Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems

The purpose of this paper is to present a novel methodology for Defect-Oriented (DO) fault sampling, and its implementation in a new extraction tool, lobs (Layout Observer). The methodology is based on the statistics theory, and on the application of the concepts of estimation of totals over subpopu...

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Veröffentlicht in:	Journal of electronic testing 1999-08, Vol.15 (1-2), p.41
Hauptverfasser:	Gonçalves, Fm, Teixeira, Jp
Format:	Artikel
Sprache:	eng
Schlagworte:	Confidence intervals Defects Studies
Online-Zugang:	Volltext
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