Significant contribution of nonphysical leaky mode to the field excited by a source
We were the first to report on printed-circuit transmission lines that nonphysical improper real solutions may have a significant effect on the physical total field excited by a source. We have recently studied such interesting and unexpected effects in more detail, and we have discovered here that...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2006-01, Vol.54 (1), p.421-427 |
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| container_title | IEEE transactions on microwave theory and techniques |
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| creator | Tsuji, M. Ueki, S. Shigesawa, H. |
| description | We were the first to report on printed-circuit transmission lines that nonphysical improper real solutions may have a significant effect on the physical total field excited by a source. We have recently studied such interesting and unexpected effects in more detail, and we have discovered here that a nonphysical leaky solution may also cause a significant effect on the physical near field excited by a source, contrary to earlier belief. This effect has been investigated from the viewpoint of the evolution of eigenvalue solutions, which are extracted from both the finite-difference time-domain numerical data and the measurement data through the generalized pencil of functions technique |
| doi_str_mv | 10.1109/TMTT.2005.860504 |
| format | Article |
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We have recently studied such interesting and unexpected effects in more detail, and we have discovered here that a nonphysical leaky solution may also cause a significant effect on the physical near field excited by a source, contrary to earlier belief. This effect has been investigated from the viewpoint of the evolution of eigenvalue solutions, which are extracted from both the finite-difference time-domain numerical data and the measurement data through the generalized pencil of functions technique</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2005.860504</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit properties ; Coplanar strips ; Data mining ; Dielectric substrates ; Eigenvalues and eigenfunctions ; Electric, optical and optoelectronic circuits ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Finite difference methods ; finite-difference time-domain (FDTD) method ; Frequency ; leaky mode ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; slot line ; Strips ; Surface waves ; Time domain analysis ; Transmission line measurements ; Transmission lines</subject><ispartof>IEEE transactions on microwave theory and techniques, 2006-01, Vol.54 (1), p.421-427</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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We have recently studied such interesting and unexpected effects in more detail, and we have discovered here that a nonphysical leaky solution may also cause a significant effect on the physical near field excited by a source, contrary to earlier belief. This effect has been investigated from the viewpoint of the evolution of eigenvalue solutions, which are extracted from both the finite-difference time-domain numerical data and the measurement data through the generalized pencil of functions technique</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Coplanar strips</subject><subject>Data mining</subject><subject>Dielectric substrates</subject><subject>Eigenvalues and eigenfunctions</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Finite difference methods</subject><subject>finite-difference time-domain (FDTD) method</subject><subject>Frequency</subject><subject>leaky mode</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>slot line</subject><subject>Strips</subject><subject>Surface waves</subject><subject>Time domain analysis</subject><subject>Transmission line measurements</subject><subject>Transmission lines</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkE1LAzEQhoMoWKt3wUsQ9LZ1sptks0cpfoHiwXoOaTKr0W1SN1uw_96UFgqehmGeeXl5CDlnMGEMmpvZy2w2KQHEREkQwA_IiAlRF42s4ZCMAJgqGq7gmJyk9JVXLkCNyNub_wi-9daEgdoYht7PV4OPgcaWhhiWn-uUjx3t0Hyv6SI6pEOkwyfS1mPnKP5aP6Cj8zU1NMVVb_GUHLWmS3i2m2Pyfn83mz4Wz68PT9Pb58JWwIdCtsK5uZBWWGlLBdZJ54xQDGtlnbUMOXO8qRGUYU6V89qUFVTSGFWavFdjcr3NXfbxZ4Vp0AufLHadCRhXSZeKgapBZPDyH_iVi4bcTSspOFMNlxmCLWT7mFKPrV72fmH6tWagN4r1RrHeKNZbxfnlapdrUnbU9iZYn_Z_NQeQvMncxZbziLg_i7pSVVP9ARIRhQk</recordid><startdate>200601</startdate><enddate>200601</enddate><creator>Tsuji, M.</creator><creator>Ueki, S.</creator><creator>Shigesawa, H.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Finite difference methods</topic><topic>finite-difference time-domain (FDTD) method</topic><topic>Frequency</topic><topic>leaky mode</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>slot line</topic><topic>Strips</topic><topic>Surface waves</topic><topic>Time domain analysis</topic><topic>Transmission line measurements</topic><topic>Transmission lines</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tsuji, M.</creatorcontrib><creatorcontrib>Ueki, S.</creatorcontrib><creatorcontrib>Shigesawa, H.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tsuji, M.</au><au>Ueki, S.</au><au>Shigesawa, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Significant contribution of nonphysical leaky mode to the field excited by a source</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2006-01</date><risdate>2006</risdate><volume>54</volume><issue>1</issue><spage>421</spage><epage>427</epage><pages>421-427</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>We were the first to report on printed-circuit transmission lines that nonphysical improper real solutions may have a significant effect on the physical total field excited by a source. We have recently studied such interesting and unexpected effects in more detail, and we have discovered here that a nonphysical leaky solution may also cause a significant effect on the physical near field excited by a source, contrary to earlier belief. This effect has been investigated from the viewpoint of the evolution of eigenvalue solutions, which are extracted from both the finite-difference time-domain numerical data and the measurement data through the generalized pencil of functions technique</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.2005.860504</doi><tpages>7</tpages></addata></record> |
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| ispartof | IEEE transactions on microwave theory and techniques, 2006-01, Vol.54 (1), p.421-427 |
| issn | 0018-9480 1557-9670 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Circuit properties Coplanar strips Data mining Dielectric substrates Eigenvalues and eigenfunctions Electric, optical and optoelectronic circuits Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Finite difference methods finite-difference time-domain (FDTD) method Frequency leaky mode Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits slot line Strips Surface waves Time domain analysis Transmission line measurements Transmission lines |
| title | Significant contribution of nonphysical leaky mode to the field excited by a source |
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