RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

The purpose of this paper is to present a RTL design and test methodology allowing the identification of design errors and difficult to verify functional parts. Using novel RTL fault models (namely, for arithmetic and relational operators) and Testability Metrics, two approaches are combined: RTL DF...

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Veröffentlicht in:	Journal of electronic testing 2002-04, Vol.18 (2), p.179
Hauptverfasser:	Santos, Mb, Gonçalves, Fm, Teixeira, Ic, Teixeira, Jp
Format:	Artikel
Sprache:	eng
Schlagworte:	Electronics industry
Online-Zugang:	Volltext
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