Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate
The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the int...
Gespeichert in:
Veröffentlicht in: | Metals and materials (Seoul, Korea) Korea), 2003-04, Vol.9 (2), p.193-199 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 199 |
---|---|
container_issue | 2 |
container_start_page | 193 |
container_title | Metals and materials (Seoul, Korea) |
container_volume | 9 |
creator | Yoon, Jeong -Won Lee, Chang -Bae Kim, Dae -Up Jung, Seung -Boo |
description | The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. The diffusion couples showed a composite intermetallic layer comprised of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion-controlled kinetics and the layer thickness reached only 9 μm after 60 day of aging at 150°C. The apparent activation energies were calculated for the growth of the total intermetallic compound (Cu6Sn5+Cu3Sn); Cu6Sn5 and Cu3Sn intermetallic are 65.4, 55.4 and 75.7 kJ/mol, respectively. |
doi_str_mv | 10.1007/BF03027277 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_884669220</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>27953113</sourcerecordid><originalsourceid>FETCH-LOGICAL-c315t-d89fe4d2a5a6f6c7f27ab4f4cd6744ce03d1faf2cf2bbb96677783daa2471d253</originalsourceid><addsrcrecordid>eNp1kUlLBDEQhYMoOI5e_AVBwYPQmq2T7uM4uIEgOHpu0lm0h56kzXLw4H83LiAInuoV9dWrggfAIUZnGCFxfnGFKCKCCLEFZgShumKYtdtghuu2qVpO6C7Yi3GNEMcUkxl4fzBSpcE7qAdrcywqQm_hMvOVq6F0uki6cnBwyYSNSXIcBwWV30w-l-HgYHoxpc_TaD4XV66iZ_XiGZqcTHFWMPpRm_Blpfw0FRlzH1OQyeyDHSvHaA5-6hw8XV0-Lm-qu_vr2-XirlIU16nSTWsN00TWkluuhCVC9swypblgTBlENbbSEmVJ3_ct50KIhmopCRNYk5rOwcm37xT8azYxdZshKjOO0hmfY0dEW1OMaQGP_oBrn4Mrv3VNwzhvCUEFOv4PIqIRnDa8nJ-D029KBR9jMLabwrCR4a3DqPsMq_sNi34AJrCGOQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884669220</pqid></control><display><type>article</type><title>Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate</title><source>SpringerLink Journals - AutoHoldings</source><creator>Yoon, Jeong -Won ; Lee, Chang -Bae ; Kim, Dae -Up ; Jung, Seung -Boo</creator><creatorcontrib>Yoon, Jeong -Won ; Lee, Chang -Bae ; Kim, Dae -Up ; Jung, Seung -Boo</creatorcontrib><description>The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. The diffusion couples showed a composite intermetallic layer comprised of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion-controlled kinetics and the layer thickness reached only 9 μm after 60 day of aging at 150°C. The apparent activation energies were calculated for the growth of the total intermetallic compound (Cu6Sn5+Cu3Sn); Cu6Sn5 and Cu3Sn intermetallic are 65.4, 55.4 and 75.7 kJ/mol, respectively.</description><identifier>ISSN: 1598-9623</identifier><identifier>ISSN: 1225-9438</identifier><identifier>EISSN: 2005-4149</identifier><identifier>DOI: 10.1007/BF03027277</identifier><language>eng</language><publisher>Seoul: Springer Nature B.V</publisher><subject>Alloys ; Copper ; Diffusion layers ; Intermetallic compounds ; Kinetics ; Solders ; Substrates ; Thickness ; Tin base alloys ; Tin compounds</subject><ispartof>Metals and materials (Seoul, Korea), 2003-04, Vol.9 (2), p.193-199</ispartof><rights>Springer 2003.</rights><rights>Springer 2003</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c315t-d89fe4d2a5a6f6c7f27ab4f4cd6744ce03d1faf2cf2bbb96677783daa2471d253</citedby><cites>FETCH-LOGICAL-c315t-d89fe4d2a5a6f6c7f27ab4f4cd6744ce03d1faf2cf2bbb96677783daa2471d253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Yoon, Jeong -Won</creatorcontrib><creatorcontrib>Lee, Chang -Bae</creatorcontrib><creatorcontrib>Kim, Dae -Up</creatorcontrib><creatorcontrib>Jung, Seung -Boo</creatorcontrib><title>Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate</title><title>Metals and materials (Seoul, Korea)</title><description>The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. The diffusion couples showed a composite intermetallic layer comprised of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion-controlled kinetics and the layer thickness reached only 9 μm after 60 day of aging at 150°C. The apparent activation energies were calculated for the growth of the total intermetallic compound (Cu6Sn5+Cu3Sn); Cu6Sn5 and Cu3Sn intermetallic are 65.4, 55.4 and 75.7 kJ/mol, respectively.