A frequency mapping method for locating functional units inside ICs based on coaxial microscope
Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visib...
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| Veröffentlicht in: | Electronics Letters 2022-02, Vol.58 (3), p.115-117 |
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| container_end_page | 117 |
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| container_title | Electronics Letters |
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| creator | Liu, Pengcheng Han, Jianwei Ma, Yingqi Zhang, Feng Wu, Zongguo Zhu, Xiang Cui, Yixin |
| description | Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal‐to‐noise ratio, meanwhile, locating areas of the chip with operating currents down to 10−10 A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 × 10−4 A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis. |
| doi_str_mv | 10.1049/ell2.12373 |
| format | Article |
| fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_journals_3092806814</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A744063664</galeid><sourcerecordid>A744063664</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3403-2afc25352b71a04ce2062a8d945e26022ad83d4a64d4d19af6af0bf1a68b3d673</originalsourceid><addsrcrecordid>eNp9kE1r4zAQhsXShU2ze9lfIOit4FRflu1jCP2CQC8t9CYm-sgqOJIrObT59yvXPZc5DDM87_DOi9BfSlaUiO7G9j1bUcYb_gMtKK9J1VH6eoEWhFBe1bQTv9Blzocysq5rFkitsUv27WSDPuMjDIMPe3y0479osIsJ91HDOO3cKejRxwA9PgU_ZuxD9sbix03GO8jW4BiwjvDhC3H0OsWs42B_o58O-mz_fPUlerm7fd48VNun-8fNeltpLgivGDjNal6zXUOBCG0ZkQxa04naMkkYA9NyI0AKIwztwElwZOcoyHbHjWz4El3Nd4cUyzd5VId4SsVtVpx0rCWypaJQq5naQ2-VDy6OCXQpY4vlGKzzZb9uhCCSSzkJrmfB9E9O1qkh-SOks6JETYmrKXH1mXiB6Qy_lyvnb0h1u92yWfMf0N2Cvw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3092806814</pqid></control><display><type>article</type><title>A frequency mapping method for locating functional units inside ICs based on coaxial microscope</title><source>Wiley Journals</source><source>DOAJ Directory of Open Access Journals</source><source>EZB-FREE-00999 freely available EZB journals</source><source>Wiley Online Library (Open Access Collection)</source><source>Alma/SFX Local Collection</source><creator>Liu, Pengcheng ; Han, Jianwei ; Ma, Yingqi ; Zhang, Feng ; Wu, Zongguo ; Zhu, Xiang ; Cui, Yixin</creator><creatorcontrib>Liu, Pengcheng ; Han, Jianwei ; Ma, Yingqi ; Zhang, Feng ; Wu, Zongguo ; Zhu, Xiang ; Cui, Yixin</creatorcontrib><description>Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal‐to‐noise ratio, meanwhile, locating areas of the chip with operating currents down to 10−10 A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 × 10−4 A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis.</description><identifier>ISSN: 0013-5194</identifier><identifier>EISSN: 1350-911X</identifier><identifier>DOI: 10.1049/ell2.12373</identifier><language>eng</language><publisher>Stevenage: John Wiley & Sons, Inc</publisher><subject>Active regions (lasers) ; Cameras ; Emission analysis ; Failure analysis ; Fourier transforms ; Frequency analysis ; Integrated circuits ; Lasers ; Light ; Mapping ; Photonics ; Reverse engineering ; Sensitivity analysis ; Signal quality ; Silicon ; Transistors</subject><ispartof>Electronics Letters, 2022-02, Vol.58 (3), p.115-117</ispartof><rights>2021 The Authors. published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technology</rights><rights>COPYRIGHT 2022 John Wiley & Sons, Inc.</rights><rights>2022. This work is published under http://creativecommons.org/licenses/by-nc-nd/4.0/ (the "License"). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3403-2afc25352b71a04ce2062a8d945e26022ad83d4a64d4d19af6af0bf1a68b3d673</citedby><cites>FETCH-LOGICAL-c3403-2afc25352b71a04ce2062a8d945e26022ad83d4a64d4d19af6af0bf1a68b3d673</cites><orcidid>0000-0002-3343-9429</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1049%2Fell2.12373$$EPDF$$P50$$Gwiley$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1049%2Fell2.12373$$EHTML$$P50$$Gwiley$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,864,1417,11562,27924,27925,45574,45575,46052,46476</link.rule.ids></links><search><creatorcontrib>Liu, Pengcheng</creatorcontrib><creatorcontrib>Han, Jianwei</creatorcontrib><creatorcontrib>Ma, Yingqi</creatorcontrib><creatorcontrib>Zhang, Feng</creatorcontrib><creatorcontrib>Wu, Zongguo</creatorcontrib><creatorcontrib>Zhu, Xiang</creatorcontrib><creatorcontrib>Cui, Yixin</creatorcontrib><title>A frequency mapping method for locating functional units inside ICs based on coaxial microscope</title><title>Electronics Letters</title><description>Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal‐to‐noise ratio, meanwhile, locating areas of the chip with operating currents down to 10−10 A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 × 10−4 A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis.</description><subject>Active regions (lasers)</subject><subject>Cameras</subject><subject>Emission analysis</subject><subject>Failure analysis</subject><subject>Fourier transforms</subject><subject>Frequency analysis</subject><subject>Integrated circuits</subject><subject>Lasers</subject><subject>Light</subject><subject>Mapping</subject><subject>Photonics</subject><subject>Reverse engineering</subject><subject>Sensitivity analysis</subject><subject>Signal quality</subject><subject>Silicon</subject><subject>Transistors</subject><issn>0013-5194</issn><issn>1350-911X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>24P</sourceid><sourceid>WIN</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp9kE1r4zAQhsXShU2ze9lfIOit4FRflu1jCP2CQC8t9CYm-sgqOJIrObT59yvXPZc5DDM87_DOi9BfSlaUiO7G9j1bUcYb_gMtKK9J1VH6eoEWhFBe1bQTv9Blzocysq5rFkitsUv27WSDPuMjDIMPe3y0479osIsJ91HDOO3cKejRxwA9PgU_ZuxD9sbix03GO8jW4BiwjvDhC3H0OsWs42B_o58O-mz_fPUlerm7fd48VNun-8fNeltpLgivGDjNal6zXUOBCG0ZkQxa04naMkkYA9NyI0AKIwztwElwZOcoyHbHjWz4El3Nd4cUyzd5VId4SsVtVpx0rCWypaJQq5naQ2-VDy6OCXQpY4vlGKzzZb9uhCCSSzkJrmfB9E9O1qkh-SOks6JETYmrKXH1mXiB6Qy_lyvnb0h1u92yWfMf0N2Cvw</recordid><startdate>202202</startdate><enddate>202202</enddate><creator>Liu, Pengcheng</creator><creator>Han, Jianwei</creator><creator>Ma, Yingqi</creator><creator>Zhang, Feng</creator><creator>Wu, Zongguo</creator><creator>Zhu, Xiang</creator><creator>Cui, Yixin</creator><general>John Wiley & Sons, Inc</general><scope>24P</scope><scope>WIN</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>IAO</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>JQ2</scope><scope>K7-</scope><scope>L6V</scope><scope>M7S</scope><scope>P5Z</scope><scope>P62</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><orcidid>https://orcid.org/0000-0002-3343-9429</orcidid></search><sort><creationdate>202202</creationdate><title>A frequency mapping method for locating functional units inside ICs based on coaxial microscope</title><author>Liu, Pengcheng ; Han, Jianwei ; Ma, Yingqi ; Zhang, Feng ; Wu, Zongguo ; Zhu, Xiang ; Cui, Yixin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3403-2afc25352b71a04ce2062a8d945e26022ad83d4a64d4d19af6af0bf1a68b3d673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Active regions (lasers)</topic><topic>Cameras</topic><topic>Emission analysis</topic><topic>Failure analysis</topic><topic>Fourier transforms</topic><topic>Frequency analysis</topic><topic>Integrated circuits</topic><topic>Lasers</topic><topic>Light</topic><topic>Mapping</topic><topic>Photonics</topic><topic>Reverse engineering</topic><topic>Sensitivity analysis</topic><topic>Signal quality</topic><topic>Silicon</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Pengcheng</creatorcontrib><creatorcontrib>Han, Jianwei</creatorcontrib><creatorcontrib>Ma, Yingqi</creatorcontrib><creatorcontrib>Zhang, Feng</creatorcontrib><creatorcontrib>Wu, Zongguo</creatorcontrib><creatorcontrib>Zhu, Xiang</creatorcontrib><creatorcontrib>Cui, Yixin</creatorcontrib><collection>Wiley Online Library (Open Access Collection)</collection><collection>Wiley Online Library (Open Access Collection)</collection><collection>CrossRef</collection><collection>Gale Academic OneFile</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Computer Science Collection</collection><collection>Computer Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><jtitle>Electronics Letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Pengcheng</au><au>Han, Jianwei</au><au>Ma, Yingqi</au><au>Zhang, Feng</au><au>Wu, Zongguo</au><au>Zhu, Xiang</au><au>Cui, Yixin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A frequency mapping method for locating functional units inside ICs based on coaxial microscope</atitle><jtitle>Electronics Letters</jtitle><date>2022-02</date><risdate>2022</risdate><volume>58</volume><issue>3</issue><spage>115</spage><epage>117</epage><pages>115-117</pages><issn>0013-5194</issn><eissn>1350-911X</eissn><abstract>Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal‐to‐noise ratio, meanwhile, locating areas of the chip with operating currents down to 10−10 A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 × 10−4 A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis.</abstract><cop>Stevenage</cop><pub>John Wiley & Sons, Inc</pub><doi>10.1049/ell2.12373</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-3343-9429</orcidid><oa>free_for_read</oa></addata></record> |
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| ispartof | Electronics Letters, 2022-02, Vol.58 (3), p.115-117 |
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| source | Wiley Journals; DOAJ Directory of Open Access Journals; EZB-FREE-00999 freely available EZB journals; Wiley Online Library (Open Access Collection); Alma/SFX Local Collection |
| subjects | Active regions (lasers) Cameras Emission analysis Failure analysis Fourier transforms Frequency analysis Integrated circuits Lasers Light Mapping Photonics Reverse engineering Sensitivity analysis Signal quality Silicon Transistors |
| title | A frequency mapping method for locating functional units inside ICs based on coaxial microscope |
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