P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications
In this study, we explore the feasibility of employing a unit‐cell type fine metal mask (uc‐FMM) for IT and Gen8.x AMOLED applications, which currently represent the forefront of the OLED industry in the upcoming era. The conventional stick‐type fine metal mask (FMM) raised concerns about lateral wr...
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Veröffentlicht in: | SID International Symposium Digest of technical papers 2024-06, Vol.55 (1), p.1769-1771 |
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description | In this study, we explore the feasibility of employing a unit‐cell type fine metal mask (uc‐FMM) for IT and Gen8.x AMOLED applications, which currently represent the forefront of the OLED industry in the upcoming era. The conventional stick‐type fine metal mask (FMM) raised concerns about lateral wrinkling with increasing mask width, particularly affecting middle and large‐sized displays and the overall panel efficiency of glass design. Our focus lies in understanding the tension relationships within the mask and the open mask used as a sub‐frame for support. The tensions involved—T1 for the metal mask, T2 for the open mask, and T3 at the welding points—all play crucial roles. We utilized portable X‐ray diffraction (XRD) to measure these tensions accurately. Of particular significance is T3, which we analyzed in relation to welding morphology, welded adhesion, and material properties. By experimenting with different invar materials and welding lasers, we established quantitative relationships. Our findings strongly indicate that uc‐FMM presents a compelling and inevitable solution for the future of OLED technology. |
doi_str_mv | 10.1002/sdtp.17916 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3085971201</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3085971201</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1056-25a8e89a24f5d67475e0f696566bd31ec3ed12750878f6850dda6e5c5a829e2c3</originalsourceid><addsrcrecordid>eNp9kM1Kw0AUhQdRsFY3PsGA4EJInZlkJjPuQv8stLZoCu6GMbmB1JjEmZTanY_gM_okpsa1qwuH75wLH0KXlAwoIezWpU09oKGi4gj1GBXSI5SrY9QjRIWeEuL5FJ05tyHE94NA9dDj6vvzS6k7HOEH2OF1mTdtkEBR4HhfA57kJeAFNKbAC-NecVZZPIvxNZ5CKQcfOFos5-MRjuq6yBPT5FXpztFJZgoHF3-3j9aTcTy89-bL6WwYzb2EEi48xo0EqQwLMp6KMAg5kEwowYV4SX0KiQ8pZSEnMpSZkJykqRHAk7bGFLDE76Orbre21fsWXKM31daW7UvtE8lVSBmhLXXTUYmtnLOQ6drmb8buNSX64EwfnOlfZy1MO3iXF7D_h9RPo3jVdX4AAo1sjQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3085971201</pqid></control><display><type>article</type><title>P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications</title><source>Wiley Online Library</source><creator>Kim, Mu-Gyeom ; Chang, Yeoungjin ; Choi, Heedong ; Park, Chanju</creator><creatorcontrib>Kim, Mu-Gyeom ; Chang, Yeoungjin ; Choi, Heedong ; Park, Chanju</creatorcontrib><description>In this study, we explore the feasibility of employing a unit‐cell type fine metal mask (uc‐FMM) for IT and Gen8.x AMOLED applications, which currently represent the forefront of the OLED industry in the upcoming era. The conventional stick‐type fine metal mask (FMM) raised concerns about lateral wrinkling with increasing mask width, particularly affecting middle and large‐sized displays and the overall panel efficiency of glass design. Our focus lies in understanding the tension relationships within the mask and the open mask used as a sub‐frame for support. The tensions involved—T1 for the metal mask, T2 for the open mask, and T3 at the welding points—all play crucial roles. We utilized portable X‐ray diffraction (XRD) to measure these tensions accurately. Of particular significance is T3, which we analyzed in relation to welding morphology, welded adhesion, and material properties. By experimenting with different invar materials and welding lasers, we established quantitative relationships. Our findings strongly indicate that uc‐FMM presents a compelling and inevitable solution for the future of OLED technology.</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.17916</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>Active matrix displays ; AMOLED ; Feasibility studies ; Ferrous alloys ; fine metal mask ; Frame design ; Gen8.x ; Laser beam welding ; Low expansion alloys ; mask tension ; Material properties ; open mask ; Unit-cell type</subject><ispartof>SID International Symposium Digest of technical papers, 2024-06, Vol.55 (1), p.1769-1771</ispartof><rights>2024 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1056-25a8e89a24f5d67475e0f696566bd31ec3ed12750878f6850dda6e5c5a829e2c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsdtp.17916$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsdtp.17916$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>315,781,785,1418,27926,27927,45576,45577</link.rule.ids></links><search><creatorcontrib>Kim, Mu-Gyeom</creatorcontrib><creatorcontrib>Chang, Yeoungjin</creatorcontrib><creatorcontrib>Choi, Heedong</creatorcontrib><creatorcontrib>Park, Chanju</creatorcontrib><title>P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications</title><title>SID International Symposium Digest of technical papers</title><description>In