Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers

This paper compares the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures. The methods discussed are known as the Cold method and the modified Y -factor method (or Hot-Cold method). The pape...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on microwave theory and techniques 2010-01, Vol.58 (1), p.236-250
Hauptverfasser: Belostotski, L., Haslett, J.W.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 250
container_issue 1
container_start_page 236
container_title IEEE transactions on microwave theory and techniques
container_volume 58
creator Belostotski, L.
Haslett, J.W.
description This paper compares the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures. The methods discussed are known as the Cold method and the modified Y -factor method (or Hot-Cold method). The paper describes equations used in the extraction algorithms. In a Monte Carlo analysis by randomly adding various sources of uncertainties to ¿measurements,¿ created with a computer simulation, performances of the noise parameter extraction methods are compared. It is shown that the iterative Cold method and the direct Cold method are the best at extracting Rn and ¿ opt noise parameters in terms of lowest standard deviation and close proximity of the extracted mean values to the true values. The simplified Cold method, used in a number of commercial systems, has largest systematic offsets in extracted noise parameters while being the quickest to perform. The modified Y -factor method is the slowest to perform due to additional time required for hot measurements. This method is marginally the most accurate to extract F min . These conclusions are also supported with measurement results. This study assembles in one place necessary theoretical background information to serve as a reference for those who are working in the field of noise parameter extraction using tuner-based methods.
doi_str_mv 10.1109/TMTT.2009.2036411
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_856448601</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5356146</ieee_id><sourcerecordid>2289367241</sourcerecordid><originalsourceid>FETCH-LOGICAL-c496t-f32ee75ac40231ca3cb2a718b7013d6bc24426101c0271a8727bacb0a10cc4143</originalsourceid><addsrcrecordid>eNp90U1v1DAQBmALgdSl9AdUXCIkRC9pPf7OsVRbQNoCh7SHXqyJdyJSZePFToD--2bZVQ8cuNiy_MwrjV7GToGfA_Dqor6p63PBeTUf0iiAF2wBWtuyMpa_ZAvOwZWVcvyIvc75YX4qzd2C3S9_YT_h2MWhiG1RTwOl8iNmWhdfY5ep_I4JNzRSKpZ_xoThr7yh8Udc56KNqbij9Fis4u-9Ly43275rO0r5DXvVYp_p5HAfs9vrZX31uVx9-_Tl6nJVBlWZsWylILIag-JCQkAZGoEWXGM5yLVpglBKGOAQuLCAzgrbYGg4Ag9BgZLH7MM-d5viz4ny6DddDtT3OFCcsrdaWqGlg1me_VeCsSCclVrO9N0_9CFOaZj38E4bpZzhuzzYo5Bizolav03dBtOjB-53tfhdLX5Xiz_UMs-8PwRjDti3CYfQ5edBIaQyUpjZvd27joiev7XUBmbwBAStlEA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>856448601</pqid></control><display><type>article</type><title>Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers</title><source>IEEE Electronic Library (IEL)</source><creator>Belostotski, L. ; Haslett, J.W.</creator><creatorcontrib>Belostotski, L. ; Haslett, J.W.</creatorcontrib><description>This paper compares the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures. The methods discussed are known as the Cold method and the modified Y -factor method (or Hot-Cold method). The paper describes equations used in the extraction algorithms. In a Monte Carlo analysis by randomly adding various sources of uncertainties to ¿measurements,¿ created with a computer simulation, performances of the noise parameter extraction methods are compared. It is shown that the iterative Cold method and the direct Cold method are the best at extracting Rn and ¿ opt noise parameters in terms of lowest standard deviation and close proximity of the extracted mean values to the true values. The simplified Cold method, used in a number of commercial systems, has largest systematic offsets in extracted noise parameters while being the quickest to perform. The modified Y -factor method is the slowest to perform due to additional time required for hot measurements. This method is marginally the most accurate to extract F min . These conclusions are also supported with measurement results. This study assembles in one place necessary theoretical background information to serve as a reference for those who are working in the field of noise parameter extraction using tuner-based methods.