Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel
Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in...
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| Veröffentlicht in: | IEEE transactions on electron devices 2007-06, Vol.54 (6), p.1315-1320 |
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| creator | PARK, Choon-Sang TAE, Heung-Sik KWON, Young-Kuk EUN GI HEO |
| description | Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in both the image sticking and boundary image sticking cells. Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by V t close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses. |
| doi_str_mv | 10.1109/TED.2007.896578 |
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Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by V t close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses.</description><identifier>ISSN: 0018-9383</identifier><identifier>EISSN: 1557-9646</identifier><identifier>DOI: 10.1109/TED.2007.896578</identifier><identifier>CODEN: IETDAI</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>42-in ac plasma display panel (PDP) module ; Applied sciences ; Boundaries ; Deterioration ; Discharge ; Discharges ; Display ; Electrodes ; Electronics ; Exact sciences and technology ; Halo-type boundary image sticking ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Magnesium ; Magnesium oxide ; Partial discharges ; Phosphors ; Physics ; redeposition of Mg species ; scanning electron microscope (SEM) analyses ; Scanning electron microscopy ; Scanning probe microscopes, components and techniques ; Surface discharges ; Surface morphology ; time-of-flight secondary ion mass spectrometry (TOF-SIMS) ; V_{t} close curve</subject><ispartof>IEEE transactions on electron devices, 2007-06, Vol.54 (6), p.1315-1320</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c479t-564d486a85e701f821861bcb757f72ffb97ccbc9a6a86a88dc6196a10618b4cc3</citedby><cites>FETCH-LOGICAL-c479t-564d486a85e701f821861bcb757f72ffb97ccbc9a6a86a88dc6196a10618b4cc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4215194$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4215194$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18798261$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>PARK, Choon-Sang</creatorcontrib><creatorcontrib>TAE, Heung-Sik</creatorcontrib><creatorcontrib>KWON, Young-Kuk</creatorcontrib><creatorcontrib>EUN GI HEO</creatorcontrib><title>Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel</title><title>IEEE transactions on electron devices</title><addtitle>TED</addtitle><description>Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in both the image sticking and boundary image sticking cells. Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by V t close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses.</description><subject>42-in ac plasma display panel (PDP) module</subject><subject>Applied sciences</subject><subject>Boundaries</subject><subject>Deterioration</subject><subject>Discharge</subject><subject>Discharges</subject><subject>Display</subject><subject>Electrodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Halo-type boundary image sticking</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Magnesium</subject><subject>Magnesium oxide</subject><subject>Partial discharges</subject><subject>Phosphors</subject><subject>Physics</subject><subject>redeposition of Mg species</subject><subject>scanning electron microscope (SEM) analyses</subject><subject>Scanning electron microscopy</subject><subject>Scanning probe microscopes, components and techniques</subject><subject>Surface discharges</subject><subject>Surface morphology</subject><subject>time-of-flight secondary ion mass spectrometry (TOF-SIMS)</subject><subject>V_{t} close curve</subject><issn>0018-9383</issn><issn>1557-9646</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkc9LwzAUx4MoOKdnD16CoJ46kzY_j3ObbiA4cIK3kGapRLO2Nq24_96MDQUPCoFHyOd9X973C8ApRgOMkbxeTMaDFCE-EJJRLvZAD1PKE8kI2wc9hLBIZCayQ3AUwmu8MkLSHniefNa2cStbttrDhzzY5kO3riphVcCp9lWyWNcW3lRdudTNGs5W-sXCx9aZN1e-QFfC4QjOvQ4rDccu1F6v4VyX1h-Dg0L7YE92tQ-ebieL0TS5f7ibjYb3iSFctgllZEkE04JajnAhUiwYzk3OKS94WhS55MbkRuqIxCOWhmHJNEYMi5wYk_XB1Va3bqr3zoZWrVww1vv4iaoLSqKMEZlm7F9ScIpYiiPbB5d_khkhnAqCI3j-C3ytuqaM-yrBMi4FQzRC11vINFUIjS1UHQ2PZiqM1CY6FaNTm-jUNrrYcbGT1cFoXzS6NC78tImonLLN-LMt56y1388kxRRLkn0B4pyfrg</recordid><startdate>20070601</startdate><enddate>20070601</enddate><creator>PARK, Choon-Sang</creator><creator>TAE, Heung-Sik</creator><creator>KWON, Young-Kuk</creator><creator>EUN