Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires

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Veröffentlicht in:IEEE transactions on applied superconductivity 2005-06, Vol.15 (2), p.2526-2529
Hauptverfasser: JIANG, J, CAI, X. Y, YUAN, Y, POLYANSKII, A. A, HELLSTROM, E. E, LARBALESTIER, D. C, MARONI, V. A, HOLESINGER, T. G, HUANG, Y
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container_end_page 2529
container_issue 2
container_start_page 2526
container_title IEEE transactions on applied superconductivity
container_volume 15
creator JIANG, J
CAI, X. Y
YUAN, Y
POLYANSKII, A. A
HELLSTROM, E. E
LARBALESTIER, D. C
MARONI, V. A
HOLESINGER, T. G
HUANG, Y
description
doi_str_mv 10.1109/TASC.2005.847516
format Article
fullrecord <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_journals_912086080</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2543657721</sourcerecordid><originalsourceid>FETCH-LOGICAL-p127t-df22284e037f3936d4d4ca493c7e52b540b65f0e03ee0558c7f700ad26573f603</originalsourceid><addsrcrecordid>eNotj81LAzEQxYMoWKt3j0EQWnDrZJLsx7Fd_IJChdbzkm6yktLursmu2pt_utEWBuYN7_1mGEKuGUwYg-x-NV3mEwSQk1QkksUnZMCkTCOUTJ4GDZJFKSI_JxfebwCYSIUckJ95U7_TzrgdVXVt1Jb6rtf7MGhaNru28bazTU0_lbPqX1WNo87ovrQBdMZb3QdqZnHpMFd5j4tvOkJkOKa2pqOZvaOv6_HBxbznBxv5mH7ZgF-Ss0ptvbk69iF5e3xY5c_RfPH0kk_nUcsw6SJdBSYVBnhS8YzHWmhRKpHxMjES11LAOpYVBN8YCH-XSZUAKI2xTHgVAx-Sm8Pe1jUfvfFdsWl6V4eTRcYQ0hjSv9DtMaR8qbaVU3VpfdE6u1NuX7A4Q8FD_QIfFmn4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>912086080</pqid></control><display><type>article</type><title>Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires</title><source>IEEE Electronic Library (IEL)</source><creator>JIANG, J ; CAI, X. Y ; YUAN, Y ; POLYANSKII, A. A ; HELLSTROM, E. E ; LARBALESTIER, D. C ; MARONI, V. A ; HOLESINGER, T. G ; HUANG, Y</creator><creatorcontrib>JIANG, J ; CAI, X. Y ; YUAN, Y ; POLYANSKII, A. A ; HELLSTROM, E. E ; LARBALESTIER, D. C ; MARONI, V. A ; HOLESINGER, T. G ; HUANG, Y</creatorcontrib><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/TASC.2005.847516</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Applied sciences ; Connection and protection apparatus ; Electrical engineering. Electrical power engineering ; Exact sciences and technology</subject><ispartof>IEEE transactions on applied superconductivity, 2005-06, Vol.15 (2), p.2526-2529</ispartof><rights>2005 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=16924324$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>JIANG, J</creatorcontrib><creatorcontrib>CAI, X. Y</creatorcontrib><creatorcontrib>YUAN, Y</creatorcontrib><creatorcontrib>POLYANSKII, A. A</creatorcontrib><creatorcontrib>HELLSTROM, E. E</creatorcontrib><creatorcontrib>LARBALESTIER, D. C</creatorcontrib><creatorcontrib>MARONI, V. A</creatorcontrib><creatorcontrib>HOLESINGER, T. G</creatorcontrib><creatorcontrib>HUANG, Y</creatorcontrib><title>Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires</title><title>IEEE transactions on applied superconductivity</title><subject>Applied sciences</subject><subject>Connection and protection apparatus</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Exact sciences and