Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering
Rare earth (RE)-doped BaTiO 3 materials are promising dielectric materials for base-metal electrode multilayer ceramic capacitors (BME-MLCCs). Thus, the fundamental understanding of their effect on dielectric properties and reliability is crucial for further improvement of its performance. Herein, a...
Gespeichert in:
Veröffentlicht in: | Applied physics. A, Materials science & processing Materials science & processing, 2024-08, Vol.130 (8), Article 601 |
---|---|
Hauptverfasser: | , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | 8 |
container_start_page | |
container_title | Applied physics. A, Materials science & processing |
container_volume | 130 |
creator | Tan, Junhui Wang, Pengfei Huang, Rongxia Lin, Hua-Tay Hu, Zhiping Yang, Jun Cheng, Lixia Fu, Zhenxiao Cao, Xiuhua Zhang, Lei Yu, Shuhui Sun, Rong |
description | Rare earth (RE)-doped BaTiO
3
materials are promising dielectric materials for base-metal electrode multilayer ceramic capacitors (BME-MLCCs). Thus, the fundamental understanding of their effect on dielectric properties and reliability is crucial for further improvement of its performance. Herein, according to Preisach model, the dielectric stability of Dy and Y-doped BaTiO
3
MLCCs with different particle sizes was investigated in this study. First order reversal curve (FORC) analysis showed that the reversible and irreversible domain wall motion of Dy-doped samples was weaker than that of Y-doped samples. Results also showed that the higher “shell” proportion of “core-shell” structure in Dy-doping was beneficial for improving the dielectric stability and insulation resistance degradation. The findings provide a comprehensive understanding and illustrate the significant role of the “core-shell” volume ratio in the tetragonality and domain wall motion in RE-doped BaTiO
3
materials, and consequently laying an important ground work to obtain high dielectric stability and reliability in BME-MLCCs. |
doi_str_mv | 10.1007/s00339-024-07767-2 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3087290050</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3087290050</sourcerecordid><originalsourceid>FETCH-LOGICAL-c200t-4d0cde0399dea8ed5d990229825caa2a468eeb37b8afcff9b7acee60ac8cb2553</originalsourceid><addsrcrecordid>eNp9kMtOwzAQRS0EEqXwA6wssTZM7bzMDiJeUlEXlLXl2JPWVZoEOwh1wb_jEhA7ZjMaz7135EPI-QwuZwD5VQAQQjLgCYM8z3LGD8hklgjOIBNwSCYgk5wVQmbH5CSEDcRKOJ-Qz5dBV65xw47q1lKPjfudu5re6qVbCFbpgJY-z8sy0A83rOnardbUOmzQDN4ZWu2o1x4Zah-3tutdu7qOgdS1IUoHWvtuG9-32rUM25VrEX3UnJKjWjcBz376lLze3y3LRzZfPDyVN3NmOMDAEgvGIggpLeoCbWqlBM5lwVOjNddJViBWIq8KXZu6llWuDWIG2hSm4mkqpuRizO199_aOYVCb7t238aQSUORcAqQQVXxUGd-F4LFWvXdb7XdqBmqPWY2YVcSsvjErHk1iNIV-_yP0f9H_uL4AzZSCDQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3087290050</pqid></control><display><type>article</type><title>Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering</title><source>Springer Nature - Complete Springer Journals</source><creator>Tan, Junhui ; Wang, Pengfei ; Huang, Rongxia ; Lin, Hua-Tay ; Hu, Zhiping ; Yang, Jun ; Cheng, Lixia ; Fu, Zhenxiao ; Cao, Xiuhua ; Zhang, Lei ; Yu, Shuhui ; Sun, Rong</creator><creatorcontrib>Tan, Junhui ; Wang, Pengfei ; Huang, Rongxia ; Lin, Hua-Tay ; Hu, Zhiping ; Yang, Jun ; Cheng, Lixia ; Fu, Zhenxiao ; Cao, Xiuhua ; Zhang, Lei ; Yu, Shuhui ; Sun, Rong</creatorcontrib><description>Rare earth (RE)-doped BaTiO
3
materials are promising dielectric materials for base-metal electrode multilayer ceramic capacitors (BME-MLCCs). Thus, the fundamental understanding of their effect on dielectric properties and reliability is crucial for further improvement of its performance. Herein, according to Preisach model, the dielectric stability of Dy and Y-doped BaTiO
