Temperature and supply Voltage aware performance and power modeling at microarchitecture level

Performance and power are two primary design issues for systems ranging from server computers to handhelds. Performance is affected by both temperature and supply voltage because of the temperature and voltage dependence of circuit delay. Furthermore, as semiconductor technology scales down, leakage...

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Veröffentlicht in:IEEE transactions on computer-aided design of integrated circuits and systems 2005-07, Vol.24 (7), p.1042-1053
Hauptverfasser: Weiping Liao, Lei He, Lepak, K.M.
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Lei He
Lepak, K.M.
description Performance and power are two primary design issues for systems ranging from server computers to handhelds. Performance is affected by both temperature and supply voltage because of the temperature and voltage dependence of circuit delay. Furthermore, as semiconductor technology scales down, leakage power's exponential dependence on temperature and supply voltage becomes significant. Therefore, future design studies call for temperature and voltage aware performance and power modeling. In this paper, we study microarchitecture-level temperature and voltage aware performance and power modeling. We present a leakage power model with temperature and voltage scaling, and show that leakage and total energy vary by 38% and 24%, respectively, between 65/spl deg/C and 110/spl deg/C. We study thermal runaway induced by the interdependence between temperature and leakage power, and demonstrate that without temperature-aware modeling, underestimation of leakage power may lead to the failure of thermal controls, and overestimation of leakage power may result in excessive performance penalties of up to 5.24%. All of these studies underscore the necessity of temperature-aware power modeling. Furthermore, we study optimal voltage scaling for best performance with dynamic power and thermal management under different packaging options. We show that dynamic power and thermal management allows designs to target at the common-case thermal scenario among benchmarks and improves performance by 6.59% compared to designs targeted at the worst case thermal scenario without dynamic power and thermal management. Additionally, the optimal V/sub dd/ for the best performance may not be the largest V/sub dd/ allowed by the given packaging platform, and that advanced cooling techniques can improve throughput significantly.
doi_str_mv 10.1109/TCAD.2005.850860
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_883429398</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1458931</ieee_id><sourcerecordid>28104962</sourcerecordid><originalsourceid>FETCH-LOGICAL-c460t-c24ad0b7d3337f582d6e70dc57f04626ba8471ada8b79cc5886f5cb966cfb41b3</originalsourceid><addsrcrecordid>eNqFkU1r3DAQhkVJoZu090IupofcvB19S8dlkzSBQC-bHCtkebz14q9Idpf8-3jrQiCXngZmnveF4SHkK4U1pWC_77ab6zUDkGsjwSj4QFbUcp0LKukZWQHTJgfQ8Imcp3QAoEIyuyK_dtgOGP04Rcx8V2ZpGobmJXvqm9Hv59XRz4eZqPrY-i4s0NAfMWZtX2JTd_vMj1lbh9j7GH7XI4a_ZQ3-weYz-Vj5JuGXf_OCPN7e7LZ3-cPPH_fbzUMehIIxD0z4Egpdcs51JQ0rFWoog9QVCMVU4Y3Q1JfeFNqGII1RlQyFVSpUhaAFvyBXS-8Q--cJ0-jaOgVsGt9hPyXHrJZUG_F_0FAQVrEZ_PYOPPRT7OYnnDFcMMutmSFYoPn5lCJWboh16-OLo-BOWtxJiztpcYuWOXK5RGpEfMOFNJZT_goLsInr</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>883429398</pqid></control><display><type>article</type><title>Temperature and supply Voltage aware performance and power modeling at microarchitecture level</title><source>IEEE Electronic Library (IEL)</source><creator>Weiping Liao ; Lei He ; Lepak, K.M.</creator><creatorcontrib>Weiping Liao ; Lei He ; Lepak, K.M.</creatorcontrib><description>Performance and power are two primary design issues for systems ranging from server computers to handhelds. Performance is affected by both temperature and supply voltage because of the temperature and voltage dependence of circuit delay. Furthermore, as semiconductor technology scales down, leakage power's exponential dependence on temperature and supply voltage becomes significant. Therefore, future design studies call for temperature and voltage aware performance and power modeling. In this paper, we study microarchitecture-level temperature and voltage aware performance and power modeling. We present a leakage power model with temperature and voltage scaling, and show that leakage and total energy vary by 38% and 24%, respectively, between 65/spl deg/C and 110/spl deg/C. We study thermal runaway induced by the interdependence between temperature and leakage power, and demonstrate that without temperature-aware modeling, underestimation of leakage power may lead to the failure of thermal controls, and overestimation of leakage power may result in excessive performance penalties of up to 5.24%. All of these studies underscore the necessity of temperature-aware power modeling. Furthermore, we study optimal voltage scaling for best performance with dynamic power and thermal management under different packaging options. We show that dynamic power and thermal management allows designs to target at the common-case thermal scenario among benchmarks and improves performance by 6.59% compared to designs targeted at the worst case thermal scenario without dynamic power and thermal management. Additionally, the optimal V/sub dd/ for the best performance may not be the largest V/sub dd/ allowed by the given packaging platform, and that advanced cooling techniques can improve throughput significantly.