Optimal design of the side sensitive group runs double sampling (SSGRDS) X ¯ scheme with estimated process parameters
The side sensitive group runs double sampling (SSGRDS) X ¯ scheme is previously studied under the known process parameters (Case-K) assumption. As the process parameters are hardly known in practical situations, they must be estimated using a suitably chosen in-control (IC) Phase-I sample. However,...
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Veröffentlicht in: | Transactions of the Institute of Measurement and Control 2025-02, Vol.47 (3), p.487-505 |
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creator | Chong, Zhi Lin Yeong, Wai Chung Khaw, Khai Wah Chew, XinYing Teoh, Wei Lin |
description | The side sensitive group runs double sampling (SSGRDS)
X
¯
scheme is previously studied under the known process parameters (Case-K) assumption. As the process parameters are hardly known in practical situations, they must be estimated using a suitably chosen in-control (IC) Phase-I sample. However, various studies demonstrated that a substantial amount of Phase-I sample is necessary so that the scheme with unknown process parameters (Case-U) attains a performance almost similar to that of the Case-K counterpart. Since it is challenging to acquire a vast number of IC samples, we examine the optimal designs of the Case-U SSGRDS
X
¯
scheme such that the average number of observations to signal (ANOS) and expected ANOS (EANOS) are minimised. The optimal parameters obtained for the Case-U SSGRDS
X
¯
scheme enable it to have a performance comparable to that of the Case-K counterpart, without the need for a large number of Phase-I samples. We show that the Case-U SSGRDS
X
¯
scheme is effective in identifying the process mean shift of a silicon epitaxial process. |
doi_str_mv | 10.1177/01423312241249824 |
format | Article |
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X
¯
scheme is previously studied under the known process parameters (Case-K) assumption. As the process parameters are hardly known in practical situations, they must be estimated using a suitably chosen in-control (IC) Phase-I sample. However, various studies demonstrated that a substantial amount of Phase-I sample is necessary so that the scheme with unknown process parameters (Case-U) attains a performance almost similar to that of the Case-K counterpart. Since it is challenging to acquire a vast number of IC samples, we examine the optimal designs of the Case-U SSGRDS
X
¯
scheme such that the average number of observations to signal (ANOS) and expected ANOS (EANOS) are minimised. The optimal parameters obtained for the Case-U SSGRDS
X
¯
scheme enable it to have a performance comparable to that of the Case-K counterpart, without the need for a large number of Phase-I samples. We show that the Case-U SSGRDS
X
¯
scheme is effective in identifying the process mean shift of a silicon epitaxial process.</description><identifier>ISSN: 0142-3312</identifier><identifier>EISSN: 1477-0369</identifier><identifier>DOI: 10.1177/01423312241249824</identifier><language>eng</language><publisher>London, England: SAGE Publications</publisher><subject>Parameter estimation ; Parameter identification ; Parameter sensitivity ; Process parameters ; Samples ; Sampling</subject><ispartof>Transactions of the Institute of Measurement and Control, 2025-02, Vol.47 (3), p.487-505</ispartof><rights>The Author(s) 2024</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1094-dc6160a33ef38ff5385551342cdd8e15eaf80031dbea7a708e87785e4f3d58823</cites><orcidid>0000-0003-4715-1490 ; 0000-0001-5670-6043</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://journals.sagepub.com/doi/pdf/10.1177/01423312241249824$$EPDF$$P50$$Gsage$$H</linktopdf><linktohtml>$$Uhttps://journals.sagepub.com/doi/10.1177/01423312241249824$$EHTML$$P50$$Gsage$$H</linktohtml><link.rule.ids>314,776,780,21798,27901,27902,43597,43598</link.rule.ids></links><search><creatorcontrib>Chong, Zhi Lin</creatorcontrib><creatorcontrib>Yeong, Wai Chung</creatorcontrib><creatorcontrib>Khaw, Khai Wah</creatorcontrib><creatorcontrib>Chew, XinYing</creatorcontrib><creatorcontrib>Teoh, Wei Lin</creatorcontrib><title>Optimal design of the side sensitive group runs double sampling (SSGRDS) X ¯ scheme with estimated process parameters</title><title>Transactions of the Institute of Measurement and Control</title><description>The side sensitive group runs double sampling (SSGRDS)
X
¯
scheme is previously studied under the known process parameters (Case-K) assumption. As the process parameters are hardly known in practical situations, they must be estimated using a suitably chosen in-control (IC) Phase-I sample. However, various studies demonstrated that a substantial amount of Phase-I sample is necessary so that the scheme with unknown process parameters (Case-U) attains a performance almost similar to that of the Case-K counterpart. Since it is challenging to acquire a vast number of IC samples, we examine the optimal designs of the Case-U SSGRDS