GI HEO</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope><scope>7QF</scope><scope>JG9</scope></search><sort><creationdate>20070601</creationdate><title>Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel</title><author>PARK, Choon-Sang ; TAE, Heung-Sik ; KWON, Young-Kuk ; EUN GI HEO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c479t-564d486a85e701f821861bcb757f72ffb97ccbc9a6a86a88dc6196a10618b4cc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>42-in ac plasma display panel (PDP) module</topic><topic>Applied sciences</topic><topic>Boundaries</topic><topic>Deterioration</topic><topic>Discharge</topic><topic>Discharges</topic><topic>Display</topic><topic>Electrodes</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Halo-type boundary image sticking</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Magnesium</topic><topic>Magnesium oxide</topic><topic>Partial discharges</topic><topic>Phosphors</topic><topic>Physics</topic><topic>redeposition of Mg species</topic><topic>scanning electron microscope (SEM) analyses</topic><topic>Scanning electron microscopy</topic><topic>Scanning probe microscopes, components and techniques</topic><topic>Surface discharges</topic><topic>Surface morphology</topic><topic>time-of-flight secondary ion mass spectrometry (TOF-SIMS)</topic><topic>V_{t} close curve</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>PARK, Choon-Sang</creatorcontrib><creatorcontrib>TAE, Heung-Sik</creatorcontrib><creatorcontrib>KWON, Young-Kuk</creatorcontrib><creatorcontrib>EUN GI HEO</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aluminium Industry Abstracts</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on electron devices</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PARK, Choon-Sang</au><au>TAE, Heung-Sik</au><au>KWON, Young-Kuk</au><au>EUN GI HEO</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel</atitle><jtitle>IEEE transactions on electron devices</jtitle><stitle>TED</stitle><date>2007-06-01</date><risdate>2007</risdate><volume>54</volume><issue>6</issue><spage>1315</spage><epage>1320</epage><pages>1315-1320</pages><issn>0018-9383</issn><eissn>1557-9646</eissn><coden>IETDAI</coden><abstract>Infrared-emission observations show that the discharge characteristics related to the MgO surface are improved in both the image sticking and boundary image sticking cells, whereas luminance observations show a deterioration in the visible-conversion characteristics related to the phosphor layer in both the image sticking and boundary image sticking cells. Consequently, the image sticking phenomenon is strongly related to the Mg species sputtered from the MgO surface of the discharge cells due to an iterant strong sustain discharge. In particular, halo-type boundary image sticking is due to the redeposition of Mg species on both the MgO and phosphor layers in the nondischarge region adjacent to the discharge region, as confirmed by V t close curve, time-of-flight secondary ion mass spectrometry, and scanning electron microscope analyses.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TED.2007.896578</doi><tpages>6</tpages></addata></record> |
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| subjects | 42-in ac plasma display panel (PDP) module Applied sciences Boundaries Deterioration Discharge Discharges Display Electrodes Electronics Exact sciences and technology Halo-type boundary image sticking Instruments, apparatus, components and techniques common to several branches of physics and astronomy Magnesium Magnesium oxide Partial discharges Phosphors Physics redeposition of Mg species scanning electron microscope (SEM) analyses Scanning electron microscopy Scanning probe microscopes, components and techniques Surface discharges Surface morphology time-of-flight secondary ion mass spectrometry (TOF-SIMS) V_{t} close curve |
| title | Experimental Observation of Halo-Type Boundary Image Sticking in AC Plasma Display Panel |
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