</description><identifier>ISSN: 0278-0070</identifier><identifier>EISSN: 1937-4151</identifier><identifier>DOI: 10.1109/TCAD.2005.850860</identifier><identifier>CODEN: ITCSDI</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuits ; Delay ; Energy management ; Floorplan ; Handheld computers ; leakage power ; Microarchitecture ; Packaging ; Power system modeling ; temperature ; Temperature dependence ; Thermal management ; Voltage</subject><ispartof>IEEE transactions on computer-aided design of integrated circuits and systems, 2005-07, Vol.24 (7), p.1042-1053</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c460t-c24ad0b7d3337f582d6e70dc57f04626ba8471ada8b79cc5886f5cb966cfb41b3</citedby><cites>FETCH-LOGICAL-c460t-c24ad0b7d3337f582d6e70dc57f04626ba8471ada8b79cc5886f5cb966cfb41b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1458931$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27922,27923,54756</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1458931$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Weiping Liao</creatorcontrib><creatorcontrib>Lei He</creatorcontrib><creatorcontrib>Lepak, K.M.</creatorcontrib><title>Temperature and supply Voltage aware performance and power modeling at microarchitecture level</title><title>IEEE transactions on computer-aided design of integrated circuits and systems</title><addtitle>TCAD</addtitle><description>Performance and power are two primary design issues for systems ranging from server computers to handhelds. Performance is affected by both temperature and supply voltage because of the temperature and voltage dependence of circuit delay. Furthermore, as semiconductor technology scales down, leakage power's exponential dependence on temperature and supply voltage becomes significant. Therefore, future design studies call for temperature and voltage aware performance and power modeling. In this paper, we study microarchitecture-level temperature and voltage aware performance and power modeling. We present a leakage power model with temperature and voltage scaling, and show that leakage and total energy vary by 38% and 24%, respectively, between 65/spl deg/C and 110/spl deg/C. We study thermal runaway induced by the interdependence between temperature and leakage power, and demonstrate that without temperature-aware modeling, underestimation of leakage power may lead to the failure of thermal controls, and overestimation of leakage power may result in excessive performance penalties of up to 5.24%. All of these studies underscore the necessity of temperature-aware power modeling. Furthermore, we study optimal voltage scaling for best performance with dynamic power and thermal management under different packaging options. We show that dynamic power and thermal management allows designs to target at the common-case thermal scenario among benchmarks and improves performance by 6.59% compared to designs targeted at the worst case thermal scenario without dynamic power and thermal management. Additionally, the optimal V/sub dd/ for the best performance may not be the largest V/sub dd/ allowed by the given packaging platform, and that advanced cooling techniques can improve throughput significantly.</description><subject>Circuits</subject><subject>Delay</subject><subject>Energy management</subject><subject>Floorplan</subject><subject>Handheld computers</subject><subject>leakage power</subject><subject>Microarchitecture</subject><subject>Packaging</subject><subject>Power system modeling</subject><subject>temperature</subject><subject>Temperature dependence</subject><subject>Thermal management</subject><subject>Voltage</subject><issn>0278-0070</issn><issn>1937-4151</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkU1r3DAQhkVJoZu090IupofcvB19S8dlkzSBQC-bHCtkebz14q9Idpf8-3jrQiCXngZmnveF4SHkK4U1pWC_77ab6zUDkGsjwSj4QFbUcp0LKukZWQHTJgfQ8Imcp3QAoEIyuyK_dtgOGP04Rcx8V2ZpGobmJXvqm9Hv59XRz4eZqPrY-i4s0NAfMWZtX2JTd_vMj1lbh9j7GH7XI4a_ZQ3-weYz-Vj5JuGXf_OCPN7e7LZ3-cPPH_fbzUMehIIxD0z4Egpdcs51JQ0rFWoog9QVCMVU4Y3Q1JfeFNqGII1RlQyFVSpUhaAFvyBXS-8Q--cJ0-jaOgVsGt9hPyXHrJZUG_F_0FAQVrEZ_PYOPPRT7OYnnDFcMMutmSFYoPn5lCJWboh16-OLo-BOWtxJiztpcYuWOXK5RGpEfMOFNJZT_goLsInr</recordid><startdate>200507</startdate><enddate>200507</enddate><creator>Weiping Liao</creator><creator>Lei He</creator><creator>Lepak, K.M.