technology</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotj81LAzEQxYMoWKt3j0EQWnDrZJLsx7Fd_IJChdbzkm6yktLursmu2pt_utEWBuYN7_1mGEKuGUwYg-x-NV3mEwSQk1QkksUnZMCkTCOUTJ4GDZJFKSI_JxfebwCYSIUckJ95U7_TzrgdVXVt1Jb6rtf7MGhaNru28bazTU0_lbPqX1WNo87ovrQBdMZb3QdqZnHpMFd5j4tvOkJkOKa2pqOZvaOv6_HBxbznBxv5mH7ZgF-Ss0ptvbk69iF5e3xY5c_RfPH0kk_nUcsw6SJdBSYVBnhS8YzHWmhRKpHxMjES11LAOpYVBN8YCH-XSZUAKI2xTHgVAx-Sm8Pe1jUfvfFdsWl6V4eTRcYQ0hjSv9DtMaR8qbaVU3VpfdE6u1NuX7A4Q8FD_QIfFmn4</recordid><startdate>200506</startdate><enddate>200506</enddate><creator>JIANG, J</creator><creator>CAI, X. Y</creator><creator>YUAN, Y</creator><creator>POLYANSKII, A. A</creator><creator>HELLSTROM, E. E</creator><creator>LARBALESTIER, D. C</creator><creator>MARONI, V. A</creator><creator>HOLESINGER, T. G</creator><creator>HUANG, Y</creator><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>IQODW</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>200506</creationdate><title>Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires</title><author>JIANG, J ; CAI, X. Y ; YUAN, Y ; POLYANSKII, A. A ; HELLSTROM, E. E ; LARBALESTIER, D. C ; MARONI, V. A ; HOLESINGER, T. G ; HUANG, Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p127t-df22284e037f3936d4d4ca493c7e52b540b65f0e03ee0558c7f700ad26573f603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Connection and protection apparatus</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Exact sciences and technology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>JIANG, J</creatorcontrib><creatorcontrib>CAI, X. Y</creatorcontrib><creatorcontrib>YUAN, Y</creatorcontrib><creatorcontrib>POLYANSKII, A. A</creatorcontrib><creatorcontrib>HELLSTROM, E. E</creatorcontrib><creatorcontrib>LARBALESTIER, D. C</creatorcontrib><creatorcontrib>MARONI, V. A</creatorcontrib><creatorcontrib>HOLESINGER, T. G</creatorcontrib><creatorcontrib>HUANG, Y</creatorcontrib><collection>Pascal-Francis</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>JIANG, J</au><au>CAI, X. Y</au><au>YUAN, Y</au><au>POLYANSKII, A. A</au><au>HELLSTROM, E. E</au><au>LARBALESTIER, D. C</au><au>MARONI, V. A</au><au>HOLESINGER, T. G</au><au>HUANG, Y</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><date>2005-06</date><risdate>2005</risdate><volume>15</volume><issue>2</issue><spage>2526</spage><epage>2529</epage><pages>2526-2529</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub><doi>10.1109/TASC.2005.847516</doi><tpages>4</tpages></addata></record>
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source IEEE Electronic Library (IEL)
subjects Applied sciences
Connection and protection apparatus
Electrical engineering. Electrical power engineering
Exact sciences and technology
title Long term anneal study and composition variation for reducing residual Bi2Sr2CaCu2Ox (2212) in (Bi, Pb)2Sr2Ca2Cu3Ox (2223) wires
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T23%3A46%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Long%20term%20anneal%20study%20and%20composition%20variation%20for%20reducing%20residual%20Bi2Sr2CaCu2Ox%20(2212)%20in%20(Bi,%20Pb)2Sr2Ca2Cu3Ox%20(2223)%20wires&rft.jtitle=IEEE%20transactions%20on%20applied%20superconductivity&rft.au=JIANG,%20J&rft.date=2005-06&rft.volume=15&rft.issue=2&rft.spage=2526&rft.epage=2529&rft.pages=2526-2529&rft.issn=1051-8223&rft.eissn=1558-2515&rft_id=info:doi/10.1109/TASC.2005.847516&rft_dat=%3Cproquest_pasca%3E2543657721%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=912086080&rft_id=info:pmid/&rfr_iscdi=true