Synthetic reliability assessment for non-electric stimulus transfer system
The Non-electric stimulus transfer system (NSTS) is a sensitivity product known for its high reliability. To enhance the accuracy of reliability assessment for NSTS, this study investigates the relationship between NSTS and initiating devices, and proposes a synthetic reliability assessment method....
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| Veröffentlicht in: | Journal of physics. Conference series 2024-08, Vol.2820 (1), p.012108 |
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| container_title | Journal of physics. Conference series |
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| creator | Ma, Xiaodong Sun, Liang Gu, Changchao Gao, Fei Hong, Dongpao |
| description | The Non-electric stimulus transfer system (NSTS) is a sensitivity product known for its high reliability. To enhance the accuracy of reliability assessment for NSTS, this study investigates the relationship between NSTS and initiating devices, and proposes a synthetic reliability assessment method. By considering the working principle and failure logic of typical NSTS, function-shared units are introduced to enhance the reliability model of NSTS. Subsequently, the reliability of NSTS is approximated by using the normal distribution, incorporating the reliability evaluation of initiating devices and the test data of NSTS to derive an approximated confidence interval. The analysis of a practical case demonstrates that this synthetic reliability assessment method is well-suited for engineering applications. |
| doi_str_mv | 10.1088/1742-6596/2820/1/012108 |
| format | Article |
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| subjects | Approximation Electrical stimuli Normal distribution Reliability analysis Statistical analysis |
| title | Synthetic reliability assessment for non-electric stimulus transfer system |
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