Engineering the microstructure of thin films for perpendicular recording

In this paper we discuss various microstructural features that control the recording properties of thin films used in perpendicular recording. These microstructure features include crystallographic texture, grain size, grain size distribution, grain to grain magnetic isolation, grain to grain compos...

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Veröffentlicht in:	IEEE transactions on magnetics 2005-02, Vol.41 (2), p.719-723
Hauptverfasser:	Laughlin, D.E., Kumar, S., Yingguo Peng, Roy, A.G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Co-alloy Cobalt alloys Composite materials Cross-disciplinary physics: materials science rheology Crystalline materials crystallographic texture Crystallography Disk recording Exact sciences and technology grain distribution grain isolation Grain size Grains granular oxide Magnetic materials Magnetic storage Magnetism Materials science Microstructure order parameter Other topics in materials science Perpendicular magnetic recording Physics Recording Recording instruments Surface layer Texture Thin films Transistors
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