Toward an understanding of grain-to-grain anisotropy field variation in thin film media
Grain-to-grain anisotropy field variation has become one of the main causes of medium noise, especially in perpendicular thin film media. In this paper, we present an electron microscopy investigation and theoretical analysis on the grain-to-grain anisotropy field variation in various types of thin...
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| Veröffentlicht in: | IEEE transactions on magnetics 2005-02, Vol.41 (2), p.543-548 |
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| container_title | IEEE transactions on magnetics |
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| creator | Jian-Gang Zhu Yingguo Peng Laughlin, D.E. |
| description | Grain-to-grain anisotropy field variation has become one of the main causes of medium noise, especially in perpendicular thin film media. In this paper, we present an electron microscopy investigation and theoretical analysis on the grain-to-grain anisotropy field variation in various types of thin film recording media. In alloyed film media, the intrinsic grain-to-grain composition variation would present a lower limit on grain size, thereby limiting area recording density. It is also argued that partial ordering in L1/sub 0/ materials such as FePt would yield large anisotropy field variation, especially for low values of order parameter. |
| doi_str_mv | 10.1109/TMAG.2004.838074 |
| format | Article |
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In this paper, we present an electron microscopy investigation and theoretical analysis on the grain-to-grain anisotropy field variation in various types of thin film recording media. In alloyed film media, the intrinsic grain-to-grain composition variation would present a lower limit on grain size, thereby limiting area recording density. 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(IEEE) 2005</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-27d1a3fee137e6c095feddec080a70f019de60295c02d21e13ff31633551692c3</citedby><cites>FETCH-LOGICAL-c414t-27d1a3fee137e6c095feddec080a70f019de60295c02d21e13ff31633551692c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1396177$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23910,23911,25119,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1396177$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16548327$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Jian-Gang Zhu</creatorcontrib><creatorcontrib>Yingguo Peng</creatorcontrib><creatorcontrib>Laughlin, D.E.</creatorcontrib><title>Toward an understanding of grain-to-grain anisotropy field variation in thin film media</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>Grain-to-grain anisotropy field variation has become one of the main causes of medium noise, especially in perpendicular thin film media. In this paper, we present an electron microscopy investigation and theoretical analysis on the grain-to-grain anisotropy field variation in various types of thin film recording media. In alloyed film media, the intrinsic grain-to-grain composition variation would present a lower limit on grain size, thereby limiting area recording density. It is also argued that partial ordering in L1/sub 0/ materials such as FePt would yield large anisotropy field variation, especially for low values of order parameter.</description><subject>Anisotropic magnetoresistance</subject><subject>Anisotropy</subject><subject>Anisotropy field</subject><subject>Chromium</subject><subject>Cobalt</subject><subject>Constraining</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Crystallization</subject><subject>Data storage systems</subject><subject>Density</subject><subject>Electrons</subject><subject>Exact sciences and technology</subject><subject>grain</subject><subject>Grain boundaries</subject><subject>Grain size</subject><subject>Iron compounds</subject><subject>Magnetism</subject><subject>Materials science</subject><subject>Media</subject><subject>medium noise</subject><subject>order parameter</subject><subject>Other topics in materials science</subject><subject>Physics</subject><subject>Recording</subject><subject>Saturation magnetization</subject><subject>thin film media</subject><subject>Thin films</subject><subject>Transistors</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkcFrVDEQxoNYcG29C14egnp660ySl_dyLEWr0OJlxWMIyaSmvE3W5K2l_32zbqHgQbxkEr7ffEPmY-w1whoR9MfN9fnlmgPI9SQmGOUztkItsQdQ-jlbAeDUa6nkC_ay1tv2lAPCiv3Y5DtbfGdTt0-eSl1s8jHddDl0N8XG1C-5_3NpSKx5KXl334VIs-9-2xLtEnPqmrr8bEeI87bbko_2jJ0EO1d69VhP2ffPnzYXX_qrb5dfL86veidRLj0fPVoRiFCMpBzoIZD35GACO0IA1J4UcD044J5jw0IQqIQYBlSaO3HKPhx9dyX_2lNdzDZWR_NsE-V9NRqlUiikbOT7f5J84sD5oP8DxLbU6eD49i_wNu9Lat81kxrbXJBDg-AIuZJrLRTMrsStLfcGwRySM4fkzCE5c0yutbx79LXV2TkUm1ysT31qkJPgY-PeHLlIRE-y0ArHUTwA9MmgJw</recordid><startdate>20050201</startdate><enddate>20050201</enddate><creator>Jian-Gang Zhu</creator><creator>Yingguo Peng</creator><creator>Laughlin, D.E.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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In this paper, we present an electron microscopy investigation and theoretical analysis on the grain-to-grain anisotropy field variation in various types of thin film recording media. In alloyed film media, the intrinsic grain-to-grain composition variation would present a lower limit on grain size, thereby limiting area recording density. It is also argued that partial ordering in L1/sub 0/ materials such as FePt would yield large anisotropy field variation, especially for low values of order parameter.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2004.838074</doi><tpages>6</tpages></addata></record> |
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| issn | 0018-9464 1941-0069 |
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| subjects | Anisotropic magnetoresistance Anisotropy Anisotropy field Chromium Cobalt Constraining Cross-disciplinary physics: materials science rheology Crystallization Data storage systems Density Electrons Exact sciences and technology grain Grain boundaries Grain size Iron compounds Magnetism Materials science Media medium noise order parameter Other topics in materials science Physics Recording Saturation magnetization thin film media Thin films Transistors |
| title | Toward an understanding of grain-to-grain anisotropy field variation in thin film media |
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