Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band
We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with...
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Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control ferroelectrics, and frequency control, 2007-07, Vol.54 (7), p.1486-1491 |
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creator | Kirsch, Philippe Assouar, Mohamed B. Elmazria, Omar Hakiki, M. El Mortet, Vincent Alnot, Patrick |
description | We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well. |
doi_str_mv | 10.1109/TUFFC.2007.411 |
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El ; Mortet, Vincent ; Alnot, Patrick</creator><creatorcontrib>Kirsch, Philippe ; Assouar, Mohamed B. ; Elmazria, Omar ; Hakiki, M. El ; Mortet, Vincent ; Alnot, Patrick</creatorcontrib><description>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</description><identifier>ISSN: 0885-3010</identifier><identifier>EISSN: 1525-8955</identifier><identifier>DOI: 10.1109/TUFFC.2007.411</identifier><identifier>PMID: 17718340</identifier><identifier>CODEN: ITUCER</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic waves ; Aluminum nitride ; Atomic force microscopy ; Atomic structure ; Devices ; Diamonds ; Dispersions ; Fabrication ; Frequency ; Lithography ; Magnetron sputtering ; SAW filters ; Scanning electron microscopy ; Sputtering ; Studies ; Surface acoustic wave devices ; Surface acoustic waves</subject><ispartof>IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 2007-07, Vol.54 (7), p.1486-1491</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</citedby><cites>FETCH-LOGICAL-c349t-29b1880169b4f2ca7cbe29af310e9d6fdd1e738451b503ce2edbf86184bb890c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4277167$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4277167$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kirsch, Philippe</creatorcontrib><creatorcontrib>Assouar, Mohamed B.</creatorcontrib><creatorcontrib>Elmazria, Omar</creatorcontrib><creatorcontrib>Hakiki, M. El</creatorcontrib><creatorcontrib>Mortet, Vincent</creatorcontrib><creatorcontrib>Alnot, Patrick</creatorcontrib><title>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</title><title>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</title><addtitle>T-UFFC</addtitle><description>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</description><subject>Acoustic waves</subject><subject>Aluminum nitride</subject><subject>Atomic force microscopy</subject><subject>Atomic structure</subject><subject>Devices</subject><subject>Diamonds</subject><subject>Dispersions</subject><subject>Fabrication</subject><subject>Frequency</subject><subject>Lithography</subject><subject>Magnetron sputtering</subject><subject>SAW filters</subject><subject>Scanning electron microscopy</subject><subject>Sputtering</subject><subject>Studies</subject><subject>Surface acoustic wave devices</subject><subject>Surface acoustic waves</subject><issn>0885-3010</issn><issn>1525-8955</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kb-P0zAYhi0E4nqFlYXFYuCm9Pz5R2KPvUI5pAqGuwM2y3G-XH1K4mInQ_97UooYGJi-4X3eV_r0EPIG2AqAmev7h-12s-KMVSsJ8IwsQHFVaKPUc7JgWqtCMGAX5DLnJ8ZASsNfkguoKtBCsgUZNrGvw-DGEAcaW4rFDbqe7sK4j4_JHfZH6obmlNyGxz39hl30YTzSdffl-kNwfRyaYueOmLChd2Oa_DglpG1M9G79nW5DN2LKNAz0B72Zh16RF63rMr7-c5fkYfvxfnNb7L5--rxZ7wovpBkLbmrQmkFpatly7ypfIzeuFcDQNGXbNICV0FJBrZjwyLGpW12ClnWtDfNiSa7Ou4cUf06YR9uH7LHr3IBxynYeLysuSzmT7_9LCqkUF5zN4Lt_wKc4pWH-wupScs5P3JKszpBPMeeErT2k0Lt0tMDsSZj9LcyehNlZ2Fx4ey4ERPwLSz4LKivxC2sOjig</recordid><startdate>20070701</startdate><enddate>20070701</enddate><creator>Kirsch, Philippe</creator><creator>Assouar, Mohamed B.</creator><creator>Elmazria, Omar</creator><creator>Hakiki, M. El</creator><creator>Mortet, Vincent</creator><creator>Alnot, Patrick</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><scope>7QF</scope><scope>JG9</scope></search><sort><creationdate>20070701</creationdate><title>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</title><author>Kirsch, Philippe ; Assouar, Mohamed B. ; Elmazria, Omar ; Hakiki, M. 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El</au><au>Mortet, Vincent</au><au>Alnot, Patrick</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band</atitle><jtitle>IEEE transactions on ultrasonics, ferroelectrics, and frequency control</jtitle><stitle>T-UFFC</stitle><date>2007-07-01</date><risdate>2007</risdate><volume>54</volume><issue>7</issue><spage>1486</spage><epage>1491</epage><pages>1486-1491</pages><issn>0885-3010</issn><eissn>1525-8955</eissn><coden>ITUCER</coden><abstract>We report on the fabrication results of surface acoustic wave (SAW) devices operating at frequencies up to 8 GHz. In previous work, we have shown that high acoustic velocities (9 to 12 km/s) are obtained from the layered AIN/diamond structure. The interdigital transducers (IDT) made of aluminum with resolutions up to 250 nm were successfully patterned on AIN/diamond-layered structures with an adapted technological process. The uniformity and periodicity of IDT were confirmed by Held emission scanning electron microscopy and atomic force microscopy analyses. A highly oriented (002) piezoelectric aluminum nitride thin film was deposited on the nucleation side of the CVD diamond by magnetron sputtering technique. The X-ray diffraction effectuated on the AIN/diamond-layered structure exhibits high intensity peaks related to the (002) AlN and (111) diamond orientations. According to the calculated dispersion curves of velocity and the electromechanical coupling coefficient (K 2 ), the AlN layer thickness was chosen in order to combine high velocity and high K 2 . Experimental data extracted from the fabricated SAW devices match with theoretical values quite well.</abstract><cop>New York</cop><pub>IEEE</pub><pmid>17718340</pmid><doi>10.1109/TUFFC.2007.411</doi><tpages>6</tpages></addata></record> |
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subjects | Acoustic waves Aluminum nitride Atomic force microscopy Atomic structure Devices Diamonds Dispersions Fabrication Frequency Lithography Magnetron sputtering SAW filters Scanning electron microscopy Sputtering Studies Surface acoustic wave devices Surface acoustic waves |
title | Combination of e-Beam Lithography and of High Velocity AlN/Diamond-Layered Structure for SAW Filters in X Band |
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