Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes
YBCO thin films were grown on NiW tapes under continuous moving deposition process. All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve perfor...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 2011-06, Vol.21 (3), p.2924-2927 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Li, Yijie Liu, Linfei Liu, Huaran Sun, Xiaokun Hong, Dan Xu, Da Wang, Ying |
| description | YBCO thin films were grown on NiW tapes under continuous moving deposition process. All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve performance/price ratio of coated conductor for large scale applications, we focused our research work on enhancing critical current density of YBCO layers on NiW substrates. It was found that superconducting transport properties of YBCO layers were dependent on not only in-plane texture but also surface morphology of buffer layers, especially surface structure and large particles along grain boundary in NiW substrates. High quality YBCO layers with >; 4.0 × 10 6 A/cm 2 (at 77 K, in zero magnetic field) were fabricated on cap layers with nano-scale surface roughness. |
| doi_str_mv | 10.1109/TASC.2010.2083614 |
| format | Article |
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All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve performance/price ratio of coated conductor for large scale applications, we focused our research work on enhancing critical current density of YBCO layers on NiW substrates. It was found that superconducting transport properties of YBCO layers were dependent on not only in-plane texture but also surface morphology of buffer layers, especially surface structure and large particles along grain boundary in NiW substrates. High quality YBCO layers with >; 4.0 × 10 6 A/cm 2 (at 77 K, in zero magnetic field) were fabricated on cap layers with nano-scale surface roughness.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2010.2083614</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Buffer layers ; coated conductors ; COPPER OXIDE ; Critical current density ; CURRENT DENSITY ; DENSITY ; DEPOSITION ; Electric connection. Cables. Wiring ; Electrical engineering. Electrical power engineering ; Electromagnets ; Electronics ; epitaxial growth ; Exact sciences and technology ; Microelectronic fabrication (materials and surfaces technology) ; MICROSTRUCTURES ; Morphology ; Nanostructure ; Ni tapes ; Rough surfaces ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Substrates ; Superconducting tapes ; SUPERCONDUCTORS ; Surface morphology ; Surface roughness ; Surface treatment ; TAPE ; Texture ; TEXTURES ; Thin films ; Various equipment and components ; YBCO superconductors ; Yttrium barium copper oxide ; YTTRIUM OXIDE</subject><ispartof>IEEE transactions on applied superconductivity, 2011-06, Vol.21 (3), p.2924-2927</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-adf30030cbcf7d956306450bfa9e5c0644ee21ec7168a373c5210ec6157e03eb3</citedby><cites>FETCH-LOGICAL-c355t-adf30030cbcf7d956306450bfa9e5c0644ee21ec7168a373c5210ec6157e03eb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5634087$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23910,23911,25119,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5634087$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=24276218$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Li, Yijie</creatorcontrib><creatorcontrib>Liu, Linfei</creatorcontrib><creatorcontrib>Liu, Huaran</creatorcontrib><creatorcontrib>Sun, Xiaokun</creatorcontrib><creatorcontrib>Hong, Dan</creatorcontrib><creatorcontrib>Xu, Da</creatorcontrib><creatorcontrib>Wang, Ying</creatorcontrib><title>Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>YBCO thin films were grown on NiW tapes under continuous moving deposition process. All of YBCO layer, buffer layer, and cap layer were deposited in a compact reel-to-reel pulsed laser deposition system. Since high critical current density is the most important and effective factor to improve performance/price ratio of coated conductor for large scale applications, we focused our research work on enhancing critical current density of YBCO layers on NiW substrates. It was found that superconducting transport properties of YBCO layers were dependent on not only in-plane texture but also surface morphology of buffer layers, especially surface structure and large particles along grain boundary in NiW substrates. High quality YBCO layers with >; 4.0 × 10 6 A/cm 2 (at 77 K, in zero magnetic field) were fabricated on cap layers with nano-scale surface roughness.</description><subject>Applied sciences</subject><subject>Buffer layers</subject><subject>coated conductors</subject><subject>COPPER OXIDE</subject><subject>Critical current density</subject><subject>CURRENT DENSITY</subject><subject>DENSITY</subject><subject>DEPOSITION</subject><subject>Electric connection. Cables. Wiring</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electromagnets</subject><subject>Electronics</subject><subject>epitaxial growth</subject><subject>Exact sciences and technology</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>MICROSTRUCTURES</subject><subject>Morphology</subject><subject>Nanostructure</subject><subject>Ni tapes</subject><subject>Rough surfaces</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Substrates</subject><subject>Superconducting tapes</subject><subject>SUPERCONDUCTORS</subject><subject>Surface morphology</subject><subject>Surface roughness</subject><subject>Surface treatment</subject><subject>TAPE</subject><subject>Texture</subject><subject>TEXTURES</subject><subject>Thin films</subject><subject>Various equipment and components</subject><subject>YBCO superconductors</subject><subject>Yttrium barium copper oxide</subject><subject>YTTRIUM OXIDE</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMFO3DAQhi1EJWDbB0BcLCQkLqEzduwkR0hpi7TAga2qniyvd9wGhTi1k8O-fb3aFYdeZv7xfDNj_YydI9wgQvN5dfvS3gjIpYBaaiyP2CkqVRdCoTrOGhQWtRDyhJ2l9AqAZV2qU7Z5GHw_0-CIB8_vZu8p8qXd5vgyR2_z-2OI45_Qh99bHgb-66595m3sps7ZnrdzjDRM_AsNqZu2OY8hC9rs0KfuJ1_ZkdJH9sHbPtGnQ16wH1_vV-33Yvn87aG9XRZOKjUVduMlgAS3dr7aNEpL0KWCtbcNKZd1SSSQXIW6trKSTgkEchpVRSBpLRfser93jOHvTGkyb11y1Pd2oDAng7pCqbVuyoxe_oe-hjkO-XemQaV1Dfn8guEecjGkFMmbMXZvNm4NgtnZbna2m53t5mB7nrk6LLYpO-SjHVyX3gdFKSotsM7cxZ7riOi9nY-WUFfyH2Ezia0</recordid><startdate>20110601</startdate><enddate>20110601</enddate><creator>Li, Yijie</creator><creator>Liu, Linfei</creator><creator>Liu, Huaran</creator><creator>Sun, Xiaokun</creator><creator>Hong, Dan</creator><creator>Xu, Da</creator><creator>Wang, Ying</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Cables. Wiring</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electromagnets</topic><topic>Electronics</topic><topic>epitaxial growth</topic><topic>Exact sciences and technology</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>MICROSTRUCTURES</topic><topic>Morphology</topic><topic>Nanostructure</topic><topic>Ni tapes</topic><topic>Rough surfaces</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. 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| subjects | Applied sciences Buffer layers coated conductors COPPER OXIDE Critical current density CURRENT DENSITY DENSITY DEPOSITION Electric connection. Cables. Wiring Electrical engineering. Electrical power engineering Electromagnets Electronics epitaxial growth Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) MICROSTRUCTURES Morphology Nanostructure Ni tapes Rough surfaces Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Substrates Superconducting tapes SUPERCONDUCTORS Surface morphology Surface roughness Surface treatment TAPE Texture TEXTURES Thin films Various equipment and components YBCO superconductors Yttrium barium copper oxide YTTRIUM OXIDE |
| title | Influence of Buffer Layer Surface Morphology on YBCO Critical Current Density Deposited on NiW Tapes |
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