P‐72: Study on Issues in Glass based ENIG Products of Mini LED

Based on the development of MLED glass display products, the issues of ENIG products are studied in this paper. A series of problems such as copper corrosion and NiAu wire were encountered in the process of ENIG. Through appropriate methods, the above problems were significantly improved.

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Veröffentlicht in:SID International Symposium Digest of technical papers 2023-06, Vol.54 (1), p.1749-1750
Hauptverfasser: Zhou, Qiqi, Yan, Jinhai, Lv, Chaoren, Zhai, Ming, Dong, Enkai, Sun, Liang, Zhang, Wenyu, Yang, Kexiong, Hu, Yi, Gao, Jiancai
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container_end_page 1750
container_issue 1
container_start_page 1749
container_title SID International Symposium Digest of technical papers
container_volume 54
creator Zhou, Qiqi
Yan, Jinhai
Lv, Chaoren
Zhai, Ming
Dong, Enkai
Sun, Liang
Zhang, Wenyu
Yang, Kexiong
Hu, Yi
Gao, Jiancai
description Based on the development of MLED glass display products, the issues of ENIG products are studied in this paper. A series of problems such as copper corrosion and NiAu wire were encountered in the process of ENIG. Through appropriate methods, the above problems were significantly improved.
doi_str_mv 10.1002/sdtp.16941
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3161751021</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3161751021</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1051-6feaac86f992654881e28669c9f583649997971cd82d3d056020cc7ebab4c3ed3</originalsourceid><addsrcrecordid>eNp9kMFKAzEURYMoWKsbvyDgTpj6XjKTSVwpba2FqoVWcBfSJANT6kydzFC68xP8Rr_EqePa1ducd-_lEHKJMEAAdhNcvR2gUDEekR5DISPARB2THoBKIyXE2yk5C2ENwHkcqx65m39_fqXsli7qxu1pWdBpCI0PNC_oZGNCoCsTvKPj5-mEzqvSNbYOtMzoU17kdDYenZOTzGyCv_i7ffL6MF4OH6PZy2Q6vJ9FFiHBSGTeGCtFphQTSSwleiaFUFZlieQiVkqlKkXrJHPcQSKAgbWpX5lVbLl3vE-uutxtVX60A2u9LpuqaCs1R4FpgsCwpa47ylZlCJXP9LbK30211wj6YEgfDOlfQy2MHbzLN37_D6kXo-W8-_kBe8dmOw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3161751021</pqid></control><display><type>article</type><title>P‐72: Study on Issues in Glass based ENIG Products of Mini LED</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Zhou, Qiqi ; Yan, Jinhai ; Lv, Chaoren ; Zhai, Ming ; Dong, Enkai ; Sun, Liang ; Zhang, Wenyu ; Yang, Kexiong ; Hu, Yi ; Gao, Jiancai</creator><creatorcontrib>Zhou, Qiqi ; Yan, Jinhai ; Lv, Chaoren ; Zhai, Ming ; Dong, Enkai ; Sun, Liang ; Zhang, Wenyu ; Yang, Kexiong ; Hu, Yi ; Gao, Jiancai</creatorcontrib><description>Based on the development of MLED glass display products, the issues of ENIG products are studied in this paper. A series of problems such as copper corrosion and NiAu wire were encountered in the process of ENIG. Through appropriate methods, the above problems were significantly improved.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.16941</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>corrosion of copper layer ; Corrosion products ; Corrosion tests ; electrochemical migration ; Electroless Nickel and Immersion Gold(ENIG) ; MLED ; nickel gold wire ; SiNx fracture</subject><ispartof>SID International Symposium Digest of technical papers, 2023-06, Vol.54 (1), p.1749-1750</ispartof><rights>2023 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1051-6feaac86f992654881e28669c9f583649997971cd82d3d056020cc7ebab4c3ed3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsdtp.16941$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsdtp.16941$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Zhou, Qiqi</creatorcontrib><creatorcontrib>Yan, Jinhai</creatorcontrib><creatorcontrib>Lv, Chaoren</creatorcontrib><creatorcontrib>Zhai, Ming</creatorcontrib><creatorcontrib>Dong, Enkai</creatorcontrib><creatorcontrib>Sun, Liang</creatorcontrib><creatorcontrib>Zhang, Wenyu</creatorcontrib><creatorcontrib>Yang, Kexiong</creatorcontrib><creatorcontrib>Hu, Yi</creatorcontrib><creatorcontrib>Gao, Jiancai</creatorcontrib><title>P‐72: Study on Issues in Glass based ENIG Products of Mini LED</title><title>SID International Symposium Digest of technical papers</title><description>Based on the development of MLED glass display products, the issues of ENIG products are studied in this paper. A series of problems such as copper corrosion and NiAu wire were encountered in the process of ENIG. Through appropriate methods, the above problems were significantly improved.