Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing

Very-high-energy (VHE), heavy ions are of particular interest for single event effects (SEEs) testing due to their combination of high linear energy transfer (LET) and high penetration within electronics components. The dosimetry of such beams poses an important challenge for facilities aiming to pr...

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Veröffentlicht in:IEEE transactions on nuclear science 2024-08, Vol.71 (8), p.1837-1845
Hauptverfasser: Waets, Andreas, Bilko, Kacper, Coronetti, Andrea, Emriskova, Natalia, Barbero, Mario Sacristan, Alia, Ruben Garcia, Durante, Marco, Schuy, Christoph, Wagner, Tim, Esposito, Luigi Salvatore, Nieminen, Petteri, Schneider, Uwe
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Sprache:eng
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