Indium Bump Bonding: Advanced Integration Techniques for Low-Temperature Detectors and Readout

We have examined the influence of bump shape and bonding pressure on low-temperature electrical properties of indium bump connections including superconducting transition temperature, normal state resistance, and superconducting critical current. We describe our test structures, bonding process, and...

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Veröffentlicht in:Journal of low temperature physics 2024-07, Vol.216 (1-2), p.67-72
Hauptverfasser: Lucas, T. J., Biesecker, J. P., Doriese, W. B., Duff, S. M., Durkin, M. S., Lew, R. A., Ullom, J. N., Vissers, M. R., Schmidt, D. R.
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container_issue 1-2
container_start_page 67
container_title Journal of low temperature physics
container_volume 216
creator Lucas, T. J.
Biesecker, J. P.
Doriese, W. B.
Duff, S. M.
Durkin, M. S.
Lew, R. A.
Ullom, J. N.
Vissers, M. R.
Schmidt, D. R.
description We have examined the influence of bump shape and bonding pressure on low-temperature electrical properties of indium bump connections including superconducting transition temperature, normal state resistance, and superconducting critical current. We describe our test structures, bonding process, and methods of characterization. At temperatures below 1 K, we observe critical currents greater than 70 mA for indium bump connections with a nominal bump size of 17 µm × 17 µm.
doi_str_mv 10.1007/s10909-024-03104-2
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subjects Bonding
Characterization and Evaluation of Materials
Condensed Matter Physics
Critical current (superconductivity)
Electrical properties
Indium
Low temperature
Low temperature resistance
Magnetic Materials
Magnetism
Physics
Physics and Astronomy
Superconductivity
Transition temperature
title Indium Bump Bonding: Advanced Integration Techniques for Low-Temperature Detectors and Readout
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