An Attack Surface Metric

Measurement of software security is a long-standing challenge to the research community. At the same time, practical security metrics and measurements are essential for secure software development. Hence, the need for metrics is more pressing now due to a growing demand for secure software. In this...

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Veröffentlicht in:IEEE transactions on software engineering 2011-05, Vol.37 (3), p.371-386
Hauptverfasser: Manadhata, P K, Wing, J M
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Wing, J M
description Measurement of software security is a long-standing challenge to the research community. At the same time, practical security metrics and measurements are essential for secure software development. Hence, the need for metrics is more pressing now due to a growing demand for secure software. In this paper, we propose using a software system's attack surface measurement as an indicator of the system's security. We formalize the notion of a system's attack surface and introduce an attack surface metric to measure the attack surface in a systematic manner. Our measurement method is agnostic to a software system's implementation language and is applicable to systems of all sizes; we demonstrate our method by measuring the attack surfaces of small desktop applications and large enterprise systems implemented in C and Java. We conducted three exploratory empirical studies to validate our method. Software developers can mitigate their software's security risk by measuring and reducing their software's attack surfaces. Our attack surface reduction approach complements the software industry's traditional code quality improvement approach for security risk mitigation and is useful in multiple phases of the software development lifecycle. Our collaboration with SAP demonstrates the use of our metric in the software development process.
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_868620733</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5482589</ieee_id><sourcerecordid>2357879171</sourcerecordid><originalsourceid>FETCH-LOGICAL-c354t-1cfe5c74e7f8e2cd7e4477e9c3f1920f55c01d950839c4da4c44740c61ae43f03</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMouFZPXgQvxYsH2TrZJJvkWEr9gIqH1nMI0wlsbbs12T34701Z8eBpGOZh3peHsWsOE87BPq6W80kFeavhhBXcClsKVcEpKwCsKZUy9pxdpLQBAKW1KtjNdD-edp3Hz_Gyj8Ejjd-oiw1esrPgt4mufueIfTzNV7OXcvH-_DqbLkoUSnYlx0AKtSQdDFW41iSl1mRRBG4rCEoh8LVVYIRFufYS810C1tyTFAHEiN0Pfw-x_eopdW7XJKTt1u-p7ZMzxkqpJOeZvPtHbto-7nM5Z2pTV6CFyNDDAGFsU4oU3CE2Ox-_HQd3dOSyI3d05Opj-O1AN0T0RyppqmxK_ACByV68</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>868620733</pqid></control><display><type>article</type><title>An Attack Surface Metric</title><source>IEEE Electronic Library (IEL)</source><creator>Manadhata, P K ; Wing, J M</creator><creatorcontrib>Manadhata, P K ; Wing, J M</creatorcontrib><description>Measurement of software security is a long-standing challenge to the research community. At the same time, practical security metrics and measurements are essential for secure software development. Hence, the need for metrics is more pressing now due to a growing demand for secure software. In this paper, we propose using a software system's attack surface measurement as an indicator of the system's security. We formalize the notion of a system's attack surface and introduce an attack surface metric to measure the attack surface in a systematic manner. Our measurement method is agnostic to a software system's implementation language and is applicable to systems of all sizes; we demonstrate our method by measuring the attack surfaces of small desktop applications and large enterprise systems implemented in C and Java. We conducted three exploratory empirical studies to validate our method. Software developers can mitigate their software's security risk by measuring and reducing their software's attack surfaces. Our attack surface reduction approach complements the software industry's traditional code quality improvement approach for security risk mitigation and is useful in multiple phases of the software development lifecycle. Our collaboration with SAP demonstrates the use of our metric in the software development process.</description><identifier>ISSN: 0098-5589</identifier><identifier>EISSN: 1939-3520</identifier><identifier>DOI: 10.1109/TSE.2010.60</identifier><identifier>CODEN: IESEDJ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Alliances ; Analysis ; Application software ; Code design ; Complement ; Computer programs ; Demand ; Digital Object Identifier ; Java ; life cycle ; Measurement methods ; Methods ; Pressing ; Product life cycle ; product metrics ; Programming ; protection mechanisms ; Quality improvement ; Risk ; risk mitigation ; Security ; Size measurement ; Software ; Software development ; Software engineering ; Software industry ; Software measurement ; Software quality ; software security ; Software systems ; Studies ; Time measurement</subject><ispartof>IEEE transactions on software engineering, 2011-05, Vol.37 (3), p.371-386</ispartof><rights>Copyright IEEE Computer Society May 