Offset compensation for differential charge‐based capacitance measurement
Summary This paper presents a fully integrated differential charge‐based capacitance measurement (CBCM) circuit designed to detect attoFarads capacitive variations to find airborne particulate matter (PM). This paper presents a novel method for compensating the output offset of the CBCM electronic f...
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| Veröffentlicht in: | International journal of circuit theory and applications 2024-12, Vol.52 (12), p.5961-5971 |
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| Sprache: | eng |
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| container_end_page | 5971 |
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| container_issue | 12 |
| container_start_page | 5961 |
| container_title | International journal of circuit theory and applications |
| container_volume | 52 |
| creator | Cascone, Nicolò Cassalini, Mirko Ferlito, Umberto Grasso, Alfio Dario Bruno, Giuseppe |
| description | Summary
This paper presents a fully integrated differential charge‐based capacitance measurement (CBCM) circuit designed to detect attoFarads capacitive variations to find airborne particulate matter (PM). This paper presents a novel method for compensating the output offset of the CBCM electronic front‐end in the range of 3.1–3.4 V through the trimming of the bulk voltage of key transistors of the circuit topology. Experimental results on prototypes implemented using a 130‐nm CMOS technology and driven by a 100‐MHz clock confirm the validity of the proposed approach.
The paper discusses a novel offset compensation technique for the Charge‐Based Capacitive Measurement (CBCM) method. The proposed solution involves adjusting the threshold voltage of PMOS transistors to correct mismatches, enhancing circuit performance without additional hardware. |
| doi_str_mv | 10.1002/cta.4114 |
| format | Article |
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This paper presents a fully integrated differential charge‐based capacitance measurement (CBCM) circuit designed to detect attoFarads capacitive variations to find airborne particulate matter (PM). This paper presents a novel method for compensating the output offset of the CBCM electronic front‐end in the range of 3.1–3.4 V through the trimming of the bulk voltage of key transistors of the circuit topology. Experimental results on prototypes implemented using a 130‐nm CMOS technology and driven by a 100‐MHz clock confirm the validity of the proposed approach.
The paper discusses a novel offset compensation technique for the Charge‐Based Capacitive Measurement (CBCM) method. The proposed solution involves adjusting the threshold voltage of PMOS transistors to correct mismatches, enhancing circuit performance without additional hardware.</description><identifier>ISSN: 0098-9886</identifier><identifier>EISSN: 1097-007X</identifier><identifier>DOI: 10.1002/cta.4114</identifier><language>eng</language><publisher>Bognor Regis: Wiley Subscription Services, Inc</publisher><subject>Capacitance ; capacitance measurement ; capacitive sensors ; CBCM ; charge‐based capacitance measurement ; mismatch compensation ; Particulate emissions ; Topology</subject><ispartof>International journal of circuit theory and applications, 2024-12, Vol.52 (12), p.5961-5971</ispartof><rights>2024 John Wiley & Sons Ltd.</rights><rights>2024 John Wiley & Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2544-a20b3992745e98a10e43d778c5b32cce37a165ae9c83b12bc2136b70a511d7a23</cites><orcidid>0009-0000-5902-8604</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fcta.4114$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fcta.4114$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45550,45551</link.rule.ids></links><search><creatorcontrib>Cascone, Nicolò</creatorcontrib><creatorcontrib>Cassalini, Mirko</creatorcontrib><creatorcontrib>Ferlito, Umberto</creatorcontrib><creatorcontrib>Grasso, Alfio Dario</creatorcontrib><creatorcontrib>Bruno, Giuseppe</creatorcontrib><title>Offset compensation for differential charge‐based capacitance measurement</title><title>International journal of circuit theory and applications</title><description>Summary
This paper presents a fully integrated differential charge‐based capacitance measurement (CBCM) circuit designed to detect attoFarads capacitive variations to find airborne particulate matter (PM). This paper presents a novel method for compensating the output offset of the CBCM electronic front‐end in the range of 3.1–3.4 V through the trimming of the bulk voltage of key transistors of the circuit topology. Experimental results on prototypes implemented using a 130‐nm CMOS technology and driven by a 100‐MHz clock confirm the validity of the proposed approach.
