Structural and optical characterization of Mg-doped nickel ferrite thin films
This work reports the growth and deposition of pure and Mg-doped nickel ferrite thin films (Ni 1-x Mg x Fe 2 O 4 , x = 0.0,0.1,0.2,0.3,0.4 and 0.5) using spray pyrolysis technique. The thin films were deposited on clean and ultrasonicated pre-heated glass substrate. The structural characterizations...
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description | This work reports the growth and deposition of pure and Mg-doped nickel ferrite thin films (Ni
1-x
Mg
x
Fe
2
O
4
,
x
= 0.0,0.1,0.2,0.3,0.4 and 0.5) using spray pyrolysis technique. The thin films were deposited on clean and ultrasonicated pre-heated glass substrate. The structural characterizations were made using X-ray diffraction technique (XRD). All the thin films possess single-phase cubic spinel structure, as evidenced from the XRD analysis. The crystallite size was evaluated using Scherrer formula and found to be vary in the range of 11 nm to 21 nm. The structural parameters like lattice constant (a), unit cell volume (V), X-ray density (d
x
), micro strain (ε) and dislocation density (δ) were obtained and their variation with Mg content is discussed. Lattice constant and unit cell volume increase with Mg content x, X-ray density decreases with Mg content x, and the other structural parameters do not show any systematic trend. The surface morphological observations were carried out using Field emission scanning electron microscopy technique (FE-SEM). The spherical grains with average grain size between 26 and 41 nm were observed. The FTIR spectra recorded at room temperature show two metal oxygen absorption bands within the range 400 cm
−1
–600 cm
−1
. Raman spectra reveal five active modes namely T
2
g (3), Eg, A
1
g characterizing the spinel structure. With Mg doping, the Raman modes slightly shifted. The optical properties were studied using UV–Visible spectroscopy technique. The band gap energy values obtained from Tauc plot vary between 1.61 eV and 1.90 eV. I–V studies reveal the ohmic nature showing high values of resistivity. The obtained results are useful for photocatalytic degradation and gas sensing application. |
doi_str_mv | 10.1007/s10854-025-14227-x |
format | Article |
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1-x
Mg
x
Fe
2
O
4
,
x
= 0.0,0.1,0.2,0.3,0.4 and 0.5) using spray pyrolysis technique. The thin films were deposited on clean and ultrasonicated pre-heated glass substrate. The structural characterizations were made using X-ray diffraction technique (XRD). All the thin films possess single-phase cubic spinel structure, as evidenced from the XRD analysis. The crystallite size was evaluated using Scherrer formula and found to be vary in the range of 11 nm to 21 nm. The structural parameters like lattice constant (a), unit cell volume (V), X-ray density (d
x
), micro strain (ε) and dislocation density (δ) were obtained and their variation with Mg content is discussed. Lattice constant and unit cell volume increase with Mg content x, X-ray density decreases with Mg content x, and the other structural parameters do not show any systematic trend. The surface morphological observations were carried out using Field emission scanning electron microscopy technique (FE-SEM). The spherical grains with average grain size between 26 and 41 nm were observed. The FTIR spectra recorded at room temperature show two metal oxygen absorption bands within the range 400 cm
−1
–600 cm
−1
. Raman spectra reveal five active modes namely T
2
g (3), Eg, A
1
g characterizing the spinel structure. With Mg doping, the Raman modes slightly shifted. The optical properties were studied using UV–Visible spectroscopy technique. The band gap energy values obtained from Tauc plot vary between 1.61 eV and 1.90 eV. I–V studies reveal the ohmic nature showing high values of resistivity. The obtained results are useful for photocatalytic degradation and gas sensing application.