Dynamic Recrystallization (DRX) as the Mechanism for Sn Whisker Development. Part I: A Model

A model is proposed that attributes whisker growth in metals and alloys to dynamic recrystallization (DRX) and, in particular, DRX at the material surface. Each step in the DRX process was correlated to the development of whiskers. The DRX model depends upon the details of the deformation process(es...

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Veröffentlicht in:	Journal of electronic materials 2009-09, Vol.38 (9), p.1815-1825
Hauptverfasser:	Vianco, P. T., Rejent, J. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Characterization and Evaluation of Materials Chemistry and Materials Science Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Crystallization Deformation Diffusion in solids Diffusion rate Dynamic recrystallization Electronics and Microelectronics Exact sciences and technology Instrumentation Mass transport Materials Science Methods of crystal growth physics of crystal growth Optical and Electronic Materials Physics Solid State Physics Strain rate Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Temperature Theory and models of crystal growth physics of crystal growth, crystal morphology and orientation Transport properties of condensed matter (nonelectronic) Whiskers and dendrites (growth, structure, and nonelectronic properties)
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