Study on Generalized Analysis Model for Fringe Pattern Profilometry
This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorith...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 2008-01, Vol.57 (1), p.160-167 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Yingsong Hu Jiangtao Xi Zongkai Yang Enbang Li Chicharo, J.F. |
| description | This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorithm is presented to retrieve 3-D surfaces from nonlinearly distorted fringes. Without any prior knowledge about the projection system, we still can obtain very accurate measurement results by using a generalized analysis model and a proposed algorithm. Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted. |
| doi_str_mv | 10.1109/TIM.2007.909417 |
| format | Article |
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Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted.</description><subject>Algorithm design and analysis</subject><subject>Algorithms</subject><subject>Australia</subject><subject>Band pass filters</subject><subject>Computer simulation</subject><subject>Digital filters</subject><subject>Distortion</subject><subject>Distortion measurement</subject><subject>Forecasting</subject><subject>Fourier transform profilometry (FTP)</subject><subject>fringe pattern analysis</subject><subject>fringe pattern profilometry (FPP)</subject><subject>generalized analysis model</subject><subject>Gratings</subject><subject>Instrumentation</subject><subject>Mathematical model</subject><subject>Mathematical models</subject><subject>Pattern analysis</subject><subject>Power harmonic filters</subject><subject>Projection</subject><subject>Reconstruction</subject><subject>shift estimation (SE)</subject><subject>Surface reconstruction</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpd0E1Lw0AQBuBFFKzVswcvixdPaWe_ssmxFFuFFgvW87JNZiUlzdbd5FB_vSkRD56GgecdmJeQewYTxiCfbl_XEw6gJznkkukLMmJK6SRPU35JRgAsS3Kp0mtyE-MeephKPSLz97YrT9Q3dIkNBltX31jSWWPrU6wiXfsSa-p8oItQNZ9IN7ZtMTR0E7yran_ANpxuyZWzdcS73zkmH4vn7fwlWb0tX-ezVVIIDm2S7mRWMikY9HvGnXVCi8wJhUKB2hU5uJ3LWVECB6dLmxZaaFsgk8xBzqwYk6fh7jH4rw5jaw5VLLCubYO-iybTCiQXSvXy8Z_c-y70T_Uo5RKEBujRdEBF8DEGdOYYqoMNJ8PAnCs1faXmXKkZKu0TD0OiQsQ_LSVIxjPxA_GBcOg</recordid><startdate>200801</startdate><enddate>200801</enddate><creator>Yingsong Hu</creator><creator>Jiangtao Xi</creator><creator>Zongkai Yang</creator><creator>Enbang Li</creator><creator>Chicharo, J.F.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Algorithm design and analysis Algorithms Australia Band pass filters Computer simulation Digital filters Distortion Distortion measurement Forecasting Fourier transform profilometry (FTP) fringe pattern analysis fringe pattern profilometry (FPP) generalized analysis model Gratings Instrumentation Mathematical model Mathematical models Pattern analysis Power harmonic filters Projection Reconstruction shift estimation (SE) Surface reconstruction |
| title | Study on Generalized Analysis Model for Fringe Pattern Profilometry |
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