</description><subject>Alloys</subject><subject>Copper</subject><subject>Diffusion layers</subject><subject>Intermetallic compounds</subject><subject>Kinetics</subject><subject>Solders</subject><subject>Substrates</subject><subject>Thickness</subject><subject>Tin base alloys</subject><subject>Tin compounds</subject><issn>1598-9623</issn><issn>1225-9438</issn><issn>2005-4149</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNp1kUlLBDEQhYMoOI5e_AVBwYPQmq2T7uM4uIEgOHpu0lm0h56kzXLw4H83LiAInuoV9dWrggfAIUZnGCFxfnGFKCKCCLEFZgShumKYtdtghuu2qVpO6C7Yi3GNEMcUkxl4fzBSpcE7qAdrcywqQm_hMvOVq6F0uki6cnBwyYSNSXIcBwWV30w-l-HgYHoxpc_TaD4XV66iZ_XiGZqcTHFWMPpRm_Blpfw0FRlzH1OQyeyDHSvHaA5-6hw8XV0-Lm-qu_vr2-XirlIU16nSTWsN00TWkluuhCVC9swypblgTBlENbbSEmVJ3_ct50KIhmopCRNYk5rOwcm37xT8azYxdZshKjOO0hmfY0dEW1OMaQGP_oBrn4Mrv3VNwzhvCUEFOv4PIqIRnDa8nJ-D029KBR9jMLabwrCR4a3DqPsMq_sNi34AJrCGOQ</recordid><startdate>20030401</startdate><enddate>20030401</enddate><creator>Yoon, Jeong -Won</creator><creator>Lee, Chang -Bae</creator><creator>Kim, Dae -Up</creator><creator>Jung, Seung -Boo</creator><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>H8G</scope></search><sort><creationdate>20030401</creationdate><title>Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate</title><author>Yoon, Jeong -Won ; Lee, Chang -Bae ; Kim, Dae -Up ; Jung, Seung -Boo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c315t-d89fe4d2a5a6f6c7f27ab4f4cd6744ce03d1faf2cf2bbb96677783daa2471d253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Alloys</topic><topic>Copper</topic><topic>Diffusion layers</topic><topic>Intermetallic compounds</topic><topic>Kinetics</topic><topic>Solders</topic><topic>Substrates</topic><topic>Thickness</topic><topic>Tin base alloys</topic><topic>Tin compounds</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yoon, Jeong -Won</creatorcontrib><creatorcontrib>Lee, Chang -Bae</creatorcontrib><creatorcontrib>Kim, Dae -Up</creatorcontrib><creatorcontrib>Jung, Seung -Boo</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Copper Technical Reference Library</collection><jtitle>Metals and materials (Seoul, Korea)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yoon, Jeong -Won</au><au>Lee, Chang -Bae</au><au>Kim, Dae -Up</au><au>Jung, Seung -Boo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate</atitle><jtitle>Metals and materials (Seoul, Korea)</jtitle><date>2003-04-01</date><risdate>2003</risdate><volume>9</volume><issue>2</issue><spage>193</spage><epage>199</epage><pages>193-199</pages><issn>1598-9623</issn><issn>1225-9438</issn><eissn>2005-4149</eissn><abstract>The growth kinetics of intermetallic compound layers formed between Sn-3.5Ag solder and Cu substrate were investigated as a consequence of solid-state isothermal aging. Isothermal aging was carried out in a temperature range between 70°C and 200°C for 0 to 60 days. A quantitative analysis of the intermetallic compound layer thickness as a function of time and temperature was performed. The diffusion couples showed a composite intermetallic layer comprised of Cu6Sn5 and Cu3Sn. The growth of intermetallic compounds followed diffusion-controlled kinetics and the layer thickness reached only 9 μm after 60 day of aging at 150°C. The apparent activation energies were calculated for the growth of the total intermetallic compound (Cu6Sn5+Cu3Sn); Cu6Sn5 and Cu3Sn intermetallic are 65.4, 55.4 and 75.7 kJ/mol, respectively.</abstract><cop>Seoul</cop><pub>Springer Nature B.V</pub><doi>10.1007/BF03027277</doi><tpages>7</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1598-9623 |
ispartof | Metals and materials (Seoul, Korea), 2003-04, Vol.9 (2), p.193-199 |
issn | 1598-9623 1225-9438 2005-4149 |
language | eng |
recordid | cdi_proquest_journals_884669220 |
source | SpringerLink Journals - AutoHoldings |
subjects | Alloys Copper Diffusion layers Intermetallic compounds Kinetics Solders Substrates Thickness Tin base alloys Tin compounds |
title | Reaction diffusions of Cu6Sn5 and Cu3Sn intermetallic compound in the couple of Sn-3.5Ag eutectic solder and copper substrate |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T01%3A45%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reaction%20diffusions%20of%20Cu6Sn5%20and%20Cu3Sn%20intermetallic%20compound%20in%20the%20couple%20of%20Sn-3.5Ag%20eutectic%20solder%20and%20copper%20substrate&rft.jtitle=Metals%20and%20materials%20(Seoul,%20Korea)&rft.au=Yoon,%20Jeong%20-Won&rft.date=2003-04-01&rft.volume=9&rft.issue=2&rft.spage=193&rft.epage=199&rft.pages=193-199&rft.issn=1598-9623&rft.eissn=2005-4149&rft_id=info:doi/10.1007/BF03027277&rft_dat=%3Cproquest_cross%3E27953113%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=884669220&rft_id=info:pmid/&rfr_iscdi=true |