Carbon nanotube tips for atomic force microscopy

The development of atomic force microscopy (AFM) over the past 20 years has had a major impact on materials science, surface science and various areas of biology, and it is now a routine imaging tool for the structural characterization of surfaces. The lateral resolution in AFM is governed by the sh...

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Veröffentlicht in:	Nature nanotechnology 2009-08, Vol.4 (8), p.483-491
Hauptverfasser:	Macpherson, Julie V, Wilson, Neil R
Format:	Artikel
Sprache:	eng
Schlagworte:	Amides Apexes Atomic force microscopy Carbon Carbon nanotubes Chemistry and Materials Science Electromagnetic Fields Geometry Graphene Materials Science Microscopes Microscopy Microscopy, Atomic Force - instrumentation Nanotechnology Nanotechnology and Microengineering Nanotubes Nanotubes, Carbon - chemistry Nanotubes, Carbon - ultrastructure Radius of curvature review-article Semiconductor research Silicon nitride Structural analysis Surface Properties Tips Topography
Online-Zugang:	Volltext
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