Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy

Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using...

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Veröffentlicht in:	arXiv.org 2024-11
Hauptverfasser:	Khajavi, Soheil, Eghrari, Ali, Shaterzadeh-Yazdi, Zahra, Neshat, Mohammad
Format:	Artikel
Sprache:	eng
Schlagworte:	Fourier transforms Inverse method Near fields Optical microscopy Scattering Spatial resolution Spectroscopic analysis
Online-Zugang:	Volltext
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