X
¯
scheme such that the average number of observations to signal (ANOS) and expected ANOS (EANOS) are minimised. The optimal parameters obtained for the Case-U SSGRDS
X
¯
scheme enable it to have a performance comparable to that of the Case-K counterpart, without the need for a large number of Phase-I samples. We show that the Case-U SSGRDS
X
¯
scheme is effective in identifying the process mean shift of a silicon epitaxial process.</description><subject>Parameter estimation</subject><subject>Parameter identification</subject><subject>Parameter sensitivity</subject><subject>Process parameters</subject><subject>Samples</subject><subject>Sampling</subject><issn>0142-3312</issn><issn>1477-0369</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2025</creationdate><recordtype>article</recordtype><recordid>eNp1UMtKAzEUDaJgrX6Au4AbXUxNJskkXUrVKhQKVsHdkE5uplPmZTJT8av8B7_MDBVciJt7FudxDwehc0omlEp5TSiPGaNxzGnMpyrmB2hEuZQRYcn0EI0GPhoEx-jE-y0hhPOEj9Bu2XZFpUtswBd5jRuLuw1gX5hwoPZFV-wA567pW-z62mPT9OsycLpqy6LO8eVqNX-6XV3hV_z1iX22gQrwe9FtMPghuQODW9dk4D1utdMVdOD8KTqyuvRw9oNj9HJ_9zx7iBbL-ePsZhFllEx5ZLKEJkQzBpYpawVTQgjKeJwZo4AK0FYRwqhZg5ZaEgVKSiWAW2aEUjEbo4t9bqjw1odG6bbpXR1epoyKZCqFojyo6F6VucZ7BzZtXajuPlJK0mHe9M-8wTPZe7zO4Tf1f8M30R56gw</recordid><startdate>202502</startdate><enddate>202502</enddate><creator>Chong, Zhi Lin</creator><creator>Yeong, Wai Chung</creator><creator>Khaw, Khai Wah</creator><creator>Chew, XinYing</creator><creator>Teoh, Wei Lin</creator><general>SAGE Publications</general><general>Sage Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-4715-1490</orcidid><orcidid>https://orcid.org/0000-0001-5670-6043</orcidid></search><sort><creationdate>202502</creationdate><title>Optimal design of the side sensitive group runs double sampling (SSGRDS) X ¯ scheme with estimated process parameters</title><author>Chong, Zhi Lin ; Yeong, Wai Chung ; Khaw, Khai Wah ; Chew, XinYing ; Teoh, Wei Lin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1094-dc6160a33ef38ff5385551342cdd8e15eaf80031dbea7a708e87785e4f3d58823</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2025</creationdate><topic>Parameter estimation</topic><topic>Parameter identification</topic><topic>Parameter sensitivity</topic><topic>Process parameters</topic><topic>Samples</topic><topic>Sampling</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chong, Zhi Lin</creatorcontrib><creatorcontrib>Yeong, Wai Chung</creatorcontrib><creatorcontrib>Khaw, Khai Wah</creatorcontrib><creatorcontrib>Chew, XinYing</creatorcontrib><creatorcontrib>Teoh, Wei Lin</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Transactions of the Institute of Measurement and Control</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chong, Zhi Lin</au><au>Yeong, Wai Chung</au><au>Khaw, Khai Wah</au><au>Chew, XinYing</au><au>Teoh, Wei Lin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optimal design of the side sensitive group runs double sampling (SSGRDS) X ¯ scheme with estimated process parameters</atitle><jtitle>Transactions of the Institute of Measurement and Control</jtitle><date>2025-02</date><risdate>2025</risdate><volume>47</volume><issue>3</issue><spage>487</spage><epage>505</epage><pages>487-505</pages><issn>0142-3312</issn><eissn>1477-0369</eissn><abstract>The side sensitive group runs double sampling (SSGRDS)
X
¯
scheme is previously studied under the known process parameters (Case-K) assumption. As the process parameters are hardly known in practical situations, they must be estimated using a suitably chosen in-control (IC) Phase-I sample. However, various studies demonstrated that a substantial amount of Phase-I sample is necessary so that the scheme with unknown process parameters (Case-U) attains a performance almost similar to that of the Case-K counterpart. Since it is challenging to acquire a vast number of IC samples, we examine the optimal designs of the Case-U SSGRDS
X
¯
scheme such that the average number of observations to signal (ANOS) and expected ANOS (EANOS) are minimised. The optimal parameters obtained for the Case-U SSGRDS
X
¯
scheme enable it to have a performance comparable to that of the Case-K counterpart, without the need for a large number of Phase-I samples. We show that the Case-U SSGRDS
X
¯
scheme is effective in identifying the process mean shift of a silicon epitaxial process.</abstract><cop>London, England</cop><pub>SAGE Publications</pub><doi>10.1177/01423312241249824</doi><tpages>19</tpages><orcidid>https://orcid.org/0000-0003-4715-1490</orcidid><orcidid>https://orcid.org/0000-0001-5670-6043</orcidid></addata></record> |
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language | eng |
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source | SAGE Complete |
subjects | Parameter estimation Parameter identification Parameter sensitivity Process parameters Samples Sampling |
title | Optimal design of the side sensitive group runs double sampling (SSGRDS) X ¯ scheme with estimated process parameters |
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