Ultimate RF Performance Potential of Carbon Electronics
Carbon electronics based on carbon nanotube array field-effect transistors (AFETs) and 2-D graphene field-effect transistors (GFETs) have recently attracted significant attention for potential RF applications. Here, we explore the ultimate RF performance potential for these two unique devices using...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2011-10, Vol.59 (10), p.2739-2750 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2750 |
---|---|
container_issue | 10 |
container_start_page | 2739 |
container_title | IEEE transactions on microwave theory and techniques |
container_volume | 59 |
creator | Koswatta, S. O. Valdes-Garcia, A. Steiner, M. B. Yu-Ming Lin Avouris, P. |
description | Carbon electronics based on carbon nanotube array field-effect transistors (AFETs) and 2-D graphene field-effect transistors (GFETs) have recently attracted significant attention for potential RF applications. Here, we explore the ultimate RF performance potential for these two unique devices using semiclassical ballistic transport simulations. It is shown that the intrinsic current-gain and power-gain cutoff frequencies ( fT and f MAX ) above 1 THz should be possible in both AFETs and GFETs. Thus, both devices could deliver higher cutoff frequencies than traditional semiconductors such as Si and III-V's. In the case of AFETs, we show that their RF operation is not sensitive to the diameter variation of semiconducting tubes and the presence of metallic tubes in the channel. The ultimate fT and f MAX values in AFETs are observed to be higher than that in GFETs. The optimum device biasing conditions for AFETs require smaller biasing currents, and thus, lower power dissipation compared to GFETs. The degradation in high-frequency performance in the presence of external parasitics is also seen to be lower in AFETs compared to GFETs. |
doi_str_mv | 10.1109/TMTT.2011.2150241 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_913426357</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5783319</ieee_id><sourcerecordid>963854470</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-3a737d5e841a29a0bfd296dd5a6d23d7f256b1d2b8c0237fcc24ddbcea6f56323</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWKs_QLwsXjxtzXc2RymtChWLbM8hm0xgy3ZTk-3Bf--WFg-ehoHnfZl5ELoneEYI1s_1R13PKCZkRonAlJMLNCFCqFJLhS_RBGNSlZpX-Brd5LwdVy5wNUFq0w3tzg5QfC2LNaQQ0872Dop1HKAfWtsVMRRzm5rYF4sO3JBi37p8i66C7TLcnecUbZaLev5Wrj5f3-cvq9IxqYaSWcWUF1BxYqm2uAmeaum9sNJT5lWgQjbE06ZymDIVnKPc-8aBlUFIRtkUPZ169yl-HyAPZtdmB11ne4iHbLRkleBc4ZF8_Edu4yH143FGE8apZEKNEDlBLsWcEwSzT-P76ccQbI4izVGkOYo0Z5Fj5uGUaQHgjxeqYoxo9guV524A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>913426357</pqid></control><display><type>article</type><title>Ultimate RF Performance Potential of Carbon Electronics</title><source>IEEE Xplore</source><creator>Koswatta, S. O. ; Valdes-Garcia, A. ; Steiner, M. B. ; Yu-Ming Lin ; Avouris, P.</creator><creatorcontrib>Koswatta, S. O. ; Valdes-Garcia, A. ; Steiner, M. B. ; Yu-Ming Lin ; Avouris, P.</creatorcontrib><description>Carbon electronics based on carbon nanotube array field-effect transistors (AFETs) and 2-D graphene field-effect transistors (GFETs) have recently attracted significant attention for potential RF applications. Here, we explore the ultimate RF performance potential for these two unique devices using semiclassical ballistic transport simulations. It is shown that the intrinsic current-gain and power-gain cutoff frequencies ( fT and f MAX ) above 1 THz should be possible in both AFETs and GFETs. Thus, both devices could deliver higher cutoff frequencies than traditional semiconductors such as Si and III-V's. In the case of AFETs, we show that their RF operation is not sensitive to the diameter variation of semiconducting tubes and the presence of metallic tubes in the channel. The ultimate fT and f MAX values in AFETs are observed to be higher than that in GFETs. The optimum device biasing conditions for AFETs require smaller biasing currents, and thus, lower power dissipation compared to GFETs. The degradation in high-frequency performance in the presence of external parasitics is also seen to be lower in AFETs compared to GFETs.