Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks
We present two novel techniques for modeling two- and three-dimensional metamaterials with negative refractive index by transmission-line matrix (TLM) networks. The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media wi...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2005-04, Vol.53 (4), p.1496-1505 |
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creator | So, P.P.M. Huilian Du Hoefer, W.J.R. |
description | We present two novel techniques for modeling two- and three-dimensional metamaterials with negative refractive index by transmission-line matrix (TLM) networks. The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media with negative refractive index. The TLM models, their implementations, and results computed with the models will be presented. |
doi_str_mv | 10.1109/TMTT.2005.845196 |
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The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media with negative refractive index. The TLM models, their implementations, and results computed with the models will be presented.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2005.845196</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Artificial dielectrics ; Backward waves ; Capacitors ; Circuit simulation ; focusing ; Inductors ; inter-cell scattering procedure ; left-handed media (LHM) ; Mathematical models ; Metamaterials ; Microwaves ; negative permeability ; negative permittivity ; negative refractive index ; Networks ; Numerical models ; Periodic structures ; Refractive index ; Refractivity ; Shunt (electrical) ; Transmission line matrix methods ; Transmission lines ; Transmission-line matrix ; transmission-line matrix (TLM) method</subject><ispartof>IEEE transactions on microwave theory and techniques, 2005-04, Vol.53 (4), p.1496-1505</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c386t-7347356614e476cf766c7f92b0289b472e981c47742a965a60a6229c171af6663</citedby><cites>FETCH-LOGICAL-c386t-7347356614e476cf766c7f92b0289b472e981c47742a965a60a6229c171af6663</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1420790$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1420790$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>So, P.P.M.</creatorcontrib><creatorcontrib>Huilian Du</creatorcontrib><creatorcontrib>Hoefer, W.J.R.</creatorcontrib><title>Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>We present two novel techniques for modeling two- and three-dimensional metamaterials with negative refractive index by transmission-line matrix (TLM) networks. The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media with negative refractive index. The TLM models, their implementations, and results computed with the models will be presented.</description><subject>Artificial dielectrics</subject><subject>Backward waves</subject><subject>Capacitors</subject><subject>Circuit simulation</subject><subject>focusing</subject><subject>Inductors</subject><subject>inter-cell scattering procedure</subject><subject>left-handed media (LHM)</subject><subject>Mathematical models</subject><subject>Metamaterials</subject><subject>Microwaves</subject><subject>negative permeability</subject><subject>negative permittivity</subject><subject>negative refractive index</subject><subject>Networks</subject><subject>Numerical models</subject><subject>Periodic structures</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Shunt (electrical)</subject><subject>Transmission line matrix methods</subject><subject>Transmission lines</subject><subject>Transmission-line matrix</subject><subject>transmission-line matrix (TLM) method</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp90c1PwyAYBnBiNHF-3E28EA_qpZOXwgsczfxMNj1YzwQ7qtWtVWid_vcyZ2LiwROQ_J43wEPIHrAhADMnxaQohpwxOdRCgsE1MgApVWZQsXUyYAx0ZoRmm2Qrxud0FJLpAXGTdupndfNI24rOfefmrvOhdrNIF3X3RBv_6Lr63dPgq-DK723dTP0H7eMyxbMzGp_6pqOumdI8ne5GN7QYT1KyW7ThJe6QjSqN87s_6za5vzgvRlfZ-PbyenQ6zspcY5epXKhcIoLwQmFZKcRSVYY_MK7Ng1DcGw2lUEpwZ1A6ZA45NyUocBUi5tvkaDX3NbRvvY-dndex9LOZa3zbR6tN8lKBTPLwX8k14wCGJXj8LwRUkOcccp3owR_63PahSQ-2GpVAIQwkxFaoDG2M6Ufta6jnLnxaYHbZol22aJct2lWLKbK_itTe-18uOFPpgl83oJTj</recordid><startdate>20050401</startdate><enddate>20050401</enddate><creator>So, P.P.M.</creator><creator>Huilian Du</creator><creator>Hoefer, W.J.R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>7TK</scope></search><sort><creationdate>20050401</creationdate><title>Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks</title><author>So, P.P.M. ; Huilian Du ; Hoefer, W.J.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c386t-7347356614e476cf766c7f92b0289b472e981c47742a965a60a6229c171af6663</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Artificial dielectrics</topic><topic>Backward waves</topic><topic>Capacitors</topic><topic>Circuit simulation</topic><topic>focusing</topic><topic>Inductors</topic><topic>inter-cell scattering procedure</topic><topic>left-handed media (LHM)</topic><topic>Mathematical models</topic><topic>Metamaterials</topic><topic>Microwaves</topic><topic>negative permeability</topic><topic>negative permittivity</topic><topic>negative refractive index</topic><topic>Networks</topic><topic>Numerical models</topic><topic>Periodic structures</topic><topic>Refractive index</topic><topic>Refractivity</topic><topic>Shunt (electrical)</topic><topic>Transmission line matrix methods</topic><topic>Transmission lines</topic><topic>Transmission-line matrix</topic><topic>transmission-line matrix (TLM) method</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>So, P.P.M.</creatorcontrib><creatorcontrib>Huilian Du</creatorcontrib><creatorcontrib>Hoefer, W.J.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Neurosciences Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>So, P.P.M.</au><au>Huilian Du</au><au>Hoefer, W.J.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2005-04-01</date><risdate>2005</risdate><volume>53</volume><issue>4</issue><spage>1496</spage><epage>1505</epage><pages>1496-1505</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>We present two novel techniques for modeling two- and three-dimensional metamaterials with negative refractive index by transmission-line matrix (TLM) networks. The TLM networks are numerical models of reactively loaded periodic networks that support backward waves and constitute artificial media with negative refractive index. The TLM models, their implementations, and results computed with the models will be presented.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMTT.2005.845196</doi><tpages>10</tpages></addata></record> |
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subjects | Artificial dielectrics Backward waves Capacitors Circuit simulation focusing Inductors inter-cell scattering procedure left-handed media (LHM) Mathematical models Metamaterials Microwaves negative permeability negative permittivity negative refractive index Networks Numerical models Periodic structures Refractive index Refractivity Shunt (electrical) Transmission line matrix methods Transmission lines Transmission-line matrix transmission-line matrix (TLM) method |
title | Modeling of metamaterials with negative refractive index using 2-D shunt and 3-D SCN TLM networks |
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