2011</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c354t-1cfe5c74e7f8e2cd7e4477e9c3f1920f55c01d950839c4da4c44740c61ae43f03</citedby><cites>FETCH-LOGICAL-c354t-1cfe5c74e7f8e2cd7e4477e9c3f1920f55c01d950839c4da4c44740c61ae43f03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5482589$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5482589$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Manadhata, P K</creatorcontrib><creatorcontrib>Wing, J M</creatorcontrib><title>An Attack Surface Metric</title><title>IEEE transactions on software engineering</title><addtitle>TSE</addtitle><description>Measurement of software security is a long-standing challenge to the research community. At the same time, practical security metrics and measurements are essential for secure software development. Hence, the need for metrics is more pressing now due to a growing demand for secure software. In this paper, we propose using a software system's attack surface measurement as an indicator of the system's security. We formalize the notion of a system's attack surface and introduce an attack surface metric to measure the attack surface in a systematic manner. Our measurement method is agnostic to a software system's implementation language and is applicable to systems of all sizes; we demonstrate our method by measuring the attack surfaces of small desktop applications and large enterprise systems implemented in C and Java. We conducted three exploratory empirical studies to validate our method. Software developers can mitigate their software's security risk by measuring and reducing their software's attack surfaces. Our attack surface reduction approach complements the software industry's traditional code quality improvement approach for security risk mitigation and is useful in multiple phases of the software development lifecycle. Our collaboration with SAP demonstrates the use of our metric in the software development process.</description><subject>Alliances</subject><subject>Analysis</subject><subject>Application software</subject><subject>Code design</subject><subject>Complement</subject><subject>Computer programs</subject><subject>Demand</subject><subject>Digital Object Identifier</subject><subject>Java</subject><subject>life cycle</subject><subject>Measurement methods</subject><subject>Methods</subject><subject>Pressing</subject><subject>Product life cycle</subject><subject>product metrics</subject><subject>Programming</subject><subject>protection mechanisms</subject><subject>Quality improvement</subject><subject>Risk</subject><subject>risk mitigation</subject><subject>Security</subject><subject>Size measurement</subject><subject>Software</subject><subject>Software development</subject><subject>Software engineering</subject><subject>Software industry</subject><subject>Software measurement</subject><subject>Software quality</subject><subject>software security</subject><subject>Software systems</subject><subject>Studies</subject><subject>Time measurement</subject><issn>0098-5589</issn><issn>1939-3520</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2011</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNpdkE1LAzEQhoMouFZPXgQvxYsH2TrZJJvkWEr9gIqH1nMI0wlsbbs12T34701Z8eBpGOZh3peHsWsOE87BPq6W80kFeavhhBXcClsKVcEpKwCsKZUy9pxdpLQBAKW1KtjNdD-edp3Hz_Gyj8Ejjd-oiw1esrPgt4mufueIfTzNV7OXcvH-_DqbLkoUSnYlx0AKtSQdDFW41iSl1mRRBG4rCEoh8LVVYIRFufYS810C1tyTFAHEiN0Pfw-x_eopdW7XJKTt1u-p7ZMzxkqpJOeZvPtHbto-7nM5Z2pTV6CFyNDDAGFsU4oU3CE2Ox-_HQd3dOSyI3d05Opj-O1AN0T0RyppqmxK_ACByV68</recordid><startdate>20110501</startdate><enddate>20110501</enddate><creator>Manadhata, P K</creator><creator>Wing, J M</creator><general>IEEE</general><general>IEEE Computer Society</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7WY</scope><scope>7WZ</scope><scope>7X7</scope><scope>7XB</scope><scope>87Z</scope><scope>88E</scope><scope>88F</scope><scope>88I</scope><scope>88K</scope><scope>8AL</scope><scope>8FE</scope><scope>8FG</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>8FL</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BEZIV</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FRNLG</scope><scope>FYUFA</scope><scope>F~G</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K60</scope><scope>K6~</scope><scope>K7-</scope><scope>K9.</scope><scope>L.-</scope><scope>L6V</scope><scope>M0C</scope><scope>M0N</scope><scope>M0S</scope><scope>M1P</scope><scope>M1Q</scope><scope>M2O</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PQBIZ</scope><scope>PQBZA</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>20110501</creationdate><title>An Attack Surface Metric</title><author>Manadhata, P K ; Wing, J M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c354t-1cfe5c74e7f8e2cd7e4477e9c3f1920f55c01d950839c4da4c44740c61ae43f03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2011</creationdate><topic>Alliances</topic><topic>Analysis</topic><topic>Application software</topic><topic>Code design</topic><topic>Complement</topic><topic>Computer programs</topic><topic>Demand</topic><topic>Digital Object Identifier</topic><topic>Java</topic><topic>life cycle</topic><topic>Measurement methods</topic><topic>Methods</topic><topic>Pressing</topic><topic>Product life cycle</topic><topic>product metrics</topic><topic>Programming</topic><topic>protection