Enhanced ferroelectric properties of BiFeO3 thin films utilizing four buffer layers: Nd2O3, Eu2O3, Ho2O3, and Er2O3

This paper investigates the ferroelectric and structural properties of BiFeO 3 thin films with four different RE 2 O 3 (Nd 2 O 3 , Eu 2 O 3 , Ho 2 O 3 , and Er 2 O 3 ) buffer layers fabricated on a SrRuO 3 /n + -Si substrate through spin-coating. To analyze the BiFeO 3 films with RE 2 O 3 buffer lay...

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Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2024-08, Vol.130 (8), Article 564
Hauptverfasser:	Pan, Tung-Ming, Chen, Zhong-Yi, Her, Jim-Long
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic properties Buffer layers Characterization and Evaluation of Materials Chemical composition Coercivity Condensed Matter Physics Depth profiling Electrical properties Erbium oxide Europium compounds Ferric ions Ferroelectric materials Ferroelectricity Leakage current Machines Manufacturing Nanotechnology Optical and Electronic Materials Photoelectrons Physics Physics and Astronomy Polarization Preferred orientation Processes Secondary ion mass spectrometry Silicon substrates Spin coating Surface roughness Surfaces and Interfaces Thin Films X ray photoelectron spectroscopy
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