Polycrystalline T- and H-Nb2O5 Thin Films Prepared by Pulsed Laser Deposition: Impact of Laser Fluence

Polycrystalline structures of T-Nb 2 O 5 and a remarkable H-Nb 2 O 5 structure were successfully obtained in this work. This was achieved using a Nd:YAG laser in a pulsed laser deposition system at laser fluence values of 9.3, 13.4, 16.2, 21, and 25.2 J cm −2 . Raman bands of the prepared films are...

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Veröffentlicht in:	Journal of electronic materials 2024-10, Vol.53 (10), p.6482-6497
Hauptverfasser:	Salim, Evan T., Shafeeq, Suhair R., AbdulRazzaq, Mohammed Jalal, Fakhri, Makram A., Azzahrani, Ahmad S., Basem, Ali, Alsultany, Forat H., Gopinath, Subash C. B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Ablation Banded structure Characterization and Evaluation of Materials Chemistry and Materials Science Electronics and Microelectronics Energy Energy gap Engineering Fluence Instrumentation Lasers Materials Science Neodymium lasers Niobium oxides Optical and Electronic Materials Original Research Article Photoluminescence Polycrystals Pulsed laser deposition Pulsed lasers Roughness Scanning electron microscopy Semiconductor lasers Sensors Solid State Physics Spectrum analysis Stoichiometry Thin films YAG lasers
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