mechanisms</topic><topic>Quality improvement</topic><topic>Risk</topic><topic>risk mitigation</topic><topic>Security</topic><topic>Size measurement</topic><topic>Software</topic><topic>Software development</topic><topic>Software engineering</topic><topic>Software industry</topic><topic>Software measurement</topic><topic>Software quality</topic><topic>software security</topic><topic>Software systems</topic><topic>Studies</topic><topic>Time measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Manadhata, P K</creatorcontrib><creatorcontrib>Wing, J M</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ABI/INFORM Collection</collection><collection>ABI/INFORM Global (PDF only)</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>ABI/INFORM Global (Alumni Edition)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Military Database (Alumni Edition)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>Computing Database (Alumni Edition)</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ABI/INFORM Collection (Alumni Edition)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Business Premium Collection</collection><collection>Technology Collection (ProQuest)</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Business Premium Collection (Alumni)</collection><collection>Health Research Premium Collection</collection><collection>ABI/INFORM Global (Corporate)</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>ProQuest Business Collection (Alumni Edition)</collection><collection>ProQuest Business Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>ABI/INFORM Professional Advanced</collection><collection>ProQuest Engineering Collection</collection><collection>ABI/INFORM Global</collection><collection>Computing Database</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Military Database</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest One Business</collection><collection>ProQuest One Business (Alumni)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE transactions on software engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Manadhata, P K</au><au>Wing, J M</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An Attack Surface Metric</atitle><jtitle>IEEE transactions on software engineering</jtitle><stitle>TSE</stitle><date>2011-05-01</date><risdate>2011</risdate><volume>37</volume><issue>3</issue><spage>371</spage><epage>386</epage><pages>371-386</pages><issn>0098-5589</issn><eissn>1939-3520</eissn><coden>IESEDJ</coden><abstract>Measurement of software security is a long-standing challenge to the research community. At the same time, practical security metrics and measurements are essential for secure software development. Hence, the need for metrics is more pressing now due to a growing demand for secure software. In this paper, we propose using a software system's attack surface measurement as an indicator of the system's security. We formalize the notion of a system's attack surface and introduce an attack surface metric to measure the attack surface in a systematic manner. Our measurement method is agnostic to a software system's implementation language and is applicable to systems of all sizes; we demonstrate our method by measuring the attack surfaces of small desktop applications and large enterprise systems implemented in C and Java. We conducted three exploratory empirical studies to validate our method. Software developers can mitigate their software's security risk by measuring and reducing their software's attack surfaces. Our attack surface reduction approach complements the software industry's traditional code quality improvement approach for security risk mitigation and is useful in multiple phases of the software development lifecycle. Our collaboration with SAP demonstrates the use of our metric in the software development process.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TSE.2010.60</doi><tpages>16</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0098-5589
ispartof IEEE transactions on software engineering, 2011-05, Vol.37 (3), p.371-386
issn 0098-5589
1939-3520
language eng
recordid cdi_proquest_journals_868620733
source IEEE Electronic Library (IEL)
subjects Alliances
Analysis
Application software
Code design
Complement
Computer programs
Demand
Digital Object Identifier
Java
life cycle
Measurement methods
Methods
Pressing
Product life cycle
product metrics
Programming
protection mechanisms
Quality improvement
Risk
risk mitigation
Security
Size measurement
Software
Software development
Software engineering
Software industry
Software measurement
Software quality
software security
Software systems
Studies
Time measurement
title An Attack Surface Metric
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T12%3A37%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=An%20Attack%20Surface%20Metric&rft.jtitle=IEEE%20transactions%20on%20software%20engineering&rft.au=Manadhata,%20P%20K&rft.date=2011-05-01&rft.volume=37&rft.issue=3&rft.spage=371&rft.epage=386&rft.pages=371-386&rft.issn=0098-5589&rft.eissn=1939-3520&rft.coden=IESEDJ&rft_id=info:doi/10.1109/TSE.2010.60&rft_dat=%3Cproquest_RIE%3E2357879171%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=868620733&rft_id=info:pmid/&rft_ieee_id=5482589&rfr_iscdi=true