Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites
Thin films of cadmium oxide (CdO), cobalt oxide (Co 3 O 4 ), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron mic...
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| creator | Neffah, A. Tabet-Derraz, H. Benali, M. A. Boureguig, K. M. E. Belmehdi, M. Z. Saci, H. |
| description | Thin films of cadmium oxide (CdO), cobalt oxide (Co
3
O
4
), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co
3
O
4
, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co
3
O
4
, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co
3
O
4
into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)
x
(Co
3
O
4
)
1-x
with varying compositions (
x
= 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied. |
| doi_str_mv | 10.1007/s10854-024-13392-9 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3099205963</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3099205963</sourcerecordid><originalsourceid>FETCH-LOGICAL-c200t-80d2a5fef76477bbdfb15110eb192f309a774ca59aaede476948f5011edc0af3</originalsourceid><addsrcrecordid>eNp9kc9u1DAQxi1EJZbCC3CyxJW043_rmBta0VKp0l564GZ5k_HWVRIH26nE6_CkdQiIG6eZkb7fN5r5CPnA4IoB6OvMoFWyAS4bJoThjXlFdkxp0ciWf39NdmCUbqTi_A15m_MTAOylaHfk1930jLmEsyshTjR6Wh6R5pKWrizJDZ_oGNP8GId4Dt06xrlsjZt6igN2Ja0znVOcMZWAeTMJE_VhGPNn6uZ5qJK__uh9hcIz0hH7sIzrwphWrkR66I_XhyiOknZxnGMOBfM7cuHdkPH9n3pJHm6-Phy-NffH27vDl_um4wClaaHnTnn0ei-1Pp16f2KKMcATM9wLME5r2TllnMMepd4b2XoFjGHfgfPiknzcbOslP5b6E_sUlzTVjbbChoMye1FVfFN1Keac0Ns5hdGln5aBXaOwWxS2RmF_R2FNhcQG5Sqezpj-Wf-HegHFjJAJ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3099205963</pqid></control><display><type>article</type><title>Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites</title><source>Springer Nature - Complete Springer Journals</source><creator>Neffah, A. ; Tabet-Derraz, H. ; Benali, M. A. ; Boureguig, K. M. E. ; Belmehdi, M. Z. ; Saci, H.</creator><creatorcontrib>Neffah, A. ; Tabet-Derraz, H. ; Benali, M. A. ; Boureguig, K. M. E. ; Belmehdi, M. Z. ; Saci, H.</creatorcontrib><description>Thin films of cadmium oxide (CdO), cobalt oxide (Co
3
O
4
), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co
3
O
4
, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co
3
O
4
, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co
3
O
4
into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)
x
(Co
3
O
4
)
1-x
with varying compositions (
x
= 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-13392-9</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Cadmium ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Cobalt oxides ; Composite materials ; Dielectric properties ; Effective medium theory ; Electrical properties ; Electromagnetism ; Electron microscopes ; Energy dispersive X ray spectroscopy ; Glass substrates ; Hall effect ; Materials Science ; Nanomaterials ; Optical and Electronic Materials ; Optical properties ; Optoelectronic devices ; Photovoltaic cells ; Solar cells ; Spectrum analysis ; Spray pyrolysis ; Thin films ; X-ray diffraction</subject><ispartof>Journal of materials science. Materials in electronics, 2024-09, Vol.35 (25), p.1666, Article 1666</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c200t-80d2a5fef76477bbdfb15110eb192f309a774ca59aaede476948f5011edc0af3</cites><orcidid>0000-0002-7271-4462</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-13392-9$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-13392-9$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Neffah, A.</creatorcontrib><creatorcontrib>Tabet-Derraz, H.</creatorcontrib><creatorcontrib>Benali, M. A.</creatorcontrib><creatorcontrib>Boureguig, K. M. E.</creatorcontrib><creatorcontrib>Belmehdi, M. Z.</creatorcontrib><creatorcontrib>Saci, H.</creatorcontrib><title>Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>Thin films of cadmium oxide (CdO), cobalt oxide (Co
3
O
4
), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co
3
O
4
, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co
3
O
4
, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co
3
O
4
into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)
x
(Co
3
O
4
)
1-x
with varying compositions (
x
= 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.</description><subject>Cadmium</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Cobalt oxides</subject><subject>Composite materials</subject><subject>Dielectric properties</subject><subject>Effective medium theory</subject><subject>Electrical properties</subject><subject>Electromagnetism</subject><subject>Electron microscopes</subject><subject>Energy dispersive X ray spectroscopy</subject><subject>Glass substrates</subject><subject>Hall effect</subject><subject>Materials Science</subject><subject>Nanomaterials</subject><subject>Optical and Electronic Materials</subject><subject>Optical properties</subject><subject>Optoelectronic devices</subject><subject>Photovoltaic cells</subject><subject>Solar cells</subject><subject>Spectrum analysis</subject><subject>Spray pyrolysis</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kc9u1DAQxi1EJZbCC3CyxJW043_rmBta0VKp0l564GZ5k_HWVRIH26nE6_CkdQiIG6eZkb7fN5r5CPnA4IoB6OvMoFWyAS4bJoThjXlFdkxp0ciWf39NdmCUbqTi_A15m_MTAOylaHfk1930jLmEsyshTjR6Wh6R5pKWrizJDZ_oGNP8GId4Dt06xrlsjZt6igN2Ja0znVOcMZWAeTMJE_VhGPNn6uZ5qJK__uh9hcIz0hH7sIzrwphWrkR66I_XhyiOknZxnGMOBfM7cuHdkPH9n3pJHm6-Phy-NffH27vDl_um4wClaaHnTnn0ei-1Pp16f2KKMcATM9wLME5r2TllnMMepd4b2XoFjGHfgfPiknzcbOslP5b6E_sUlzTVjbbChoMye1FVfFN1Keac0Ns5hdGln5aBXaOwWxS2RmF_R2FNhcQG5Sqezpj-Wf-HegHFjJAJ</recordid><startdate>20240901</startdate><enddate>20240901</enddate><creator>Neffah, A.