Kinetic Study on the Si3N4 Etching in Superheated Water
Wet etching of Si3N4 was conducted in superheated water at 160 °C with different additives type and concentration. In general, etching rate of Si3N4 increased with the pH of solution. However, it is difficult to fully explain the Si3N4 etching behavior just with the pH of solution. The OH- concentra...
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Veröffentlicht in: | Solid state phenomena 2021-02, Vol.314, p.113-118 |
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description | Wet etching of Si3N4 was conducted in superheated water at 160 °C with different additives type and concentration. In general, etching rate of Si3N4 increased with the pH of solution. However, it is difficult to fully explain the Si3N4 etching behavior just with the pH of solution. The OH- concentration (or pH) in superheated water at 160 °C are different from the pH of solution at room temperature. Therefore, the OH- concentrations in superheated water at 160 °C were calculated using van't Hoff equation, equilibrium constant equations, mass and charge balance equations. The calculated OH- concentration at 160 °C showed better correlation with Si3N4 etching rate than that of initial pH of solution. |
doi_str_mv | 10.4028/www.scientific.net/SSP.314.113 |
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In general, etching rate of Si3N4 increased with the pH of solution. However, it is difficult to fully explain the Si3N4 etching behavior just with the pH of solution. The OH- concentration (or pH) in superheated water at 160 °C are different from the pH of solution at room temperature. Therefore, the OH- concentrations in superheated water at 160 °C were calculated using van't Hoff equation, equilibrium constant equations, mass and charge balance equations. The calculated OH- concentration at 160 °C showed better correlation with Si3N4 etching rate than that of initial pH of solution.</description><identifier>ISSN: 1012-0394</identifier><identifier>ISSN: 1662-9779</identifier><identifier>EISSN: 1662-9779</identifier><identifier>DOI: 10.4028/www.scientific.net/SSP.314.113</identifier><language>eng</language><publisher>Zurich: Trans Tech Publications Ltd</publisher><subject>Etching ; Room temperature ; Silicon nitride</subject><ispartof>Solid state phenomena, 2021-02, Vol.314, p.113-118</ispartof><rights>2021 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. 2021</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2103-c501dadc689f514228570e8ce006017bb0dd5d6599599b0da670e7763a0489c73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/6177?width=600</thumbnail><link.rule.ids>314,777,781,27905,27906</link.rule.ids></links><search><creatorcontrib>Son, Changjin</creatorcontrib><creatorcontrib>Lim, Sang Woo</creatorcontrib><title>Kinetic Study on the Si3N4 Etching in Superheated Water</title><title>Solid state phenomena</title><description>Wet etching of Si3N4 was conducted in superheated water at 160 °C with different additives type and concentration. In general, etching rate of Si3N4 increased with the pH of solution. However, it is difficult to fully explain the Si3N4 etching behavior just with the pH of solution. The OH- concentration (or pH) in superheated water at 160 °C are different from the pH of solution at room temperature. Therefore, the OH- concentrations in superheated water at 160 °C were calculated using van't Hoff equation, equilibrium constant equations, mass and charge balance equations. The calculated OH- concentration at 160 °C showed better correlation with Si3N4 etching rate than that of initial pH of solution.</description><subject>Etching</subject><subject>Room temperature</subject><subject>Silicon nitride</subject><issn>1012-0394</issn><issn>1662-9779</issn><issn>1662-9779</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqNkN9LwzAQgIMoOKf_Q0Dwrd2laZPmRZThLxwqVPExdGlqM7SdScrYf-_JhL0KR-5C7r4jHyEXDNIcsnK22WzSYJzto2udSXsbZ1X1knKWp4zxAzJhQmSJklIdYg0sS4Cr_JichLAC4Kxk5YTIR4eDztAqjs2WDj2NnaWV4085vYmmc_0HdT2txrX1na2jbeg7nv6UHLX1Z7Bnf3lK3m5vXuf3yeL57mF-vUhMxoAnpgDW1I0RpWoLlmdZWUiwpbEAAphcLqFpikYUSmHgpRb4LKXgNeSlMpJPyfmOu_bD92hD1Kth9D2u1BwUU7lAEHZd7rqMH0LwttVr775qv9UM9K8sjbL0XpbGP2uUpVGWRlkIuNoBoq_7EK3p9nv-ifgBYy544g</recordid><startdate>20210201</startdate><enddate>20210201</enddate><creator>Son, Changjin</creator><creator>Lim, Sang Woo</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20210201</creationdate><title>Kinetic Study on the Si3N4 Etching in Superheated Water</title><author>Son, Changjin ; Lim, Sang Woo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2103-c501dadc689f514228570e8ce006017bb0dd5d6599599b0da670e7763a0489c73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Etching</topic><topic>Room temperature</topic><topic>Silicon nitride</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Son, Changjin</creatorcontrib><creatorcontrib>Lim, Sang Woo</creatorcontrib><collection>CrossRef</collection><jtitle>Solid state phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Son, Changjin</au><au>Lim, Sang Woo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Kinetic Study on the Si3N4 Etching in Superheated Water</atitle><jtitle>Solid state phenomena</jtitle><date>2021-02-01</date><risdate>2021</risdate><volume>314</volume><spage>113</spage><epage>118</epage><pages>113-118</pages><issn>1012-0394</issn><issn>1662-9779</issn><eissn>1662-9779</eissn><abstract>Wet etching of Si3N4 was conducted in superheated water at 160 °C with different additives type and concentration. In general, etching rate of Si3N4 increased with the pH of solution. However, it is difficult to fully explain the Si3N4 etching behavior just with the pH of solution. The OH- concentration (or pH) in superheated water at 160 °C are different from the pH of solution at room temperature. Therefore, the OH- concentrations in superheated water at 160 °C were calculated using van't Hoff equation, equilibrium constant equations, mass and charge balance equations. The calculated OH- concentration at 160 °C showed better correlation with Si3N4 etching rate than that of initial pH of solution.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/SSP.314.113</doi><tpages>6</tpages></addata></record> |
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title | Kinetic Study on the Si3N4 Etching in Superheated Water |
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