$Refractive Index Resolved Imaging Enabled by Terahertz Time-Domain Spectroscopy Ellipsometry$

Refractive Index Resolved Imaging Enabled by Terahertz Time-Domain Spectroscopy Ellipsometry

Material characterization in the terahertz range is an interesting topic of research due to its great applications in material science, health monitoring, and security applications. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power...

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Veröffentlicht in:	Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2024-12, Vol.45 (11-12), p.984-998
Hauptverfasser:	Alibeigloo, Pooya, Kubiczek, Tobias, Aqlan, Basem, Damyanov, Dilyan, Schultze, Thorsten, Weimann, Nils, Balzer, Jan C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bandwidths Classical Electrodynamics Data acquisition Electric fields Electrical Engineering Electronics and Microelectronics Electrons Ellipsometry Engineering Frequency ranges Geometry Image quality Image transmission Instrumentation Measurement techniques Radiation Refractivity Signal generation Signal to noise ratio Spectroscopy Spectrum analysis Terahertz frequencies Time domain analysis
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