Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities
Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously fr...
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| Veröffentlicht in: | Journal of polymer science (2020) 2024-08, Vol.62 (16), p.3681-3686 |
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| container_title | Journal of polymer science (2020) |
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| creator | Ribbe, Alexander E. |
| description | Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward. |
| doi_str_mv | 10.1002/pol.20230647 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3093112885</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3093112885</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3024-b559d010d50d695c15caa2340cc857436e58729ca388fb5ae447c24bc0f522343</originalsourceid><addsrcrecordid>eNp9kEtLw0AQgIMoWGpv_oAFr02d7CMPb6X4KBTag57DdjNJtiTZuJta8u_dUvXoaR58M8N8QXAfwSICoI-9aRYUKIOYJ1fBhMachjyKs-u_XMBtMHPuAB5nIuYQTwK7bmWlu4r48bFFS3Q3oC2lQkfkQGpd1cSiM81x0KYjJz3UBBtUg_VVq5U1Tpl-fCI7tK73ff2Fc6Jq2TTYVejmRHYFMX1v7HDs9KDR3QU3pWwczn7iNPh4eX5fvYWb7et6tdyEigHl4V6IrIAICgFFnAkVCSUlZRyUSkXCWYwiTWimJEvTci8kcp4oyvcKSkE9x6bBw2Vvb83nEd2QH8zRdv5kziBjUUTTVHhqfqHOrziLZd5b3Uo75hHkZ7G5N5P_ivU4u-An3eD4L5vvtpslg1Rw9g1Ugnw6</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3093112885</pqid></control><display><type>article</type><title>Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities</title><source>Wiley Online Library All Journals</source><creator>Ribbe, Alexander E.</creator><creatorcontrib>Ribbe, Alexander E.</creatorcontrib><description>Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward.</description><identifier>ISSN: 2642-4150</identifier><identifier>EISSN: 2642-4169</identifier><identifier>DOI: 10.1002/pol.20230647</identifier><language>eng</language><publisher>Hoboken, USA: John Wiley & Sons, Inc</publisher><subject>Chemical damage ; Chemical properties ; Electron beams ; electron tomography ; energy‐filtered ; Hard materials ; Image resolution ; polymer morphology ; Polymers ; Thickness ; Transmission electron microscopy ; ultramicrotomy</subject><ispartof>Journal of polymer science (2020), 2024-08, Vol.62 (16), p.3681-3686</ispartof><rights>2023 Wiley Periodicals LLC.</rights><rights>2024 Wiley Periodicals LLC.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c3024-b559d010d50d695c15caa2340cc857436e58729ca388fb5ae447c24bc0f522343</cites><orcidid>0000-0002-9924-3429</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fpol.20230647$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fpol.20230647$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27922,27923,45572,45573</link.rule.ids></links><search><creatorcontrib>Ribbe, Alexander E.</creatorcontrib><title>Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities</title><title>Journal of polymer science (2020)</title><description>Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward.</description><subject>Chemical damage</subject><subject>Chemical properties</subject><subject>Electron beams</subject><subject>electron tomography</subject><subject>energy‐filtered</subject><subject>Hard materials</subject><subject>Image resolution</subject><subject>polymer morphology</subject><subject>Polymers</subject><subject>Thickness</subject><subject>Transmission electron microscopy</subject><subject>ultramicrotomy</subject><issn>2642-4150</issn><issn>2642-4169</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLw0AQgIMoWGpv_oAFr02d7CMPb6X4KBTag57DdjNJtiTZuJta8u_dUvXoaR58M8N8QXAfwSICoI-9aRYUKIOYJ1fBhMachjyKs-u_XMBtMHPuAB5nIuYQTwK7bmWlu4r48bFFS3Q3oC2lQkfkQGpd1cSiM81x0KYjJz3UBBtUg_VVq5U1Tpl-fCI7tK73ff2Fc6Jq2TTYVejmRHYFMX1v7HDs9KDR3QU3pWwczn7iNPh4eX5fvYWb7et6tdyEigHl4V6IrIAICgFFnAkVCSUlZRyUSkXCWYwiTWimJEvTci8kcp4oyvcKSkE9x6bBw2Vvb83nEd2QH8zRdv5kziBjUUTTVHhqfqHOrziLZd5b3Uo75hHkZ7G5N5P_ivU4u-An3eD4L5vvtpslg1Rw9g1Ugnw6</recordid><startdate>20240815</startdate><enddate>20240815</enddate><creator>Ribbe, Alexander E.</creator><general>John Wiley & Sons, Inc</general><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-9924-3429</orcidid></search><sort><creationdate>20240815</creationdate><title>Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities</title><author>Ribbe, Alexander E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3024-b559d010d50d695c15caa2340cc857436e58729ca388fb5ae447c24bc0f522343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Chemical damage</topic><topic>Chemical properties</topic><topic>Electron beams</topic><topic>electron tomography</topic><topic>energy‐filtered</topic><topic>Hard materials</topic><topic>Image resolution</topic><topic>polymer morphology</topic><topic>Polymers</topic><topic>Thickness</topic><topic>Transmission electron microscopy</topic><topic>ultramicrotomy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ribbe, Alexander E.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of polymer science (2020)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ribbe, Alexander E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities</atitle><jtitle>Journal of polymer science (2020)</jtitle><date>2024-08-15</date><risdate>2024</risdate><volume>62</volume><issue>16</issue><spage>3681</spage><epage>3686</epage><pages>3681-3686</pages><issn>2642-4150</issn><eissn>2642-4169</eissn><abstract>Transmission electron microscopy (TEM) has evolved into a powerful characterization tool that allows visualization of materials with finer resolution than any other type of microscope in existence. While numerous areas of the physical and biologically sciences and engineering benefit tremendously from TEM and its analytical features, the highest resolution can only be achieved if a sample fulfills certain requirements, including an optimal thickness as well as a sufficiently long e‐beam stability. At a fundamental level, the physical and chemical properties of organic polymers are generally problematic in conjunction with TEM, as they experience damage from the electron beam more readily than their hard materials counterparts. However, progress in polymer characterization using TEM has evolved considerably and the polymer community stands to benefit greatly from continued growth going forward.</abstract><cop>Hoboken, USA</cop><pub>John Wiley & Sons, Inc</pub><doi>10.1002/pol.20230647</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-9924-3429</orcidid><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| source | Wiley Online Library All Journals |
| subjects | Chemical damage Chemical properties Electron beams electron tomography energy‐filtered Hard materials Image resolution polymer morphology Polymers Thickness Transmission electron microscopy ultramicrotomy |
| title | Imaging polymer interfaces at high resolution with electron microscopy: Perspective, challenges, and opportunities |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T12%3A00%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Imaging%20polymer%20interfaces%20at%20high%20resolution%20with%20electron%20microscopy:%20Perspective,%20challenges,%20and%20opportunities&rft.jtitle=Journal%20of%20polymer%20science%20(2020)&rft.au=Ribbe,%20Alexander%20E.&rft.date=2024-08-15&rft.volume=62&rft.issue=16&rft.spage=3681&rft.epage=3686&rft.pages=3681-3686&rft.issn=2642-4150&rft.eissn=2642-4169&rft_id=info:doi/10.1002/pol.20230647&rft_dat=%3Cproquest_cross%3E3093112885%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3093112885&rft_id=info:pmid/&rfr_iscdi=true |