this study, we explore the feasibility of employing a unit‐cell type fine metal mask (uc‐FMM) for IT and Gen8.x AMOLED applications, which currently represent the forefront of the OLED industry in the upcoming era. The conventional stick‐type fine metal mask (FMM) raised concerns about lateral wrinkling with increasing mask width, particularly affecting middle and large‐sized displays and the overall panel efficiency of glass design. Our focus lies in understanding the tension relationships within the mask and the open mask used as a sub‐frame for support. The tensions involved—T1 for the metal mask, T2 for the open mask, and T3 at the welding points—all play crucial roles. We utilized portable X‐ray diffraction (XRD) to measure these tensions accurately. Of particular significance is T3, which we analyzed in relation to welding morphology, welded adhesion, and material properties. By experimenting with different invar materials and welding lasers, we established quantitative relationships. Our findings strongly indicate that uc‐FMM presents a compelling and inevitable solution for the future of OLED technology.</description><subject>Active matrix displays</subject><subject>AMOLED</subject><subject>Feasibility studies</subject><subject>Ferrous alloys</subject><subject>fine metal mask</subject><subject>Frame design</subject><subject>Gen8.x</subject><subject>Laser beam welding</subject><subject>Low expansion alloys</subject><subject>mask tension</subject><subject>Material properties</subject><subject>open mask</subject><subject>Unit-cell type</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kM1Kw0AUhQdRsFY3PsGA4EJInZlkJjPuQv8stLZoCu6GMbmB1JjEmZTanY_gM_okpsa1qwuH75wLH0KXlAwoIezWpU09oKGi4gj1GBXSI5SrY9QjRIWeEuL5FJ05tyHE94NA9dDj6vvzS6k7HOEH2OF1mTdtkEBR4HhfA57kJeAFNKbAC-NecVZZPIvxNZ5CKQcfOFos5-MRjuq6yBPT5FXpztFJZgoHF3-3j9aTcTy89-bL6WwYzb2EEi48xo0EqQwLMp6KMAg5kEwowYV4SX0KiQ8pZSEnMpSZkJykqRHAk7bGFLDE76Orbre21fsWXKM31daW7UvtE8lVSBmhLXXTUYmtnLOQ6drmb8buNSX64EwfnOlfZy1MO3iXF7D_h9RPo3jVdX4AAo1sjQ</recordid><startdate>202406</startdate><enddate>202406</enddate><creator>Kim, Mu-Gyeom</creator><creator>Chang, Yeoungjin</creator><creator>Choi, Heedong</creator><creator>Park, Chanju</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>202406</creationdate><title>P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications</title><author>Kim, Mu-Gyeom ; Chang, Yeoungjin ; Choi, Heedong ; Park, Chanju</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1056-25a8e89a24f5d67475e0f696566bd31ec3ed12750878f6850dda6e5c5a829e2c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Active matrix displays</topic><topic>AMOLED</topic><topic>Feasibility studies</topic><topic>Ferrous alloys</topic><topic>fine metal mask</topic><topic>Frame design</topic><topic>Gen8.x</topic><topic>Laser beam welding</topic><topic>Low expansion alloys</topic><topic>mask tension</topic><topic>Material properties</topic><topic>open mask</topic><topic>Unit-cell type</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Mu-Gyeom</creatorcontrib><creatorcontrib>Chang, Yeoungjin</creatorcontrib><creatorcontrib>Choi, Heedong</creatorcontrib><creatorcontrib>Park, Chanju</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Mu-Gyeom</au><au>Chang, Yeoungjin</au><au>Choi, Heedong</au><au>Park, Chanju</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2024-06</date><risdate>2024</risdate><volume>55</volume><issue>1</issue><spage>1769</spage><epage>1771</epage><pages>1769-1771</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>In this study, we explore the feasibility of employing a unit‐cell type fine metal mask (uc‐FMM) for IT and Gen8.x AMOLED applications, which currently represent the forefront of the OLED industry in the upcoming era. The conventional stick‐type fine metal mask (FMM) raised concerns about lateral wrinkling with increasing mask width, particularly affecting middle and large‐sized displays and the overall panel efficiency of glass design. Our focus lies in understanding the tension relationships within the mask and the open mask used as a sub‐frame for support. The tensions involved—T1 for the metal mask, T2 for the open mask, and T3 at the welding points—all play crucial roles. We utilized portable X‐ray diffraction (XRD) to measure these tensions accurately. Of particular significance is T3, which we analyzed in relation to welding morphology, welded adhesion, and material properties. By experimenting with different invar materials and welding lasers, we established quantitative relationships. Our findings strongly indicate that uc‐FMM presents a compelling and inevitable solution for the future of OLED technology.</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sdtp.17916</doi><tpages>3</tpages></addata></record> |
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subjects | Active matrix displays AMOLED Feasibility studies Ferrous alloys fine metal mask Frame design Gen8.x Laser beam welding Low expansion alloys mask tension Material properties open mask Unit-cell type |
title | P‐99: A New Unit‐cell Type Fine Metal Mask for IT & Gen8.x AMOLED Applications |
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