Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band

We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with...

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Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2007-07, Vol.54 (7), p.1486-1491
Hauptverfasser: Kirsch, Philippe, Assouar, Mohamed B., Elmazria, Omar, Hakiki, M. El, Mortet, Vincent, Alnot, Patrick
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container_issue 7
container_start_page 1486
container_title IEEE transactions on ultrasonics, ferroelectrics, and frequency control
container_volume 54
creator Kirsch, Philippe
Assouar, Mohamed B.
Elmazria, Omar
Hakiki, M. El
Mortet, Vincent
Alnot, Patrick
description We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.
doi_str_mv 10.1109/TUFFC.2007.411
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_864222552</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4277167</ieee_id><sourcerecordid>2334973561</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</originalsourceid><addsrcrecordid>eNp9kb-P0zAYhi0E4nqFlYXFYuCm9Pz5R2KPvUI5pAqGuwM2y3G-XH1K4mInQ_97UooYGJi-4X3eV_r0EPIG2AqAmev7h-12s-KMVSsJ8IwsQHFVaKPUc7JgWqtCMGAX5DLnJ8ZASsNfkguoKtBCsgUZNrGvw-DGEAcaW4rFDbqe7sK4j4_JHfZH6obmlNyGxz39hl30YTzSdffl-kNwfRyaYueOmLChd2Oa_DglpG1M9G79nW5DN2LKNAz0B72Zh16RF63rMr7-c5fkYfvxfnNb7L5--rxZ7wovpBkLbmrQmkFpatly7ypfIzeuFcDQNGXbNICV0FJBrZjwyLGpW12ClnWtDfNiSa7Ou4cUf06YR9uH7LHr3IBxynYeLysuSzmT7_9LCqkUF5zN4Lt_wKc4pWH-wupScs5P3JKszpBPMeeErT2k0Lt0tMDsSZj9LcyehNlZ2Fx4ey4ERPwLSz4LKivxC2sOjig</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>864222552</pqid></control><display><type>article</type><title>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</title><source>IEEE Electronic Library (IEL)</source><creator>Kirsch, Philippe ; Assouar, Mohamed B. ; Elmazria, Omar ; Hakiki, M. El ; Mortet, Vincent ; Alnot, Patrick</creator><creatorcontrib>Kirsch, Philippe ; Assouar, Mohamed B. ; Elmazria, Omar ; Hakiki, M. El ; Mortet, Vincent ; Alnot, Patrick</creatorcontrib><description>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</description><identifier>ISSN: 0885-3010</identifier><identifier>EISSN: 1525-8955</identifier><identifier>DOI: 10.1109/TUFFC.2007.411</identifier><identifier>PMID: 17718340</identifier><identifier>CODEN: ITUCER</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic waves ; Aluminum nitride ; Atomic force microscopy ; Atomic structure ; Devices ; Diamonds ; Dispersions ; Fabrication ; Frequency ; Lithography ; Magnetron sputtering ; SAW filters ; Scanning electron microscopy ; Sputtering ; Studies ; Surface acoustic wave devices ; Surface acoustic waves</subject><ispartof>IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2007-07, Vol.54 (7), p.1486-1491</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</citedby><cites>FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4277167$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4277167$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kirsch, Philippe</creatorcontrib><creatorcontrib>Assouar, Mohamed B.</creatorcontrib><creatorcontrib>Elmazria, Omar</creatorcontrib><creatorcontrib>Hakiki, M. El</creatorcontrib><creatorcontrib>Mortet, Vincent</creatorcontrib><creatorcontrib>Alnot, Patrick</creatorcontrib><title>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</title><title>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</title><addtitle>T-UFFC</addtitle><description>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</description><subject>Acoustic waves</subject><subject>Aluminum nitride</subject><subject>Atomic force microscopy</subject><subject>Atomic structure</subject><subject>Devices</subject><subject>Diamonds</subject><subject>Dispersions</subject><subject>Fabrication</subject><subject>Frequency</subject><subject>Lithography</subject><subject>Magnetron sputtering</subject><subject>SAW filters</subject><subject>Scanning electron microscopy</subject><subject>Sputtering</subject><subject>Studies</subject><subject>Surface