3
MLCCs with different particle sizes was investigated in this study. First order reversal curve (FORC) analysis showed that the reversible and irreversible domain wall motion of Dy-doped samples was weaker than that of Y-doped samples. Results also showed that the higher “shell” proportion of “core-shell” structure in Dy-doping was beneficial for improving the dielectric stability and insulation resistance degradation. The findings provide a comprehensive understanding and illustrate the significant role of the “core-shell” volume ratio in the tetragonality and domain wall motion in RE-doped BaTiO
3
materials, and consequently laying an important ground work to obtain high dielectric stability and reliability in BME-MLCCs.</description><identifier>ISSN: 0947-8396</identifier><identifier>EISSN: 1432-0630</identifier><identifier>DOI: 10.1007/s00339-024-07767-2</identifier><language>eng</language><publisher>Berlin/Heidelberg: Springer Berlin Heidelberg</publisher><subject>Barium titanates ; Characterization and Evaluation of Materials ; Condensed Matter Physics ; Dielectric properties ; Dielectric strength ; Domain walls ; Doping ; Dysprosium ; Machines ; Manufacturing ; Multilayers ; Nanotechnology ; Optical and Electronic Materials ; Physics ; Physics and Astronomy ; Processes ; Rare earth elements ; Reliability ; Shell stability ; Stability ; Surfaces and Interfaces ; Thin Films ; Yttrium</subject><ispartof>Applied physics. A, Materials science & processing, 2024-08, Vol.130 (8), Article 601</ispartof><rights>The Author(s), under exclusive licence to Springer-Verlag GmbH Germany, part of Springer Nature 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c200t-4d0cde0399dea8ed5d990229825caa2a468eeb37b8afcff9b7acee60ac8cb2553</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s00339-024-07767-2$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s00339-024-07767-2$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51298</link.rule.ids></links><search><creatorcontrib>Tan, Junhui</creatorcontrib><creatorcontrib>Wang, Pengfei</creatorcontrib><creatorcontrib>Huang, Rongxia</creatorcontrib><creatorcontrib>Lin, Hua-Tay</creatorcontrib><creatorcontrib>Hu, Zhiping</creatorcontrib><creatorcontrib>Yang, Jun</creatorcontrib><creatorcontrib>Cheng, Lixia</creatorcontrib><creatorcontrib>Fu, Zhenxiao</creatorcontrib><creatorcontrib>Cao, Xiuhua</creatorcontrib><creatorcontrib>Zhang, Lei</creatorcontrib><creatorcontrib>Yu, Shuhui</creatorcontrib><creatorcontrib>Sun, Rong</creatorcontrib><title>Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering</title><title>Applied physics. A, Materials science & processing</title><addtitle>Appl. Phys. A</addtitle><description>Rare earth (RE)-doped BaTiO
3
materials are promising dielectric materials for base-metal electrode multilayer ceramic capacitors (BME-MLCCs). Thus, the fundamental understanding of their effect on dielectric properties and reliability is crucial for further improvement of its performance. Herein, according to Preisach model, the dielectric stability of Dy and Y-doped BaTiO
3
MLCCs with different particle sizes was investigated in this study. First order reversal curve (FORC) analysis showed that the reversible and irreversible domain wall motion of Dy-doped samples was weaker than that of Y-doped samples. Results also showed that the higher “shell” proportion of “core-shell” structure in Dy-doping was beneficial for improving the dielectric stability and insulation resistance degradation. The findings provide a comprehensive understanding and illustrate the significant role of the “core-shell” volume ratio in the tetragonality and domain wall motion in RE-doped BaTiO