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2009.2036411</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplifiers ; Applied sciences ; Circuit properties ; Cold ; Cold noise measurement ; Computer simulation ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Equations ; Exact sciences and technology ; Extraction ; hot-cold noise measurement ; Iterative algorithms ; Low noise ; Low-noise amplifiers ; Mathematical analysis ; measurement uncertainty ; Microwaves ; Monte Carlo methods ; Noise ; Noise figure ; Noise measurement ; noise parameters ; noise source ; Parameter extraction ; Performance analysis ; Standard deviation ; Studies ; Tuners ; Uncertainty ; Y -factor ; Yttrium</subject><ispartof>IEEE transactions on microwave theory and techniques, 2010-01, Vol.58 (1), p.236-250</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jan 2010</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c496t-f32ee75ac40231ca3cb2a718b7013d6bc24426101c0271a8727bacb0a10cc4143</citedby><cites>FETCH-LOGICAL-c496t-f32ee75ac40231ca3cb2a718b7013d6bc24426101c0271a8727bacb0a10cc4143</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5356146$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,4009,27902,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5356146$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=22346326$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Belostotski, L.</creatorcontrib><creatorcontrib>Haslett, J.W.</creatorcontrib><title>Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>This paper compares the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures. The methods discussed are known as the Cold method and the modified Y -factor method (or Hot-Cold method). The paper describes equations used in the extraction algorithms. In a Monte Carlo analysis by randomly adding various sources of uncertainties to ¿measurements,¿ created with a computer simulation, performances of the noise parameter extraction methods are compared. It is shown that the iterative Cold method and the direct Cold method are the best at extracting Rn and ¿ opt noise parameters in terms of lowest standard deviation and close proximity of the extracted mean values to the true values. The simplified Cold method, used in a number of commercial systems, has largest systematic offsets in extracted noise parameters while being the quickest to perform. The modified Y -factor method is the slowest to perform due to additional time required for hot measurements. This method is marginally the most accurate to extract F min . These conclusions are also supported with measurement results. This study assembles in one place necessary theoretical background information to serve as a reference for those who are working in the field of noise parameter extraction using tuner-based methods.</description><subject>Amplifiers</subject><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Cold</subject><subject>Cold noise measurement</subject><subject>Computer simulation</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Equations</subject><subject>Exact sciences and technology</subject><subject>Extraction</subject><subject>hot-cold noise measurement</subject><subject>Iterative algorithms</subject><subject>Low noise</subject><subject>Low-noise amplifiers</subject><subject>Mathematical analysis</subject><subject>measurement uncertainty</subject><subject>Microwaves</subject><subject>Monte Carlo methods</subject><subject>Noise</subject><subject>Noise figure</subject><subject>Noise measurement</subject><subject>noise parameters</subject><subject>noise source</subject><subject>Parameter extraction</subject><subject>Performance analysis</subject><subject>Standard deviation</subject><subject>Studies</subject><subject>Tuners</subject><subject>Uncertainty</subject><subject>Y -factor</subject><subject>Yttrium</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp90U1v1DAQBmALgdSl9AdUXCIkRC9pPf7OsVRbQNoCh7SHXqyJdyJSZePFToD--2bZVQ8cuNiy_MwrjV7GToGfA_Dqor6p63PBeTUf0iiAF2wBWtuyMpa_ZAvOwZWVcvyIvc75YX4qzd2C3S9_YT_h2MWhiG1RTwOl8iNmWhdfY5ep_I4JNzRSKpZ_xoThr7yh8Udc56KNqbij9Fis4u-9Ly43275rO0r5DXvVYp_p5HAfs9vrZX31uVx9-_Tl6nJVBlWZsWylILIag-JCQkAZGoEWXGM5yLVpglBKGOAQuLCAzgrbYGg4Ag9BgZLH7MM-d5viz4ny6DddDtT3OFCcsrdaWqGlg1me_VeCsSCclVrO9N0_9CFOaZj38E4bpZzhuzzYo5Bizolav03dBtOjB-53tfhdLX5Xiz_UMs-8PwRjDti3CYfQ5edBIaQyUpjZvd27joiev7XUBmbwBAStlEA</recordid><startdate>201001</startdate><enddate>201001</enddate><creator>Belostotski, L.</creator><creator>Haslett, J.W.