Analysis of random telegraph noise in spin valve heads with ultra-thin free layers
Random telegraph noise (RTN) in spin valve heads with ultra-thin free layers is analyzed in both time and frequency domain. RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is cha...
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| Veröffentlicht in: | IEEE transactions on magnetics 2001-07, Vol.37 (4), p.1678-1680 |
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| creator | Jing Zhang Ningjia Zhu Yiming Huai Prabhakar, A. Rana, P. Seagle, D. Lederman, M. |
| description | Random telegraph noise (RTN) in spin valve heads with ultra-thin free layers is analyzed in both time and frequency domain. RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed. |
| doi_str_mv | 10.1109/20.950935 |
| format | Article |
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RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/20.950935</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Acoustical engineering ; Amplitudes ; Applied sciences ; Bias ; Density ; Electronics ; Energy barrier ; Exact sciences and technology ; Fluctuations ; Instability ; Magnetic devices ; Magnetic heads ; Magnetic noise ; Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc ; Magnetism ; Noise ; Noise level ; Noise measurement ; Readers ; Semiconductor electronics. Microelectronics. Optoelectronics. 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RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed.</description><subject>Acoustical engineering</subject><subject>Amplitudes</subject><subject>Applied sciences</subject><subject>Bias</subject><subject>Density</subject><subject>Electronics</subject><subject>Energy barrier</subject><subject>Exact sciences and technology</subject><subject>Fluctuations</subject><subject>Instability</subject><subject>Magnetic devices</subject><subject>Magnetic heads</subject><subject>Magnetic noise</subject><subject>Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc</subject><subject>Magnetism</subject><subject>Noise</subject><subject>Noise level</subject><subject>Noise measurement</subject><subject>Readers</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Spin valves</subject><subject>Stability</subject><subject>Telegraphy</subject><subject>Time domain analysis</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkUFrHDEMhU1oIdu0h1x7MoG29DCpNOPx2McQ2qQQKJT2PCgeTXaCd2ZjzSbsv6-XXRrIob1YWPr0JPSUOkU4RwT_pYRzX4Ov6iO1QG-wALD-lVoAoCu8seZYvRG5z19TIyzUz4uR4lYG0VOvE43dtNIzR75LtF7qcRqE9TBqWefnkeIj6yVTJ_ppmJd6E-dExbzMtT4x60hbTvJWve4pCr87xBP1-9vXX5fXxc2Pq--XFzdFqHwzF7e3oetMg2SoImiCr8uAvXMlEFWI3qFBRO4xlKakrgHbOIfBd8aCzZnqRH3a667T9LBhmdvVIIFjpJGnjbQejbXGViaTH_9Jli6Pcs79H7SuAmN2imcvwPtpk_IppXXOOHSN20Gf91BIk0jivl2nYUVp2yK0O7faEtq9W5n9cBAkCRT7bEUY5LnBgPem3m34fs8NzPy3fBD5Axsfme0</recordid><startdate>20010701</startdate><enddate>20010701</enddate><creator>Jing Zhang</creator><creator>Ningjia Zhu</creator><creator>Yiming Huai</creator><creator>Prabhakar, A.</creator><creator>Rana, P.</creator><creator>Seagle, D.</creator><creator>Lederman, M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Microelectronics. Optoelectronics. Solid state devices</topic><topic>Spin valves</topic><topic>Stability</topic><topic>Telegraphy</topic><topic>Time domain analysis</topic><toplevel>online_resources</toplevel><creatorcontrib>Jing Zhang</creatorcontrib><creatorcontrib>Ningjia Zhu</creatorcontrib><creatorcontrib>Yiming Huai</creatorcontrib><creatorcontrib>Prabhakar, A.</creatorcontrib><creatorcontrib>Rana, P.</creatorcontrib><creatorcontrib>Seagle, D.</creatorcontrib><creatorcontrib>Lederman, M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Corrosion Abstracts</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jing Zhang</au><au>Ningjia Zhu</au><au>Yiming Huai</au><au>Prabhakar, A.</au><au>Rana, P.</au><au>Seagle, D.</au><au>Lederman, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of random telegraph noise in spin valve heads with ultra-thin free layers</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>2001-07-01</date><risdate>2001</risdate><volume>37</volume><issue>4</issue><spage>1678</spage><epage>1680</epage><pages>1678-1680</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Random telegraph noise (RTN) in spin valve heads with ultra-thin free layers is analyzed in both time and frequency domain. RTN is characterized by random fluctuation between two meta-stable states and is attributed to thermally activated domain instability. Lifetime of each meta-stable state is changes with bias current, with both being equal when RTN amplitude peaks while asymmetry is near zero. The lifetime at equilibrium can be quantified by the flatness of RTN spectra and is correlated with the normalized peak area under RTN amplitude versus bias current curve. This area scales with the energy barrier associated with RTN. With the same RTN peak area, lifetime at equilibrium is shorter for heads with thinner free layers but otherwise the same structure. Impact on reader instability for ultra-high areal density recording is discussed.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/20.950935</doi><tpages>3</tpages></addata></record> |
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| subjects | Acoustical engineering Amplitudes Applied sciences Bias Density Electronics Energy barrier Exact sciences and technology Fluctuations Instability Magnetic devices Magnetic heads Magnetic noise Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.) domain-motion devices, etc Magnetism Noise Noise level Noise measurement Readers Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Spin valves Stability Telegraphy Time domain analysis |
| title | Analysis of random telegraph noise in spin valve heads with ultra-thin free layers |
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