</creator><creator>Tabet-Derraz, H.</creator><creator>Benali, M. A.</creator><creator>Boureguig, K. M. E.</creator><creator>Belmehdi, M. Z.</creator><creator>Saci, H.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-7271-4462</orcidid></search><sort><creationdate>20240901</creationdate><title>Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites</title><author>Neffah, A. ; Tabet-Derraz, H. ; Benali, M. A. ; Boureguig, K. M. E. ; Belmehdi, M. Z. ; Saci, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c200t-80d2a5fef76477bbdfb15110eb192f309a774ca59aaede476948f5011edc0af3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Cadmium</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Cobalt oxides</topic><topic>Composite materials</topic><topic>Dielectric properties</topic><topic>Effective medium theory</topic><topic>Electrical properties</topic><topic>Electromagnetism</topic><topic>Electron microscopes</topic><topic>Energy dispersive X ray spectroscopy</topic><topic>Glass substrates</topic><topic>Hall effect</topic><topic>Materials Science</topic><topic>Nanomaterials</topic><topic>Optical and Electronic Materials</topic><topic>Optical properties</topic><topic>Optoelectronic devices</topic><topic>Photovoltaic cells</topic><topic>Solar cells</topic><topic>Spectrum analysis</topic><topic>Spray pyrolysis</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Neffah, A.</creatorcontrib><creatorcontrib>Tabet-Derraz, H.</creatorcontrib><creatorcontrib>Benali, M. A.</creatorcontrib><creatorcontrib>Boureguig, K. M. E.</creatorcontrib><creatorcontrib>Belmehdi, M. Z.</creatorcontrib><creatorcontrib>Saci, H.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Neffah, A.</au><au>Tabet-Derraz, H.</au><au>Benali, M. A.</au><au>Boureguig, K. M. E.</au><au>Belmehdi, M. Z.</au><au>Saci, H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-09-01</date><risdate>2024</risdate><volume>35</volume><issue>25</issue><spage>1666</spage><pages>1666-</pages><artnum>1666</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>Thin films of cadmium oxide (CdO), cobalt oxide (Co
3
O
4
), and their composites were deposited on glass substrates at 360 ℃ using the spray pyrolysis method. The films underwent characterization through various techniques, including energy-dispersive X-ray spectroscopy (EDX), scanning electron microscope (SEM), X-ray diffraction (XRD), and ultraviolet–visible spectroscopy (UV–Vis). Hall Effect measurements were also conducted to assess the structural, optical, and electrical properties. The XRD analysis revealed crystalline structures with cubic symmetry for both CdO and Co
3
O
4
, and the Scherrer equation confirmed their nanomaterial nature. EDX results identified the distinct proportions of oxygen, cadmium, and cobalt in the films. On the other hand, the optical band gaps determined via Tauc plots indicated values of Eg1 = 1.54 eV and Eg2 = 2.01 eV for Co
3
O
4
, and Eg3 = 2.4 eV for CdO. As for the Hall Effect measurements, they were performed to determine a number of electrical parameters. The results showed that the addition of Co
3
O
4
into CdO increased the sheet resistance of the composite. This research has potential applications in various areas, including the design of solar cells (photovoltaic devices) and the creation of new light-based devices (optoelectronic devices). Additionally, the dielectric functions of composites (CdO)
x
(Co
3
O
4
)
1-x
with varying compositions (
x
= 0.7, 0.5, and 0.3) were evaluated. The dielectric properties were experimentally measured from 350 to 2500 nm, and theoretical calculations were performed using mixing equations like Looyenga, Kim, and Bruggman, with the Looyenga model accurately depicting the dielectric properties of the materials studied.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-13392-9</doi><orcidid>https://orcid.org/0000-0002-7271-4462</orcidid></addata></record> |
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| ispartof | Journal of materials science. Materials in electronics, 2024-09, Vol.35 (25), p.1666, Article 1666 |
| issn | 0957-4522 1573-482X |
| language | eng |
| recordid | cdi_proquest_journals_3099205963 |
| source | Springer Nature - Complete Springer Journals |
| subjects | Cadmium Characterization and Evaluation of Materials Chemistry and Materials Science Cobalt oxides Composite materials Dielectric properties Effective medium theory Electrical properties Electromagnetism Electron microscopes Energy dispersive X ray spectroscopy Glass substrates Hall effect Materials Science Nanomaterials Optical and Electronic Materials Optical properties Optoelectronic devices Photovoltaic cells Solar cells Spectrum analysis Spray pyrolysis Thin films X-ray diffraction |
| title | Investigation of the structural, morphological, optical, and electrical properties of thin films: application of effective medium theories to CdO/Co3O4 composites |
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