The paper discusses a novel offset compensation technique for the Charge‐Based Capacitive Measurement (CBCM) method. The proposed solution involves adjusting the threshold voltage of PMOS transistors to correct mismatches, enhancing circuit performance without additional hardware.</description><subject>Capacitance</subject><subject>capacitance measurement</subject><subject>capacitive sensors</subject><subject>CBCM</subject><subject>charge‐based capacitance measurement</subject><subject>mismatch compensation</subject><subject>Particulate emissions</subject><subject>Topology</subject><issn>0098-9886</issn><issn>1097-007X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp10MtKw0AUxvFBFKxV8BECbtyknrmkM7MsxRsWuqngbjiZnGhKc3EmRbrzEXxGn8TUunV1Nj_OB3_GLjlMOIC48T1OFOfqiI04WJ0C6JdjNgKwJrXGTE_ZWYxrADBC2hF7WpZlpD7xbd1RE7Gv2iYp25AUVVlSoKavcJP4Nwyv9P35lWOkIvHYoa96bDwlNWHcBqoHec5OStxEuvi7Y_Z8d7uaP6SL5f3jfLZIvciUSlFALq0VWmVkDXIgJQutjc9yKbwnqZFPMyTrjcy5yL3gcpprwIzzQqOQY3Z1-NuF9n1LsXfrdhuaYdJJLowSimszqOuD8qGNMVDpulDVGHaOg9unckMqt0810PRAP6oN7f51br6a_fof2SFq2Q</recordid><startdate>202412</startdate><enddate>202412</enddate><creator>Cascone, Nicolò</creator><creator>Cassalini, Mirko</creator><creator>Ferlito, Umberto</creator><creator>Grasso, Alfio Dario</creator><creator>Bruno, Giuseppe</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0009-0000-5902-8604</orcidid></search><sort><creationdate>202412</creationdate><title>Offset compensation for differential charge‐based capacitance measurement</title><author>Cascone, Nicolò ; Cassalini, Mirko ; Ferlito, Umberto ; Grasso, Alfio Dario ; Bruno, Giuseppe</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2544-a20b3992745e98a10e43d778c5b32cce37a165ae9c83b12bc2136b70a511d7a23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Capacitance</topic><topic>capacitance measurement</topic><topic>capacitive sensors</topic><topic>CBCM</topic><topic>charge‐based capacitance measurement</topic><topic>mismatch compensation</topic><topic>Particulate emissions</topic><topic>Topology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cascone, Nicolò</creatorcontrib><creatorcontrib>Cassalini, Mirko</creatorcontrib><creatorcontrib>Ferlito, Umberto</creatorcontrib><creatorcontrib>Grasso, Alfio Dario</creatorcontrib><creatorcontrib>Bruno, Giuseppe</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>International journal of circuit theory and applications</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cascone, Nicolò</au><au>Cassalini, Mirko</au><au>Ferlito, Umberto</au><au>Grasso, Alfio Dario</au><au>Bruno, Giuseppe</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Offset compensation for differential charge‐based capacitance measurement</atitle><jtitle>International journal of circuit theory and applications</jtitle><date>2024-12</date><risdate>2024</risdate><volume>52</volume><issue>12</issue><spage>5961</spage><epage>5971</epage><pages>5961-5971</pages><issn>0098-9886</issn><eissn>1097-007X</eissn><abstract>Summary
This paper presents a fully integrated differential charge‐based capacitance measurement (CBCM) circuit designed to detect attoFarads capacitive variations to find airborne particulate matter (PM). This paper presents a novel method for compensating the output offset of the CBCM electronic front‐end in the range of 3.1–3.4 V through the trimming of the bulk voltage of key transistors of the circuit topology. Experimental results on prototypes implemented using a 130‐nm CMOS technology and driven by a 100‐MHz clock confirm the validity of the proposed approach.
The paper discusses a novel offset compensation technique for the Charge‐Based Capacitive Measurement (CBCM) method. The proposed solution involves adjusting the threshold voltage of PMOS transistors to correct mismatches, enhancing circuit performance without additional hardware.</abstract><cop>Bognor Regis</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/cta.4114</doi><tpages>11</tpages><orcidid>https://orcid.org/0009-0000-5902-8604</orcidid></addata></record> |
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| ispartof | International journal of circuit theory and applications, 2024-12, Vol.52 (12), p.5961-5971 |
| issn | 0098-9886 1097-007X |
| language | eng |
| recordid | cdi_proquest_journals_3128424178 |
| source | Wiley Online Library Journals Frontfile Complete |
| subjects | Capacitance capacitance measurement capacitive sensors CBCM charge‐based capacitance measurement mismatch compensation Particulate emissions Topology |
| title | Offset compensation for differential charge‐based capacitance measurement |
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