACT]</description><identifier>ISSN: 2306-8515</identifier><identifier>EISSN: 1726-5479</identifier><language>eng</language><publisher>Toronto: IFSA Publishing, S.L</publisher><subject>Asymmetry ; Experiments ; Methods ; Numerical analysis ; Studies</subject><ispartof>Sensors &amp; transducers, 2011-12, Vol.13, p.44</ispartof><rights>Copyright International Frequency Sensor Association Dec 2011</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784</link.rule.ids></links><search><creatorcontrib>Berthier, Jean</creatorcontrib><creatorcontrib>Brakke, Kenneth</creatorcontrib><creatorcontrib>Mermoz, Sébastien</creatorcontrib><creatorcontrib>Sanchez, Loïc</creatorcontrib><creatorcontrib>Fretigny, Christian</creatorcontrib><creatorcontrib>Di Cioccio, Léa</creatorcontrib><title>Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting</title><title>Sensors &amp; transducers</title><description>3D integration is the key to advanced microelectronic systems. Die-to-wafer assembly is a necessary step to reach full integration. Self-assembly methods are promising due to their parallel aspect, which overcomes the main difficulties of the current techniques. Especially promising are the self-assembly methods based on capillary alignment. In such a method, capillary forces are used to align the chip and evaporation of the liquid droplet eventually leads to contact and direct bonding of the chip on the fixed pad. In a preceding work, the stable and unstable displacement modes have been investigated, assuming that the fluid completely wets the surfaces of the chip and the fixed pad, and that the liquid is anchored to the all the edges. However, it appears that these assumptions are the most favorable case, which is not always reached. Poor spreading and/or occasional overflow of the liquid are the causes of poor alignment. In this work we focus on the mechanisms of spreading and overflow, and analyze the motion of the chip during the spreading. [PUBLICATION ABSTRACT]</description><subject>Asymmetry</subject><subject>Experiments</subject><subject>Methods</subject><subject>Numerical analysis</subject><subject>Studies</subject><issn>2306-8515</issn><issn>1726-5479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNotjk9LwzAYxoMoOOa-Q_BeyNs0TeNNytTB0MMGO463yZsus0trm_n5LczT8zs8_-7YAnReZqrQ5p4tcinKrFKgHtlqms5CCBBam1ws2PeOOp9hF9p4oZh47_kudMH2kdenMEx8hgN6GqcXjvzzeqExWOz4Jv7SlEKLKcyOOZVOxNfek711DCOhC7HlGB0_UEozP7EHj91Eq39dsv3bel9_ZNuv9039us0Go1OmVI7eIRYA4EwjCgcWyDZKkTAKrGsM2kp7JOlJlwQSZKkbKHNnbNkYuWTPt9ph7H-u88vjub-OcV48GtCqqKQU8g_KJ1YN</recordid><startdate>20111201</startdate><enddate>20111201</enddate><creator>Berthier, Jean</creator><creator>Brakke, Kenneth</creator><creator>Mermoz, Sébastien</creator><creator>Sanchez, Loïc</creator><creator>Fretigny, Christian</creator><creator>Di Cioccio, Léa</creator><general>IFSA Publishing, S.L</general><scope>3V.</scope><scope>4T-</scope><scope>4U-</scope><scope>7SP</scope><scope>7XB</scope><scope>88I</scope><scope>88K</scope><scope>8AL</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BFMQW</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>CLZPN</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L6V</scope><scope>L7M</scope><scope>M0N</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0W</scope></search><sort><creationdate>20111201</creationdate><title>Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting</title><author>Berthier, Jean ; Brakke, Kenneth ; Mermoz, Sébastien ; Sanchez, Loïc ; Fretigny, Christian ; Di Cioccio, Léa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p97t-552afdaa4111d9b04d1c1ecb55e0951cdb9ac87fae3fe76e131367b162d9c6b93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Asymmetry</topic><topic>Experiments</topic><topic>Methods</topic><topic>Numerical analysis</topic><topic>Studies</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Berthier, Jean</creatorcontrib><creatorcontrib>Brakke, Kenneth</creatorcontrib><creatorcontrib>Mermoz, Sébastien</creatorcontrib><creatorcontrib>Sanchez, Loïc</creatorcontrib><creatorcontrib>Fretigny, Christian</creatorcontrib><creatorcontrib>Di Cioccio, Léa</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>Docstoc</collection><collection>University Readers</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Continental Europe Database</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>Latin America &amp; Iberia Database</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computing Database</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>DELNET Engineering &amp; Technology Collection</collection><jtitle>Sensors &amp; transducers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Berthier, Jean</au><au>Brakke, Kenneth</au><au>Mermoz, Sébastien</au><au>Sanchez, Loïc</au><au>Fretigny, Christian</au><au>Di Cioccio, Léa</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting</atitle><jtitle>Sensors &amp; transducers</jtitle><date>2011-12-01</date><risdate>2011</risdate><volume>13</volume><spage>44</spage><pages>44-</pages><issn>2306-8515</issn><eissn>1726-5479</eissn><abstract>3D integration is the key to advanced microelectronic systems. Die-to-wafer assembly is a necessary step to reach full integration. Self-assembly methods are promising due to their parallel aspect, which overcomes the main difficulties of the current techniques. Especially promising are the self-assembly methods based on capillary alignment. In such a method, capillary forces are used to align the chip and evaporation of the liquid droplet eventually leads to contact and direct bonding of the chip on the fixed pad. In a preceding work, the stable and unstable displacement modes have been investigated, assuming that the fluid completely wets the surfaces of the chip and the fixed pad, and that the liquid is anchored to the all the edges. However, it appears that these assumptions are the most favorable case, which is not always reached. Poor spreading and/or occasional overflow of the liquid are the causes of poor alignment. In this work we focus on the mechanisms of spreading and overflow, and analyze the motion of the chip during the spreading. [PUBLICATION ABSTRACT]</abstract><cop>Toronto</cop><pub>IFSA Publishing, S.L</pub><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 2306-8515
ispartof Sensors & transducers, 2011-12, Vol.13, p.44
issn 2306-8515
1726-5479
language eng
recordid cdi_proquest_journals_917548330
source EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection
subjects Asymmetry
Experiments
Methods
Numerical analysis
Studies
title Self-alignment of Silicon Chips on Wafers: a Numerical Investigation of the Effect of Spreading and Wetting
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T16%3A44%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Self-alignment%20of%20Silicon%20Chips%20on%20Wafers:%20a%20Numerical%20Investigation%20of%20the%20Effect%20of%20Spreading%20and%20Wetting&rft.jtitle=Sensors%20&%20transducers&rft.au=Berthier,%20Jean&rft.date=2011-12-01&rft.volume=13&rft.spage=44&rft.pages=44-&rft.issn=2306-8515&rft.eissn=1726-5479&rft_id=info:doi/&rft_dat=%3Cproquest%3E2569073291%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=917548330&rft_id=info:pmid/&rfr_iscdi=true