Quantifying Optical Feedback Into Semiconductor Lasers via Thermal Profiling
We show that thermal profiling can be used to monitor optical feedback into semiconductor lasers in photonic integrated circuits, where direct optical access is impractical. The optical output power of a laser, both free-running and when exposed to optical feedback, can be quantitatively determined...
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| Veröffentlicht in: | IEEE photonics technology letters 2006-01, Vol.18 (2), p.310-312 |
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| container_end_page | 312 |
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| container_title | IEEE photonics technology letters |
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| creator | Kapusta, E.W. Lueren, D. Hudgings, J.A. |
| description | We show that thermal profiling can be used to monitor optical feedback into semiconductor lasers in photonic integrated circuits, where direct optical access is impractical. The optical output power of a laser, both free-running and when exposed to optical feedback, can be quantitatively determined from thermal measurements alone, without recourse to direct optical measurements. Furthermore, the shift in threshold current resulting from optical feedback can be determined from the thermal measurements, enabling quantitative determination of the feedback coupling efficiency into the laser. |
| doi_str_mv | 10.1109/LPT.2005.861967 |
| format | Article |
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The optical output power of a laser, both free-running and when exposed to optical feedback, can be quantitatively determined from thermal measurements alone, without recourse to direct optical measurements. Furthermore, the shift in threshold current resulting from optical feedback can be determined from the thermal measurements, enabling quantitative determination of the feedback coupling efficiency into the laser.</description><identifier>ISSN: 1041-1135</identifier><identifier>EISSN: 1941-0174</identifier><identifier>DOI: 10.1109/LPT.2005.861967</identifier><identifier>CODEN: IPTLEL</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Integrated circuit measurements ; Integrated optics ; Laser feedback ; Lasers ; Monitoring ; Monitors ; Optical feedback ; Photonic integrated circuits ; Photonics ; photothermal effects ; Power generation ; Power lasers ; Power measurement ; Profiling ; semiconductor device thermal factors ; Semiconductor lasers ; Thermal measurements ; Threshold currents</subject><ispartof>IEEE photonics technology letters, 2006-01, Vol.18 (2), p.310-312</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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The optical output power of a laser, both free-running and when exposed to optical feedback, can be quantitatively determined from thermal measurements alone, without recourse to direct optical measurements. Furthermore, the shift in threshold current resulting from optical feedback can be determined from the thermal measurements, enabling quantitative determination of the feedback coupling efficiency into the laser.</description><subject>Integrated circuit measurements</subject><subject>Integrated optics</subject><subject>Laser feedback</subject><subject>Lasers</subject><subject>Monitoring</subject><subject>Monitors</subject><subject>Optical feedback</subject><subject>Photonic integrated circuits</subject><subject>Photonics</subject><subject>photothermal effects</subject><subject>Power generation</subject><subject>Power lasers</subject><subject>Power measurement</subject><subject>Profiling</subject><subject>semiconductor device thermal factors</subject><subject>Semiconductor lasers</subject><subject>Thermal measurements</subject><subject>Threshold currents</subject><issn>1041-1135</issn><issn>1941-0174</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1LHEEQhhtJQLPx7MHL4CHmsmtXf_cxiEZhQEPWc9PbW520zs6s3TMB_729rCDk4KXqPTz1QvEQcgJ0AUDtRXu_XDBK5cIosEofkCOwAuYUtPhUM60ZgMtD8qWUR0pBSC6OSPtr8v2Y4kvq_zR32zEF3zXXiOuVD0_NbT8OzW_cpDD06ymMQ25aXzCX5l_yzfIv5k3F7_MQU1cLvpLP0XcFj9_2jDxcXy0vb-bt3c_byx_tPHAjxvnKStwljlJbEBiFgAhMUMM1IJNKSCUVRbsOkkehkAa_WgthEKPi0fAZOd_3bvPwPGEZ3SaVgF3nexym4oxVjIKStpLfPiSZoZJZvav8_iEISgM3zGhd0bP_0Mdhyn192BmluGK8zhm52EMhD6VkjG6b08bnFwfU7Xy56svtfLm9r3pxur9IiPhOK8E1M_wV8euPHA</recordid><startdate>20060115</startdate><enddate>20060115</enddate><creator>Kapusta, E.W.</creator><creator>Lueren, D.</creator><creator>Hudgings, J.A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| ispartof | IEEE photonics technology letters, 2006-01, Vol.18 (2), p.310-312 |
| issn | 1041-1135 1941-0174 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Integrated circuit measurements Integrated optics Laser feedback Lasers Monitoring Monitors Optical feedback Photonic integrated circuits Photonics photothermal effects Power generation Power lasers Power measurement Profiling semiconductor device thermal factors Semiconductor lasers Thermal measurements Threshold currents |
| title | Quantifying Optical Feedback Into Semiconductor Lasers via Thermal Profiling |
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