3
materials, and consequently laying an important ground work to obtain high dielectric stability and reliability in BME-MLCCs.</description><subject>Barium titanates</subject><subject>Characterization and Evaluation of Materials</subject><subject>Condensed Matter Physics</subject><subject>Dielectric properties</subject><subject>Dielectric strength</subject><subject>Domain walls</subject><subject>Doping</subject><subject>Dysprosium</subject><subject>Machines</subject><subject>Manufacturing</subject><subject>Multilayers</subject><subject>Nanotechnology</subject><subject>Optical and Electronic Materials</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Processes</subject><subject>Rare earth elements</subject><subject>Reliability</subject><subject>Shell stability</subject><subject>Stability</subject><subject>Surfaces and Interfaces</subject><subject>Thin Films</subject><subject>Yttrium</subject><issn>0947-8396</issn><issn>1432-0630</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRS0EEqXwA6wssTZM7bzMDiJeUlEXlLXl2JPWVZoEOwh1wb_jEhA7ZjMaz7135EPI-QwuZwD5VQAQQjLgCYM8z3LGD8hklgjOIBNwSCYgk5wVQmbH5CSEDcRKOJ-Qz5dBV65xw47q1lKPjfudu5re6qVbCFbpgJY-z8sy0A83rOnardbUOmzQDN4ZWu2o1x4Zah-3tutdu7qOgdS1IUoHWvtuG9-32rUM25VrEX3UnJKjWjcBz376lLze3y3LRzZfPDyVN3NmOMDAEgvGIggpLeoCbWqlBM5lwVOjNddJViBWIq8KXZu6llWuDWIG2hSm4mkqpuRizO199_aOYVCb7t238aQSUORcAqQQVXxUGd-F4LFWvXdb7XdqBmqPWY2YVcSsvjErHk1iNIV-_yP0f9H_uL4AzZSCDQ</recordid><startdate>20240801</startdate><enddate>20240801</enddate><creator>Tan, Junhui</creator><creator>Wang, Pengfei</creator><creator>Huang, Rongxia</creator><creator>Lin, Hua-Tay</creator><creator>Hu, Zhiping</creator><creator>Yang, Jun</creator><creator>Cheng, Lixia</creator><creator>Fu, Zhenxiao</creator><creator>Cao, Xiuhua</creator><creator>Zhang, Lei</creator><creator>Yu, Shuhui</creator><creator>Sun, Rong</creator><general>Springer Berlin Heidelberg</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20240801</creationdate><title>Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering</title><author>Tan, Junhui ; Wang, Pengfei ; Huang, Rongxia ; Lin, Hua-Tay ; Hu, Zhiping ; Yang, Jun ; Cheng, Lixia ; Fu, Zhenxiao ; Cao, Xiuhua ; Zhang, Lei ; Yu, Shuhui ; Sun, Rong</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c200t-4d0cde0399dea8ed5d990229825caa2a468eeb37b8afcff9b7acee60ac8cb2553</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Barium titanates</topic><topic>Characterization and Evaluation of Materials</topic><topic>Condensed Matter Physics</topic><topic>Dielectric properties</topic><topic>Dielectric strength</topic><topic>Domain walls</topic><topic>Doping</topic><topic>Dysprosium</topic><topic>Machines</topic><topic>Manufacturing</topic><topic>Multilayers</topic><topic>Nanotechnology</topic><topic>Optical and Electronic Materials</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Processes</topic><topic>Rare earth elements</topic><topic>Reliability</topic><topic>Shell stability</topic><topic>Stability</topic><topic>Surfaces and Interfaces</topic><topic>Thin Films</topic><topic>Yttrium</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tan, Junhui</creatorcontrib><creatorcontrib>Wang, Pengfei</creatorcontrib><creatorcontrib>Huang, Rongxia</creatorcontrib><creatorcontrib>Lin, Hua-Tay</creatorcontrib><creatorcontrib>Hu, Zhiping</creatorcontrib><creatorcontrib>Yang, Jun</creatorcontrib><creatorcontrib>Cheng, Lixia</creatorcontrib><creatorcontrib>Fu, Zhenxiao</creatorcontrib><creatorcontrib>Cao, Xiuhua</creatorcontrib><creatorcontrib>Zhang, Lei</creatorcontrib><creatorcontrib>Yu, Shuhui</creatorcontrib><creatorcontrib>Sun, Rong</creatorcontrib><collection>CrossRef</collection><jtitle>Applied