</description><subject>corrosion of copper layer</subject><subject>Corrosion products</subject><subject>Corrosion tests</subject><subject>electrochemical migration</subject><subject>Electroless Nickel and Immersion Gold(ENIG)</subject><subject>MLED</subject><subject>nickel gold wire</subject><subject>SiNx fracture</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp9kMFKAzEURYMoWKsbvyDgTpj6XjKTSVwpba2FqoVWcBfSJANT6kydzFC68xP8Rr_EqePa1ducd-_lEHKJMEAAdhNcvR2gUDEekR5DISPARB2THoBKIyXE2yk5C2ENwHkcqx65m39_fqXsli7qxu1pWdBpCI0PNC_oZGNCoCsTvKPj5-mEzqvSNbYOtMzoU17kdDYenZOTzGyCv_i7ffL6MF4OH6PZy2Q6vJ9FFiHBSGTeGCtFphQTSSwleiaFUFZlieQiVkqlKkXrJHPcQSKAgbWpX5lVbLl3vE-uutxtVX60A2u9LpuqaCs1R4FpgsCwpa47ylZlCJXP9LbK30211wj6YEgfDOlfQy2MHbzLN37_D6kXo-W8-_kBe8dmOw</recordid><startdate>202306</startdate><enddate>202306</enddate><creator>Zhou, Qiqi</creator><creator>Yan, Jinhai</creator><creator>Lv, Chaoren</creator><creator>Zhai, Ming</creator><creator>Dong, Enkai</creator><creator>Sun, Liang</creator><creator>Zhang, Wenyu</creator><creator>Yang, Kexiong</creator><creator>Hu, Yi</creator><creator>Gao, Jiancai</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>202306</creationdate><title>P‐72: Study on Issues in Glass based ENIG Products of Mini LED</title><author>Zhou, Qiqi ; Yan, Jinhai ; Lv, Chaoren ; Zhai, Ming ; Dong, Enkai ; Sun, Liang ; Zhang, Wenyu ; Yang, Kexiong ; Hu, Yi ; Gao, Jiancai</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1051-6feaac86f992654881e28669c9f583649997971cd82d3d056020cc7ebab4c3ed3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>corrosion of copper layer</topic><topic>Corrosion products</topic><topic>Corrosion tests</topic><topic>electrochemical migration</topic><topic>Electroless Nickel and Immersion Gold(ENIG)</topic><topic>MLED</topic><topic>nickel gold wire</topic><topic>SiNx fracture</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhou, Qiqi</creatorcontrib><creatorcontrib>Yan, Jinhai</creatorcontrib><creatorcontrib>Lv, Chaoren</creatorcontrib><creatorcontrib>Zhai, Ming</creatorcontrib><creatorcontrib>Dong, Enkai</creatorcontrib><creatorcontrib>Sun, Liang</creatorcontrib><creatorcontrib>Zhang, Wenyu</creatorcontrib><creatorcontrib>Yang, Kexiong</creatorcontrib><creatorcontrib>Hu, Yi</creatorcontrib><creatorcontrib>Gao, Jiancai</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhou, Qiqi</au><au>Yan, Jinhai</au><au>Lv, Chaoren</au><au>Zhai, Ming</au><au>Dong, Enkai</au><au>Sun, Liang</au><au>Zhang, Wenyu</au><au>Yang, Kexiong</au><au>Hu, Yi</au><au>Gao, Jiancai</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P‐72: Study on Issues in Glass based ENIG Products of Mini LED</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2023-06</date><risdate>2023</risdate><volume>54</volume><issue>1</issue><spage>1749</spage><epage>1750</epage><pages>1749-1750</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>Based on the development of MLED glass display products, the issues of ENIG products are studied in this paper. A series of problems such as copper corrosion and NiAu wire were encountered in the process of ENIG. Through appropriate methods, the above problems were significantly improved.</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sdtp.16941</doi><tpages>2</tpages></addata></record>
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subjects corrosion of copper layer
Corrosion products
Corrosion tests
electrochemical migration
Electroless Nickel and Immersion Gold(ENIG)
MLED
nickel gold wire
SiNx fracture
title P‐72: Study on Issues in Glass based ENIG Products of Mini LED
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T16%3A28%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=P%E2%80%9072:%20Study%20on%20Issues%20in%20Glass%20based%20ENIG%20Products%20of%20Mini%20LED&rft.jtitle=SID%20International%20Symposium%20Digest%20of%20technical%20papers&rft.au=Zhou,%20Qiqi&rft.date=2023-06&rft.volume=54&rft.issue=1&rft.spage=1749&rft.epage=1750&rft.pages=1749-1750&rft.issn=0097-966X&rft.eissn=2168-0159&rft_id=info:doi/10.1002/sdtp.16941&rft_dat=%3Cproquest_cross%3E3161751021%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3161751021&rft_id=info:pmid/&rfr_iscdi=true