acoustic wave devices</subject><subject>Surface acoustic waves</subject><issn>0885-3010</issn><issn>1525-8955</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kb-P0zAYhi0E4nqFlYXFYuCm9Pz5R2KPvUI5pAqGuwM2y3G-XH1K4mInQ_97UooYGJi-4X3eV_r0EPIG2AqAmev7h-12s-KMVSsJ8IwsQHFVaKPUc7JgWqtCMGAX5DLnJ8ZASsNfkguoKtBCsgUZNrGvw-DGEAcaW4rFDbqe7sK4j4_JHfZH6obmlNyGxz39hl30YTzSdffl-kNwfRyaYueOmLChd2Oa_DglpG1M9G79nW5DN2LKNAz0B72Zh16RF63rMr7-c5fkYfvxfnNb7L5--rxZ7wovpBkLbmrQmkFpatly7ypfIzeuFcDQNGXbNICV0FJBrZjwyLGpW12ClnWtDfNiSa7Ou4cUf06YR9uH7LHr3IBxynYeLysuSzmT7_9LCqkUF5zN4Lt_wKc4pWH-wupScs5P3JKszpBPMeeErT2k0Lt0tMDsSZj9LcyehNlZ2Fx4ey4ERPwLSz4LKivxC2sOjig</recordid><startdate>20070701</startdate><enddate>20070701</enddate><creator>Kirsch, Philippe</creator><creator>Assouar, Mohamed B.</creator><creator>Elmazria, Omar</creator><creator>Hakiki, M. El</creator><creator>Mortet, Vincent</creator><creator>Alnot, Patrick</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>7QF</scope><scope>JG9</scope></search><sort><creationdate>20070701</creationdate><title>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</title><author>Kirsch, Philippe ; Assouar, Mohamed B. ; Elmazria, Omar ; Hakiki, M. El ; Mortet, Vincent ; Alnot, Patrick</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Acoustic waves</topic><topic>Aluminum nitride</topic><topic>Atomic force microscopy</topic><topic>Atomic structure</topic><topic>Devices</topic><topic>Diamonds</topic><topic>Dispersions</topic><topic>Fabrication</topic><topic>Frequency</topic><topic>Lithography</topic><topic>Magnetron sputtering</topic><topic>SAW filters</topic><topic>Scanning electron microscopy</topic><topic>Sputtering</topic><topic>Studies</topic><topic>Surface acoustic wave devices</topic><topic>Surface acoustic waves</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kirsch, Philippe</creatorcontrib><creatorcontrib>Assouar, Mohamed B.</creatorcontrib><creatorcontrib>Elmazria, Omar</creatorcontrib><creatorcontrib>Hakiki, M. El</creatorcontrib><creatorcontrib>Mortet, Vincent</creatorcontrib><creatorcontrib>Alnot, Patrick</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aluminium Industry Abstracts</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kirsch, Philippe</au><au>Assouar, Mohamed B.</au><au>Elmazria, Omar</au><au>Hakiki, M. El</au><au>Mortet, Vincent</au><au>Alnot, Patrick</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</atitle><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle><stitle>T-UFFC</stitle><date>2007-07-01</date><risdate>2007</risdate><volume>54</volume><issue>7</issue><spage>1486</spage><epage>1491</epage><pages>1486-1491</pages><issn>0885-3010</issn><eissn>1525-8955</eissn><coden>ITUCER</coden><abstract>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</abstract><cop>New York</cop><pub>IEEE</pub><pmid>17718340</pmid><doi>10.1109/TUFFC.2007.411</doi><tpages>6</tpages></addata></record>
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subjects Acoustic waves
Aluminum nitride
Atomic force microscopy
Atomic structure
Devices
Diamonds
Dispersions
Fabrication
Frequency
Lithography
Magnetron sputtering
SAW filters
Scanning electron microscopy
Sputtering
Studies
Surface acoustic wave devices
Surface acoustic waves
title Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T05%3A48%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Combination%20of%20e-Beam%20Lithography%20and%20of%20High%20Velocity%20AlN/Diamond-Layered%20Structure%20for%20SAW%20Filters%20in%20X%20Band&rft.jtitle=IEEE%20transactions%20on%20ultrasonics,%20ferroelectrics,%20and%20frequency%20control&rft.au=Kirsch,%20Philippe&rft.date=2007-07-01&rft.volume=54&rft.issue=7&rft.spage=1486&rft.epage=1491&rft.pages=1486-1491&rft.issn=0885-3010&rft.eissn=1525-8955&rft.coden=ITUCER&rft_id=info:doi/10.1109/TUFFC.2007.411&rft_dat=%3Cproquest_RIE%3E2334973561%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=864222552&rft_id=info:pmid/17718340&rft_ieee_id=4277167&rfr_iscdi=true