physics. A, Materials science & processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tan, Junhui</au><au>Wang, Pengfei</au><au>Huang, Rongxia</au><au>Lin, Hua-Tay</au><au>Hu, Zhiping</au><au>Yang, Jun</au><au>Cheng, Lixia</au><au>Fu, Zhenxiao</au><au>Cao, Xiuhua</au><au>Zhang, Lei</au><au>Yu, Shuhui</au><au>Sun, Rong</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering</atitle><jtitle>Applied physics. A, Materials science & processing</jtitle><stitle>Appl. Phys. A</stitle><date>2024-08-01</date><risdate>2024</risdate><volume>130</volume><issue>8</issue><artnum>601</artnum><issn>0947-8396</issn><eissn>1432-0630</eissn><abstract>Rare earth (RE)-doped BaTiO
3
materials are promising dielectric materials for base-metal electrode multilayer ceramic capacitors (BME-MLCCs). Thus, the fundamental understanding of their effect on dielectric properties and reliability is crucial for further improvement of its performance. Herein, according to Preisach model, the dielectric stability of Dy and Y-doped BaTiO
3
MLCCs with different particle sizes was investigated in this study. First order reversal curve (FORC) analysis showed that the reversible and irreversible domain wall motion of Dy-doped samples was weaker than that of Y-doped samples. Results also showed that the higher “shell” proportion of “core-shell” structure in Dy-doping was beneficial for improving the dielectric stability and insulation resistance degradation. The findings provide a comprehensive understanding and illustrate the significant role of the “core-shell” volume ratio in the tetragonality and domain wall motion in RE-doped BaTiO
3
materials, and consequently laying an important ground work to obtain high dielectric stability and reliability in BME-MLCCs.</abstract><cop>Berlin/Heidelberg</cop><pub>Springer Berlin Heidelberg</pub><doi>10.1007/s00339-024-07767-2</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0947-8396 |
ispartof | Applied physics. A, Materials science & processing, 2024-08, Vol.130 (8), Article 601 |
issn | 0947-8396 1432-0630 |
language | eng |
recordid | cdi_proquest_journals_3087290050 |
source | Springer Nature - Complete Springer Journals |
subjects | Barium titanates Characterization and Evaluation of Materials Condensed Matter Physics Dielectric properties Dielectric strength Domain walls Doping Dysprosium Machines Manufacturing Multilayers Nanotechnology Optical and Electronic Materials Physics Physics and Astronomy Processes Rare earth elements Reliability Shell stability Stability Surfaces and Interfaces Thin Films Yttrium |
title | Stability and reliability of BaTiO3-based MLCCs with high dielectric by rare-earth doping: an insight from domain-engineering |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-21T18%3A16%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Stability%20and%20reliability%20of%20BaTiO3-based%20MLCCs%20with%20high%20dielectric%20by%20rare-earth%20doping:%20an%20insight%20from%20domain-engineering&rft.jtitle=Applied%20physics.%20A,%20Materials%20science%20&%20processing&rft.au=Tan,%20Junhui&rft.date=2024-08-01&rft.volume=130&rft.issue=8&rft.artnum=601&rft.issn=0947-8396&rft.eissn=1432-0630&rft_id=info:doi/10.1007/s00339-024-07767-2&rft_dat=%3Cproquest_cross%3E3087290050%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3087290050&rft_id=info:pmid/&rfr_iscdi=true |