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7U5</scope><scope>7TB</scope><scope>FR3</scope></search><sort><creationdate>200507</creationdate><title>Temperature and supply Voltage aware performance and power modeling at microarchitecture level</title><author>Weiping Liao ; Lei He ; Lepak, K.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c460t-c24ad0b7d3337f582d6e70dc57f04626ba8471ada8b79cc5886f5cb966cfb41b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Circuits</topic><topic>Delay</topic><topic>Energy management</topic><topic>Floorplan</topic><topic>Handheld computers</topic><topic>leakage power</topic><topic>Microarchitecture</topic><topic>Packaging</topic><topic>Power system modeling</topic><topic>temperature</topic><topic>Temperature dependence</topic><topic>Thermal management</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Weiping Liao</creatorcontrib><creatorcontrib>Lei He</creatorcontrib><creatorcontrib>Lepak, K.M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Weiping Liao</au><au>Lei He</au><au>Lepak, K.M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature and supply Voltage aware performance and power modeling at microarchitecture level</atitle><jtitle>IEEE transactions on computer-aided design of integrated circuits and systems</jtitle><stitle>TCAD</stitle><date>2005-07</date><risdate>2005</risdate><volume>24</volume><issue>7</issue><spage>1042</spage><epage>1053</epage><pages>1042-1053</pages><issn>0278-0070</issn><eissn>1937-4151</eissn><coden>ITCSDI</coden><abstract>Performance and power are two primary design issues for systems ranging from server computers to handhelds. Performance is affected by both temperature and supply voltage because of the temperature and voltage dependence of circuit delay. Furthermore, as semiconductor technology scales down, leakage power's exponential dependence on temperature and supply voltage becomes significant. Therefore, future design studies call for temperature and voltage aware performance and power modeling. In this paper, we study microarchitecture-level temperature and voltage aware performance and power modeling. We present a leakage power model with temperature and voltage scaling, and show that leakage and total energy vary by 38% and 24%, respectively, between 65/spl deg/C and 110/spl deg/C. We study thermal runaway induced by the interdependence between temperature and leakage power, and demonstrate that without temperature-aware modeling, underestimation of leakage power may lead to the failure of thermal controls, and overestimation of leakage power may result in excessive performance penalties of up to 5.24%. All of these studies underscore the necessity of temperature-aware power modeling. Furthermore, we study optimal voltage scaling for best performance with dynamic power and thermal management under different packaging options. We show that dynamic power and thermal management allows designs to target at the common-case thermal scenario among benchmarks and improves performance by 6.59% compared to designs targeted at the worst case thermal scenario without dynamic power and thermal management. Additionally, the optimal V/sub dd/ for the best performance may not be the largest V/sub dd/ allowed by the given packaging platform, and that advanced cooling techniques can improve throughput significantly.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCAD.2005.850860</doi><tpages>12</tpages><oa>free_for_read</oa></addata></record>
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identifier ISSN: 0278-0070
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1937-4151
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source IEEE Electronic Library (IEL)
subjects Circuits
Delay
Energy management
Floorplan
Handheld computers
leakage power
Microarchitecture
Packaging
Power system modeling
temperature
Temperature dependence
Thermal management
Voltage
title Temperature and supply Voltage aware performance and power modeling at microarchitecture level
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T14%3A27%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature%20and%20supply%20Voltage%20aware%20performance%20and%20power%20modeling%20at%20microarchitecture%20level&rft.jtitle=IEEE%20transactions%20on%20computer-aided%20design%20of%20integrated%20circuits%20and%20systems&rft.au=Weiping%20Liao&rft.date=2005-07&rft.volume=24&rft.issue=7&rft.spage=1042&rft.epage=1053&rft.pages=1042-1053&rft.issn=0278-0070&rft.eissn=1937-4151&rft.coden=ITCSDI&rft_id=info:doi/10.1109/TCAD.2005.850860&rft_dat=%3Cproquest_RIE%3E28104962%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=883429398&rft_id=info:pmid/&rft_ieee_id=1458931&rfr_iscdi=true