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2011.2150241</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Ballistic transport ; Carbon ; Carbon nanotube (CNT) ; Devices ; Electron tubes ; Electronics ; field-effect transistor (FET) ; Graphene ; Logic gates ; Nanotubes ; Performance evaluation ; Quantum capacitance ; Radio frequencies ; Radio frequency ; Semiconductors ; Transistors ; Tubes</subject><ispartof>IEEE transactions on microwave theory and techniques, 2011-10, Vol.59 (10), p.2739-2750</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2011</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-3a737d5e841a29a0bfd296dd5a6d23d7f256b1d2b8c0237fcc24ddbcea6f56323</citedby><cites>FETCH-LOGICAL-c367t-3a737d5e841a29a0bfd296dd5a6d23d7f256b1d2b8c0237fcc24ddbcea6f56323</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5783319$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5783319$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Koswatta, S. O.</creatorcontrib><creatorcontrib>Valdes-Garcia, A.</creatorcontrib><creatorcontrib>Steiner, M. B.</creatorcontrib><creatorcontrib>Yu-Ming Lin</creatorcontrib><creatorcontrib>Avouris, P.</creatorcontrib><title>Ultimate RF Performance Potential of Carbon Electronics</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>Carbon electronics based on carbon nanotube array field-effect transistors (AFETs) and 2-D graphene field-effect transistors (GFETs) have recently attracted significant attention for potential RF applications. Here, we explore the ultimate RF performance potential for these two unique devices using semiclassical ballistic transport simulations. It is shown that the intrinsic current-gain and power-gain cutoff frequencies ( fT and f MAX ) above 1 THz should be possible in both AFETs and GFETs. Thus, both devices could deliver higher cutoff frequencies than traditional semiconductors such as Si and III-V's. In the case of AFETs, we show that their RF operation is not sensitive to the diameter variation of semiconducting tubes and the presence of metallic tubes in the channel. The ultimate fT and f MAX values in AFETs are observed to be higher than that in GFETs. The optimum device biasing conditions for AFETs require smaller biasing currents, and thus, lower power dissipation compared to GFETs. The degradation in high-frequency performance in the presence of external parasitics is also seen to be lower in AFETs compared to GFETs.</description><subject>Ballistic transport</subject><subject>Carbon</subject><subject>Carbon nanotube (CNT)</subject><subject>Devices</subject><subject>Electron tubes</subject><subject>Electronics</subject><subject>field-effect transistor (FET)</subject><subject>Graphene</subject><subject>Logic gates</subject><subject>Nanotubes</subject><subject>Performance evaluation</subject><subject>Quantum capacitance</subject><subject>Radio frequencies</subject><subject>Radio frequency</subject><subject>Semiconductors</subject><subject>Transistors</subject><subject>Tubes</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKs_QLwsXjxtzXc2RymtChWLbM8hm0xgy3ZTk-3Bf--WFg-ehoHnfZl5ELoneEYI1s_1R13PKCZkRonAlJMLNCFCqFJLhS_RBGNSlZpX-Brd5LwdVy5wNUFq0w3tzg5QfC2LNaQQ0872Dop1HKAfWtsVMRRzm5rYF4sO3JBi37p8i66C7TLcnecUbZaLev5Wrj5f3-cvq9IxqYaSWcWUF1BxYqm2uAmeaum9sNJT5lWgQjbE06ZymDIVnKPc-8aBlUFIRtkUPZ169yl-HyAPZtdmB11ne4iHbLRkleBc4ZF8_Edu4yH143FGE8apZEKNEDlBLsWcEwSzT-P76ccQbI4izVGkOYo0Z5Fj5uGUaQHgjxeqYoxo9guV524A</recordid><startdate>20111001</startdate><enddate>20111001</enddate><creator>Koswatta, S. O.</creator><creator>Valdes-Garcia, A.</creator><creator>Steiner, M. B.</creator><creator>Yu-Ming Lin</creator><creator>Avouris, P.