An Over-60 dB True Rail-to-Rail Performance Using Correlated Level Shifting and an Opamp With Only 30 dB Loop Gain
Correlated level shifting (CLS) is introduced as a new switched-capacitor technique to provide true rail-to-rail performance while reducing errors from finite opamp gain. There is negligible kT/C noise increase and in many cases a speed advantage compared to using a high gain opamp. The gain enhance...
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| Veröffentlicht in: | IEEE journal of solid-state circuits 2008-12, Vol.43 (12), p.2620-2630 |
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| container_title | IEEE journal of solid-state circuits |
| container_volume | 43 |
| creator | Gregoire, B.R. Un-Ku Moon |
| description | Correlated level shifting (CLS) is introduced as a new switched-capacitor technique to provide true rail-to-rail performance while reducing errors from finite opamp gain. There is negligible kT/C noise increase and in many cases a speed advantage compared to using a high gain opamp. The gain enhancement is quantified with formulas and the general technique is compared to correlated double sampling (CDS). Results are presented from a 0.18 mum CMOS testchip of a 20 MHz, 12-bit pipelined A/D converter using CLS to reduce errors from finite opamp dc gain and limited opamp swing. It achieves 10.5 ENOB operating beyond the supply rails using an opamp circuit with 30 dB loop gain and 0.9 V supply. |
| doi_str_mv | 10.1109/JSSC.2008.2006312 |
| format | Article |
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There is negligible kT/C noise increase and in many cases a speed advantage compared to using a high gain opamp. The gain enhancement is quantified with formulas and the general technique is compared to correlated double sampling (CDS). Results are presented from a 0.18 mum CMOS testchip of a 20 MHz, 12-bit pipelined A/D converter using CLS to reduce errors from finite opamp dc gain and limited opamp swing. It achieves 10.5 ENOB operating beyond the supply rails using an opamp circuit with 30 dB loop gain and 0.9 V supply.</description><subject>Amplifiers</subject><subject>Analog circuits</subject><subject>Analog-digital conversion</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Circuit testing</subject><subject>Computer errors</subject><subject>Computer science</subject><subject>Correlated double sampling (CDS)</subject><subject>correlated level shifting (CLS)</subject><subject>Design. Technologies. Operation analysis. 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| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9200 |
| ispartof | IEEE journal of solid-state circuits, 2008-12, Vol.43 (12), p.2620-2630 |
| issn | 0018-9200 1558-173X |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Amplifiers Analog circuits Analog-digital conversion Applied sciences Circuit properties Circuit testing Computer errors Computer science Correlated double sampling (CDS) correlated level shifting (CLS) Design. Technologies. Operation analysis. Testing Dielectric, amorphous and glass solid devices Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Moon Performance gain pipelined analog-to-digital converter Rail to rail amplifiers rail-to-rail Sampling methods Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal convertors Voltage |
| title | An Over-60 dB True Rail-to-Rail Performance Using Correlated Level Shifting and an Opamp With Only 30 dB Loop Gain |
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