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>201001</creationdate><title>Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers</title><author>Belostotski, L. ; Haslett, J.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c496t-f32ee75ac40231ca3cb2a718b7013d6bc24426101c0271a8727bacb0a10cc4143</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Amplifiers</topic><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Cold</topic><topic>Cold noise measurement</topic><topic>Computer simulation</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Equations</topic><topic>Exact sciences and technology</topic><topic>Extraction</topic><topic>hot-cold noise measurement</topic><topic>Iterative algorithms</topic><topic>Low noise</topic><topic>Low-noise amplifiers</topic><topic>Mathematical analysis</topic><topic>measurement uncertainty</topic><topic>Microwaves</topic><topic>Monte Carlo methods</topic><topic>Noise</topic><topic>Noise figure</topic><topic>Noise measurement</topic><topic>noise parameters</topic><topic>noise source</topic><topic>Parameter extraction</topic><topic>Performance analysis</topic><topic>Standard deviation</topic><topic>Studies</topic><topic>Tuners</topic><topic>Uncertainty</topic><topic>Y -factor</topic><topic>Yttrium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Belostotski, L.</creatorcontrib><creatorcontrib>Haslett, J.W.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Belostotski, L.</au><au>Haslett, J.W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2010-01</date><risdate>2010</risdate><volume>58</volume><issue>1</issue><spage>236</spage><epage>250</epage><pages>236-250</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>This paper compares the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures. The methods discussed are known as the Cold method and the modified Y -factor method (or Hot-Cold method). The paper describes equations used in the extraction algorithms. In a Monte Carlo analysis by randomly adding various sources of uncertainties to ¿measurements,¿ created with a computer simulation, performances of the noise parameter extraction methods are compared. It is shown that the iterative Cold method and the direct Cold method are the best at extracting Rn and ¿ opt noise parameters in terms of lowest standard deviation and close proximity of the extracted mean values to the true values. The simplified Cold method, used in a number of commercial systems, has largest systematic offsets in extracted noise parameters while being the quickest to perform. The modified Y -factor method is the slowest to perform due to additional time required for hot measurements. This method is marginally the most accurate to extract F min . These conclusions are also supported with measurement results. This study assembles in one place necessary theoretical background information to serve as a reference for those who are working in the field of noise parameter extraction using tuner-based methods.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.2009.2036411</doi><tpages>15</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9480
ispartof IEEE transactions on microwave theory and techniques, 2010-01, Vol.58 (1), p.236-250
issn 0018-9480
1557-9670
language eng
recordid cdi_proquest_journals_856448601
source IEEE Electronic Library (IEL)
subjects Amplifiers
Applied sciences
Circuit properties
Cold
Cold noise measurement
Computer simulation
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Equations
Exact sciences and technology
Extraction
hot-cold noise measurement
Iterative algorithms
Low noise
Low-noise amplifiers
Mathematical analysis
measurement uncertainty
Microwaves
Monte Carlo methods
Noise
Noise figure
Noise measurement
noise parameters
noise source
Parameter extraction
Performance analysis
Standard deviation
Studies
Tuners
Uncertainty
Y -factor
Yttrium
title Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T04%3A15%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Evaluation%20of%20Tuner-Based%20Noise-Parameter%20Extraction%20Methods%20for%20Very%20Low%20Noise%20Amplifiers&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Belostotski,%20L.&rft.date=2010-01&rft.volume=58&rft.issue=1&rft.spage=236&rft.epage=250&rft.pages=236-250&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.2009.2036411&rft_dat=%3Cproquest_RIE%3E2289367241%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=856448601&rft_id=info:pmid/&rft_ieee_id=5356146&rfr_iscdi=true