EFTNet: an efficient fine-tuning method for few-shot segmentation
Few-shot segmentation (FSS) aims to segment novel classes given a small number of labeled samples. Most of the existing studies do not fine-tune the model during meta-testing, thus biasing the model towards the base classes and preventing the prediction of novel classes. Other studies only use suppo...
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Veröffentlicht in: | Applied intelligence (Dordrecht, Netherlands) Netherlands), 2024-10, Vol.54 (19), p.9488-9507 |
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creator | Li, Jiaguang Wang, Yubo Gao, Zihan Wei, Ying |
description | Few-shot segmentation (FSS) aims to segment novel classes given a small number of labeled samples. Most of the existing studies do not fine-tune the model during meta-testing, thus biasing the model towards the base classes and preventing the prediction of novel classes. Other studies only use support images for fine-tuning, which biases the model towards the support images rather than the target query images, especially when there is a large difference between the support and the query images. To alleviate these issues, we propose an
e
̲
fficient
f
̲
ine-
t
̲
uning network (EFTNet) that uses unlabeled query images and predicted pseudo labels to fine-tune the trained model parameters during meta-testing, which can bias the model towards the target query images. In addition, we design a query-to-support module, a support-to-query module, and a discrimination module to evaluate which fine-tuning round the model achieves optimal results. Moreover, the query-to-support module also takes the query images and their pseudo masks as part of the support images and support masks, which causes the prototypes to contain query information and tend to obtain better predictions. As a new meta-testing scheme, our EFTNet can be easily combined with existing studies and greatly improve their model performance without repeating the meta-training phase. Many experiments on PASCAL-
5
i
and COCO-
20
i
prove the effectiveness of our EFTNet. The EFTNet also achieves new state-of-the-art performance. Codes are available at
https://github.com/Jiaguang-NEU/EFTNet
. |
doi_str_mv | 10.1007/s10489-024-05582-z |
format | Article |
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e
̲
fficient
f
̲
ine-
t
̲
uning network (EFTNet) that uses unlabeled query images and predicted pseudo labels to fine-tune the trained model parameters during meta-testing, which can bias the model towards the target query images. In addition, we design a query-to-support module, a support-to-query module, and a discrimination module to evaluate which fine-tuning round the model achieves optimal results. Moreover, the query-to-support module also takes the query images and their pseudo masks as part of the support images and support masks, which causes the prototypes to contain query information and tend to obtain better predictions. As a new meta-testing scheme, our EFTNet can be easily combined with existing studies and greatly improve their model performance without repeating the meta-training phase. Many experiments on PASCAL-
5
i
and COCO-
20
i
prove the effectiveness of our EFTNet. The EFTNet also achieves new state-of-the-art performance. Codes are available at
https://github.com/Jiaguang-NEU/EFTNet
.</description><identifier>ISSN: 0924-669X</identifier><identifier>EISSN: 1573-7497</identifier><identifier>DOI: 10.1007/s10489-024-05582-z</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Artificial Intelligence ; Bias ; Computer Science ; Computer vision ; Machines ; Manufacturing ; Masks ; Mechanical Engineering ; Modules ; Predictions ; Processes ; Queries ; Semantics</subject><ispartof>Applied intelligence (Dordrecht, Netherlands), 2024-10, Vol.54 (19), p.9488-9507</ispartof><rights>The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c200t-502edce907b81957b5593a26bcfeb1329ee5e1736c17dbefb661272f981126863</cites><orcidid>0000-0003-0915-5378</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10489-024-05582-z$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10489-024-05582-z$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Li, Jiaguang</creatorcontrib><creatorcontrib>Wang, Yubo</creatorcontrib><creatorcontrib>Gao, Zihan</creatorcontrib><creatorcontrib>Wei, Ying</creatorcontrib><title>EFTNet: an efficient fine-tuning method for few-shot segmentation</title><title>Applied intelligence (Dordrecht, Netherlands)</title><addtitle>Appl Intell</addtitle><description>Few-shot segmentation (FSS) aims to segment novel classes given a small number of labeled samples. Most of the existing studies do not fine-tune the model during meta-testing, thus biasing the model towards the base classes and preventing the prediction of novel classes. Other studies only use support images for fine-tuning, which biases the model towards the support images rather than the target query images, especially when there is a large difference between the support and the query images. To alleviate these issues, we propose an
e
̲
fficient
f
̲
ine-
t
̲