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20111001</creationdate><title>Ultimate RF Performance Potential of Carbon Electronics</title><author>Koswatta, S. O. ; Valdes-Garcia, A. ; Steiner, M. B. ; Yu-Ming Lin ; Avouris, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-3a737d5e841a29a0bfd296dd5a6d23d7f256b1d2b8c0237fcc24ddbcea6f56323</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Ballistic transport</topic><topic>Carbon</topic><topic>Carbon nanotube (CNT)</topic><topic>Devices</topic><topic>Electron tubes</topic><topic>Electronics</topic><topic>field-effect transistor (FET)</topic><topic>Graphene</topic><topic>Logic gates</topic><topic>Nanotubes</topic><topic>Performance evaluation</topic><topic>Quantum capacitance</topic><topic>Radio frequencies</topic><topic>Radio frequency</topic><topic>Semiconductors</topic><topic>Transistors</topic><topic>Tubes</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Koswatta, S. O.</creatorcontrib><creatorcontrib>Valdes-Garcia, A.</creatorcontrib><creatorcontrib>Steiner, M. B.</creatorcontrib><creatorcontrib>Yu-Ming Lin</creatorcontrib><creatorcontrib>Avouris, P.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Koswatta, S. O.</au><au>Valdes-Garcia, A.</au><au>Steiner, M. B.</au><au>Yu-Ming Lin</au><au>Avouris, P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ultimate RF Performance Potential of Carbon Electronics</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2011-10-01</date><risdate>2011</risdate><volume>59</volume><issue>10</issue><spage>2739</spage><epage>2750</epage><pages>2739-2750</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>Carbon electronics based on carbon nanotube array field-effect transistors (AFETs) and 2-D graphene field-effect transistors (GFETs) have recently attracted significant attention for potential RF applications. Here, we explore the ultimate RF performance potential for these two unique devices using semiclassical ballistic transport simulations. It is shown that the intrinsic current-gain and power-gain cutoff frequencies ( fT and f MAX ) above 1 THz should be possible in both AFETs and GFETs. Thus, both devices could deliver higher cutoff frequencies than traditional semiconductors such as Si and III-V's. In the case of AFETs, we show that their RF operation is not sensitive to the diameter variation of semiconducting tubes and the presence of metallic tubes in the channel. The ultimate fT and f MAX values in AFETs are observed to be higher than that in GFETs. The optimum device biasing conditions for AFETs require smaller biasing currents, and thus, lower power dissipation compared to GFETs. The degradation in high-frequency performance in the presence of external parasitics is also seen to be lower in AFETs compared to GFETs.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMTT.2011.2150241</doi><tpages>12</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9480 |
ispartof | IEEE transactions on microwave theory and techniques, 2011-10, Vol.59 (10), p.2739-2750 |
issn | 0018-9480 1557-9670 |
language | eng |
recordid | cdi_proquest_journals_913426357 |
source | IEEE Xplore |
subjects | Ballistic transport Carbon Carbon nanotube (CNT) Devices Electron tubes Electronics field-effect transistor (FET) Graphene Logic gates Nanotubes Performance evaluation Quantum capacitance Radio frequencies Radio frequency Semiconductors Transistors Tubes |
title | Ultimate RF Performance Potential of Carbon Electronics |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-18T18%3A18%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ultimate%20RF%20Performance%20Potential%20of%20Carbon%20Electronics&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Koswatta,%20S.%20O.&rft.date=2011-10-01&rft.volume=59&rft.issue=10&rft.spage=2739&rft.epage=2750&rft.pages=2739-2750&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.2011.2150241&rft_dat=%3Cproquest_RIE%3E963854470%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=913426357&rft_id=info:pmid/&rft_ieee_id=5783319&rfr_iscdi=true |