TID Level of Failure Dependence From Operating Configuration of the System-Space Class DC/DC Converter Case Study
We present and analyze system-level total ionizing dose (TID) tests of the simple analog system, point-of-load (PoL) dc/dc converter from 3D Plus, which was already qualified up to 50 krad(SiO2) based on component-level tests. TID response varied with the radiation facility for several parts; howeve...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2024-08, Vol.71 (8), p.1956-1962 |
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| container_end_page | 1962 |
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| container_issue | 8 |
| container_start_page | 1956 |
| container_title | IEEE transactions on nuclear science |
| container_volume | 71 |
| creator | Rajkowski, Tomasz Boch, Jerome Saigne, Frederic Wang, Pierre-Xiao Wronka, Slawomir Matusiak, Michal Wasilewski, Adam |
| description | We present and analyze system-level total ionizing dose (TID) tests of the simple analog system, point-of-load (PoL) dc/dc converter from 3D Plus, which was already qualified up to 50 krad(SiO2) based on component-level tests. TID response varied with the radiation facility for several parts; however, extensive testing with one part has shown significant differences in the TID level of functional failure observed for different operation modes (configurations): depending on the operating configuration of the device, the observed TID level of failure varies from about 60 krad(SiO2) to more than 400 krad(SiO2). These differences are depicted with the use of the safe operating area (SOA) plot for the system, which incorporates main system functional parameters. We also explore the potential utilization of the SOA concept in defining the system's TID performance, employing a range of TID thresholds rather than relying on a singular value. |
| doi_str_mv | 10.1109/TNS.2024.3431281 |
| format | Article |
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TID response varied with the radiation facility for several parts; however, extensive testing with one part has shown significant differences in the TID level of functional failure observed for different operation modes (configurations): depending on the operating configuration of the device, the observed TID level of failure varies from about 60 krad(SiO2) to more than 400 krad(SiO2). These differences are depicted with the use of the safe operating area (SOA) plot for the system, which incorporates main system functional parameters. 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TID response varied with the radiation facility for several parts; however, extensive testing with one part has shown significant differences in the TID level of functional failure observed for different operation modes (configurations): depending on the operating configuration of the device, the observed TID level of failure varies from about 60 krad(SiO2) to more than 400 krad(SiO2). These differences are depicted with the use of the safe operating area (SOA) plot for the system, which incorporates main system functional parameters. 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| subjects | Cobalt-60 Configurations Degradation Electric converters Failure linear accelerators Linear particle accelerator Photonics Qualifications radiation hardness assurance (RHA) safe operating area (SOA) Silicon dioxide system-level testing Testing total ionizing dose (TID) Voltage Voltage converters (DC to DC) X-rays |
| title | TID Level of Failure Dependence From Operating Configuration of the System-Space Class DC/DC Converter Case Study |
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