Schottky Diode Series Resistance and Thermal Resistance Extraction From [Formula Omitted]-Parameter and Temperature Controlled I-V Measurements
A new method for extracting the series resistance and thermal resistance of a Schottky diode is presented. The method avoids the inaccuracies caused by the temperature dependence of the saturation current and ideality factor. These are a major concern for traditional extraction methods, especially w...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2011-08, Vol.59 (8), p.2108 |
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Format: | Artikel |
Sprache: | eng |
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