Revealing the Structure/Property Relationships of Semiconductor Nanomaterials via Transmission Electron Microscopy

Transmission electron microscopy (TEM) offers unprecedent atomic resolution imaging and diverse characterizations capabilities, which has been proved to be effective in correlating the atomic structures and compositions with the physical/chemical properties of semiconductor nanomaterials. This revie...

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Veröffentlicht in:	Advanced functional materials 2025-01, Vol.35 (1), p.n/a
Hauptverfasser:	Zhao, Peili, Cheng, Yongfa, Li, Lei, Jia, Shuangfeng, Guan, Xiaoxi, Huang, Tianlong, Li, Luying, Zheng, He, Wang, Jianbo
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic structure Chemical composition Chemical properties Composition effects Electric fields Electron beams Electron irradiation Electronic structure Nanoelectromechanical systems Nanomaterials off‐axis electron holography semiconductor nanomaterials Semiconductors structure/property Transmission electron microscopy
Online-Zugang:	Volltext
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