uning network (EFTNet) that uses unlabeled query images and predicted pseudo labels to fine-tune the trained model parameters during meta-testing, which can bias the model towards the target query images. In addition, we design a query-to-support module, a support-to-query module, and a discrimination module to evaluate which fine-tuning round the model achieves optimal results. Moreover, the query-to-support module also takes the query images and their pseudo masks as part of the support images and support masks, which causes the prototypes to contain query information and tend to obtain better predictions. As a new meta-testing scheme, our EFTNet can be easily combined with existing studies and greatly improve their model performance without repeating the meta-training phase. Many experiments on PASCAL-
5
i
and COCO-
20
i
prove the effectiveness of our EFTNet. The EFTNet also achieves new state-of-the-art performance. Codes are available at
https://github.com/Jiaguang-NEU/EFTNet
.</description><subject>Artificial Intelligence</subject><subject>Bias</subject><subject>Computer Science</subject><subject>Computer vision</subject><subject>Machines</subject><subject>Manufacturing</subject><subject>Masks</subject><subject>Mechanical Engineering</subject><subject>Modules</subject><subject>Predictions</subject><subject>Processes</subject><subject>Queries</subject><subject>Semantics</subject><issn>0924-669X</issn><issn>1573-7497</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kMFKAzEQhoMoWKsv4GnBc3SSbJKNt1JaFUQvFbyF3e2k3WKzNUkR-_RGV_Amc5jDfP8_8BFyyeCaAeibyKCsDAVeUpCy4vRwREZMakF1afQxGYHJJ6XM6yk5i3EDAEIAG5HJbL54wnRb1L5A57q2Q58K13mkae87vyq2mNb9snB9KBx-0LjuUxFxtc1cnbren5MTV79FvPjdY_Iyny2m9_Tx-e5hOnmkLQdIVALHZYsGdFMxI3UjpRE1V03rsGGCG0SJTAvVMr1s0DVKMa65MxVjXFVKjMnV0LsL_fseY7Kbfh98fmkFGCFYmSdTfKDa0McY0Nld6LZ1-LQM7LcqO6iyWZX9UWUPOSSGUMywX2H4q_4n9QUwRWuN</recordid><startdate>20241001</startdate><enddate>20241001</enddate><creator>Li, Jiaguang</creator><creator>Wang, Yubo</creator><creator>Gao, Zihan</creator><creator>Wei, Ying</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><orcidid>https://orcid.org/0000-0003-0915-5378</orcidid></search><sort><creationdate>20241001</creationdate><title>EFTNet: an efficient fine-tuning method for few-shot segmentation</title><author>Li, Jiaguang ; Wang, Yubo ; Gao, Zihan ; Wei, Ying</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c200t-502edce907b81957b5593a26bcfeb1329ee5e1736c17dbefb661272f981126863</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Artificial Intelligence</topic><topic>Bias</topic><topic>Computer Science</topic><topic>Computer vision</topic><topic>Machines</topic><topic>Manufacturing</topic><topic>Masks</topic><topic>Mechanical Engineering</topic><topic>Modules</topic><topic>Predictions</topic><topic>Processes</topic><topic>Queries</topic><topic>Semantics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Li, Jiaguang</creatorcontrib><creatorcontrib>Wang, Yubo</creatorcontrib><creatorcontrib>Gao, Zihan</creatorcontrib><creatorcontrib>Wei, Ying</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>Applied intelligence (Dordrecht, Netherlands)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Jiaguang</au><au>Wang, Yubo</au><au>Gao, Zihan</au><au>Wei, Ying</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>EFTNet: an efficient fine-tuning method for few-shot segmentation</atitle><jtitle>Applied intelligence (Dordrecht, Netherlands)</jtitle><stitle>Appl Intell</stitle><date>2024-10-01</date><risdate>2024</risdate><volume>54</volume><issue>19</issue><spage>9488</spage><epage>9507</epage><pages>9488-9507</pages><issn>0924-669X</issn><eissn>1573-7497</eissn><abstract>Few-shot segmentation (FSS) aims to segment novel classes given a small number of labeled samples. Most of the existing studies do not fine-tune the model during meta-testing, thus biasing the model towards the base classes and preventing the prediction of novel classes. Other studies only use support images for fine-tuning, which biases the model towards the support images rather than the target query images, especially when there is a large difference between the support and the query images. To alleviate these issues, we propose an
e
̲
fficient
f
̲
ine-
t
̲
uning network (EFTNet) that uses unlabeled query images and predicted pseudo labels to fine-tune the trained model parameters during meta-testing, which can bias the model towards the target query images. In addition, we design a query-to-support module, a support-to-query module, and a discrimination module to evaluate which fine-tuning round the model achieves optimal results. Moreover, the query-to-support module also takes the query images and their pseudo masks as part of the support images and support masks, which causes the prototypes to contain query information and tend to obtain better predictions. As a new meta-testing scheme, our EFTNet can be easily combined with existing studies and greatly improve their model performance without repeating the meta-training phase. Many experiments on PASCAL-
5
i
and COCO-
20
i
prove the effectiveness of our EFTNet. The EFTNet also achieves new state-of-the-art performance. Codes are available at
https://github.com/Jiaguang-NEU/EFTNet
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subjects | Artificial Intelligence Bias Computer Science Computer vision Machines Manufacturing Masks Mechanical Engineering Modules Predictions Processes Queries Semantics |
title | EFTNet: an efficient fine-tuning method for few-shot segmentation |
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