Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling
In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolv...
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description | In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH
3
COO)
2
.2H
2
O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared
NH
4
F
. The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed. |
doi_str_mv | 10.1007/s10854-024-13089-z |
format | Article |
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3
COO)
2
.2H
2
O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared
NH
4
F
. The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-13089-z</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Acetic acid ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Deionization ; Glass substrates ; Hall effect ; Materials Science ; Morphology ; Optical and Electronic Materials ; Precursors ; Thin films ; Wurtzite ; Zinc acetate ; Zinc oxide</subject><ispartof>Journal of materials science. Materials in electronics, 2024-07, Vol.35 (19), p.1366, Article 1366</ispartof><rights>The Author(s) 2024</rights><rights>The Author(s) 2024. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c244t-8804203c66c758a62a12d15ffd75ce7c7aa6361ede0cb528ff3faca37570a4603</cites><orcidid>0009-0002-6976-9048</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-13089-z$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-13089-z$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,27923,27924,41487,42556,51318</link.rule.ids></links><search><creatorcontrib>Barrón, Gabriela B.</creatorcontrib><creatorcontrib>Olvera, M. de la L.</creatorcontrib><title>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH
3
COO)
2
.2H
2
O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared
NH
4
F
. The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</description><subject>Acetic acid</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Deionization</subject><subject>Glass substrates</subject><subject>Hall effect</subject><subject>Materials Science</subject><subject>Morphology</subject><subject>Optical and Electronic Materials</subject><subject>Precursors</subject><subject>Thin films</subject><subject>Wurtzite</subject><subject>Zinc acetate</subject><subject>Zinc oxide</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNp9kD1PwzAURS0EEqXwB5gsMQeev2KXDVUUkCp1gEqIxXIdG1ylSbCTIf31pA0SG9Nb7rlP9yB0TeCWAMi7REAJngHlGWGgZtn-BE2IkCzjir6fognMhMy4oPQcXaS0BYCcMzVB69e2K3pce7z4WOH2K1TYh3KXcOGaOoXWFXjT465so0l1FSxOTTT9PQ6VLztXWXdAm-hsF1Md8S6UZag-L9GZN2VyV793itaLx7f5c7ZcPb3MH5aZpZy3mVLAKTCb51YKZXJqCC2I8L6QwjpppTE5y4krHNiNoMp75o01TAoJhufApuhm7G1i_d251Opt3cVqeKkZyFzRGTmm6JiysU4pOq-bGHYm9pqAPujToz496NNHfXo_QGyEhsHDIhf_qv-hfgBffXPy</recordid><startdate>20240701</startdate><enddate>20240701</enddate><creator>Barrón, Gabriela B.</creator><creator>Olvera, M. de la L.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0009-0002-6976-9048</orcidid></search><sort><creationdate>20240701</creationdate><title>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</title><author>Barrón, Gabriela B. ; Olvera, M. de la L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c244t-8804203c66c758a62a12d15ffd75ce7c7aa6361ede0cb528ff3faca37570a4603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Acetic acid</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Deionization</topic><topic>Glass substrates</topic><topic>Hall effect</topic><topic>Materials Science</topic><topic>Morphology</topic><topic>Optical and Electronic Materials</topic><topic>Precursors</topic><topic>Thin films</topic><topic>Wurtzite</topic><topic>Zinc acetate</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Barrón, Gabriela B.</creatorcontrib><creatorcontrib>Olvera, M. de la L.</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Barrón, Gabriela B.</au><au>Olvera, M. de la L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-07-01</date><risdate>2024</risdate><volume>35</volume><issue>19</issue><spage>1366</spage><pages>1366-</pages><artnum>1366</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH
3
COO)
2
.2H
2
O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared
NH
4
F
. The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-13089-z</doi><orcidid>https://orcid.org/0009-0002-6976-9048</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Acetic acid Characterization and Evaluation of Materials Chemistry and Materials Science Deionization Glass substrates Hall effect Materials Science Morphology Optical and Electronic Materials Precursors Thin films Wurtzite Zinc acetate Zinc oxide |
title | Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling |
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