Detection and Localization of Defects in Monocrystalline Silicon Solar Cell

Near-surface defects in solar cell wafer have undesirable influence upon device properties, as its efficiency and lifetime. When reverse-bias voltage is applied to the wafer, a magnitude of electric signals from defects can be measured electronically, but the localization of defects is difficult usi...

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Veröffentlicht in:	Advances in optical technologies 2010, Vol.2010 (2010), p.1-5
Hauptverfasser:	Tománek, P., Škarvada, P., Macků, R., Grmela, L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Efficiency Electric currents Electric noise Electric properties Light Methods Microscopy Photovoltaic cells Silicon wafers Solar energy
Online-Zugang:	Volltext
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