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-025-14227-x</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Absorption spectra ; Banded structure ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Crystallites ; Cubic lattice ; Dislocation density ; Energy value ; Field emission microscopy ; Gas sensors ; Glass substrates ; Grain size ; Lattice parameters ; Lattice vibration ; Magnesium ; Materials Science ; Microstrain ; Nickel ferrites ; Optical and Electronic Materials ; Optical properties ; Photodegradation ; Raman spectra ; Room temperature ; Spectrum analysis ; Spinel ; Spray pyrolysis ; Structural analysis ; Thin films ; Unit cell ; X-ray diffraction</subject><ispartof>Journal of materials science. Materials in electronics, 2025, Vol.36 (3), p.191, Article 191</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2025 Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><rights>Copyright Springer Nature B.V. Jan 2025</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c200t-a2eb0aa4f618cc5708775794f9f0c69d435ccc74dc5a6bd5cee400175993610d3</cites><orcidid>0009-0004-2177-028X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-025-14227-x$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-025-14227-x$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Rathod, Sagar V.</creatorcontrib><creatorcontrib>Magar, Vikas U.</creatorcontrib><creatorcontrib>Rajmane, S. V.</creatorcontrib><creatorcontrib>Sapate, D. R.</creatorcontrib><creatorcontrib>Jadhav, K. M.</creatorcontrib><title>Structural and optical characterization of Mg-doped nickel ferrite thin films</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>This work reports the growth and deposition of pure and Mg-doped nickel ferrite thin films (Ni
1-x
Mg
x
Fe
2
O
4
,
x
= 0.0,0.1,0.2,0.3,0.4 and 0.5) using spray pyrolysis technique. The thin films were deposited on clean and ultrasonicated pre-heated glass substrate. The structural characterizations were made using X-ray diffraction technique (XRD). All the thin films possess single-phase cubic spinel structure, as evidenced from the XRD analysis. The crystallite size was evaluated using Scherrer formula and found to be vary in the range of 11 nm to 21 nm. The structural parameters like lattice constant (a), unit cell volume (V), X-ray density (d
x
), micro strain (ε) and dislocation density (δ) were obtained and their variation with Mg content is discussed. Lattice constant and unit cell volume increase with Mg content x, X-ray density decreases with Mg content x, and the other structural parameters do not show any systematic trend. The surface morphological observations were carried out using Field emission scanning electron microscopy technique (FE-SEM). The spherical grains with average grain size between 26 and 41 nm were observed. The FTIR spectra recorded at room temperature show two metal oxygen absorption bands within the range 400 cm
−1
–600 cm
−1
. Raman spectra reveal five active modes namely T
2
g (3), Eg, A
1
g characterizing the spinel structure. With Mg doping, the Raman modes slightly shifted. The optical properties were studied using UV–Visible spectroscopy technique. The band gap energy values obtained from Tauc plot vary between 1.61 eV and 1.90 eV. I–V studies reveal the ohmic nature showing high values of resistivity. The obtained results are useful for photocatalytic degradation and gas sensing application.</description><subject>Absorption spectra</subject><subject>Banded structure</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Crystallites</subject><subject>Cubic lattice</subject><subject>Dislocation density</subject><subject>Energy value</subject><subject>Field emission microscopy</subject><subject>Gas sensors</subject><subject>Glass substrates</subject><subject>Grain size</subject><subject>Lattice parameters</subject><subject>Lattice vibration</subject><subject>Magnesium</subject><subject>Materials Science</subject><subject>Microstrain</subject><subject>Nickel ferrites</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Photodegradation</subject><subject>Raman spectra</subject><subject>Room temperature</subject><subject>Spectrum analysis</subject><subject>Spinel</subject><subject>Spray pyrolysis</subject><subject>Structural analysis</subject><subject>Thin films</subject><subject>Unit cell</subject><subject>X-ray diffraction</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2025</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAURYMoWEf_gKuA6-hLmjTtUga_YAYXKrgLmTSZydhpa5LC6K-3WsGdq3cX99wHB6FzCpcUQF5FCqXgBJgglDMmyf4AZVTInPCSvR6iDCohCReMHaOTGLcAUPC8zNDyKYXBpCHoBuu2xl2fvBmz2eigTbLBf-rkuxZ3Di_XpO56W-PWmzfbYGdD8MnitPEtdr7ZxVN05HQT7dnvnaGX25vn-T1ZPN49zK8XxDCARDSzK9Cau4KWxggJpZRCVtxVDkxR1TwXxhjJayN0saqFsZYDUCmqKi8o1PkMXUy7fejeBxuT2nZDaMeXKqeiZIIyWo0tNrVM6GIM1qk--J0OH4qC-tamJm1q1KZ-tKn9COUTFMdyu7bhb_of6gt5iHD1</recordid><startdate>2025</startdate><enddate>2025</enddate><creator>Rathod, Sagar V.</creator><creator>Magar, Vikas U.</creator><creator>Rajmane, S. V.</creator><creator>Sapate, D. R.</creator><creator>Jadhav, K. M.