TID Level of Failure Dependence From Operating Configuration of the System-Space Class DC/DC Converter Case Study

We present and analyze system-level total ionizing dose (TID) tests of the simple analog system, point-of-load (PoL) dc/dc converter from 3D Plus, which was already qualified up to 50 krad(SiO2) based on component-level tests. TID response varied with the radiation facility for several parts; howeve...

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Veröffentlicht in:	IEEE transactions on nuclear science 2024-08, Vol.71 (8), p.1956-1962
Hauptverfasser:	Rajkowski, Tomasz, Boch, Jerome, Saigne, Frederic, Wang, Pierre-Xiao, Wronka, Slawomir, Matusiak, Michal, Wasilewski, Adam
Format:	Artikel
Sprache:	eng
Schlagworte:	Cobalt-60 Configurations Degradation Electric converters Failure linear accelerators Linear particle accelerator Photonics Qualifications radiation hardness assurance (RHA) safe operating area (SOA) Silicon dioxide system-level testing Testing total ionizing dose (TID) Voltage Voltage converters (DC to DC) X-rays
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