Analysis and measurement of fault coverage in a combined ATE and BIST environment

This paper analyzes an environment which utilizes built-in self-test (BIST) and automatic test equipment (ATE), and presents closed-form expressions for fault coverage as a function of the number of BIST and ATE test vectors. This requires incorporating the time to switch from BIST to ATE (referred...

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Veröffentlicht in:	IEEE transactions on instrumentation and measurement 2004-04, Vol.53 (2), p.300-307
Hauptverfasser:	Hashempour, H., Meyer, F.J., Lombardi, F.
Format:	Artikel
Sprache:	eng
Schlagworte:	Automatic test equipment Automatic testing Built-in self-test Circuit faults Circuit simulation Circuit testing Closed-form solution Electrical fault detection Fault detection Studies Switches
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