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0009-0004-2177-028X</orcidid></search><sort><creationdate>2025</creationdate><title>Structural and optical characterization of Mg-doped nickel ferrite thin films</title><author>Rathod, Sagar V. ; Magar, Vikas U. ; Rajmane, S. V. ; Sapate, D. R. ; Jadhav, K. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c200t-a2eb0aa4f618cc5708775794f9f0c69d435ccc74dc5a6bd5cee400175993610d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2025</creationdate><topic>Absorption spectra</topic><topic>Banded structure</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Crystallites</topic><topic>Cubic lattice</topic><topic>Dislocation density</topic><topic>Energy value</topic><topic>Field emission microscopy</topic><topic>Gas sensors</topic><topic>Glass substrates</topic><topic>Grain size</topic><topic>Lattice parameters</topic><topic>Lattice vibration</topic><topic>Magnesium</topic><topic>Materials Science</topic><topic>Microstrain</topic><topic>Nickel ferrites</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Photodegradation</topic><topic>Raman spectra</topic><topic>Room temperature</topic><topic>Spectrum analysis</topic><topic>Spinel</topic><topic>Spray pyrolysis</topic><topic>Structural analysis</topic><topic>Thin films</topic><topic>Unit cell</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rathod, Sagar V.</creatorcontrib><creatorcontrib>Magar, Vikas U.</creatorcontrib><creatorcontrib>Rajmane, S. V.</creatorcontrib><creatorcontrib>Sapate, D. R.</creatorcontrib><creatorcontrib>Jadhav, K. M.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rathod, Sagar V.</au><au>Magar, Vikas U.</au><au>Rajmane, S. V.</au><au>Sapate, D. R.</au><au>Jadhav, K. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural and optical characterization of Mg-doped nickel ferrite thin films</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2025</date><risdate>2025</risdate><volume>36</volume><issue>3</issue><spage>191</spage><pages>191-</pages><artnum>191</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>This work reports the growth and deposition of pure and Mg-doped nickel ferrite thin films (Ni
1-x
Mg
x
Fe
2
O
4
,
x
= 0.0,0.1,0.2,0.3,0.4 and 0.5) using spray pyrolysis technique. The thin films were deposited on clean and ultrasonicated pre-heated glass substrate. The structural characterizations were made using X-ray diffraction technique (XRD). All the thin films possess single-phase cubic spinel structure, as evidenced from the XRD analysis. The crystallite size was evaluated using Scherrer formula and found to be vary in the range of 11 nm to 21 nm. The structural parameters like lattice constant (a), unit cell volume (V), X-ray density (d
x
), micro strain (ε) and dislocation density (δ) were obtained and their variation with Mg content is discussed. Lattice constant and unit cell volume increase with Mg content x, X-ray density decreases with Mg content x, and the other structural parameters do not show any systematic trend. The surface morphological observations were carried out using Field emission scanning electron microscopy technique (FE-SEM). The spherical grains with average grain size between 26 and 41 nm were observed. The FTIR spectra recorded at room temperature show two metal oxygen absorption bands within the range 400 cm
−1
–600 cm
−1
. Raman spectra reveal five active modes namely T
2
g (3), Eg, A
1
g characterizing the spinel structure. With Mg doping, the Raman modes slightly shifted. The optical properties were studied using UV–Visible spectroscopy technique. The band gap energy values obtained from Tauc plot vary between 1.61 eV and 1.90 eV. I–V studies reveal the ohmic nature showing high values of resistivity. The obtained results are useful for photocatalytic degradation and gas sensing application.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-025-14227-x</doi><orcidid>https://orcid.org/0009-0004-2177-028X</orcidid></addata></record> |
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subjects | Absorption spectra Banded structure Characterization and Evaluation of Materials Chemistry and Materials Science Crystallites Cubic lattice Dislocation density Energy value Field emission microscopy Gas sensors Glass substrates Grain size Lattice parameters Lattice vibration Magnesium Materials Science Microstrain Nickel ferrites Optical and Electronic Materials Optical properties Photodegradation Raman spectra Room temperature Spectrum analysis Spinel Spray pyrolysis Structural analysis Thin films Unit cell X-ray diffraction |
title | Structural and optical characterization of Mg-doped nickel ferrite thin films |
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