Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling

In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolv...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of materials science. Materials in electronics 2024-07, Vol.35 (19), p.1366, Article 1366
Hauptverfasser: Barrón, Gabriela B., Olvera, M. de la L.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 19
container_start_page 1366
container_title Journal of materials science. Materials in electronics
container_volume 35
creator Barrón, Gabriela B.
Olvera, M. de la L.
description In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared NH 4 F . The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.
doi_str_mv 10.1007/s10854-024-13089-z
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3076829160</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3076829160</sourcerecordid><originalsourceid>FETCH-LOGICAL-c244t-8804203c66c758a62a12d15ffd75ce7c7aa6361ede0cb528ff3faca37570a4603</originalsourceid><addsrcrecordid>eNp9kD1PwzAURS0EEqXwB5gsMQeev2KXDVUUkCp1gEqIxXIdG1ylSbCTIf31pA0SG9Nb7rlP9yB0TeCWAMi7REAJngHlGWGgZtn-BE2IkCzjir6fognMhMy4oPQcXaS0BYCcMzVB69e2K3pce7z4WOH2K1TYh3KXcOGaOoXWFXjT465so0l1FSxOTTT9PQ6VLztXWXdAm-hsF1Md8S6UZag-L9GZN2VyV793itaLx7f5c7ZcPb3MH5aZpZy3mVLAKTCb51YKZXJqCC2I8L6QwjpppTE5y4krHNiNoMp75o01TAoJhufApuhm7G1i_d251Opt3cVqeKkZyFzRGTmm6JiysU4pOq-bGHYm9pqAPujToz496NNHfXo_QGyEhsHDIhf_qv-hfgBffXPy</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3076829160</pqid></control><display><type>article</type><title>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</title><source>SpringerLink Journals - AutoHoldings</source><creator>Barrón, Gabriela B. ; Olvera, M. de la L.</creator><creatorcontrib>Barrón, Gabriela B. ; Olvera, M. de la L.</creatorcontrib><description>In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared NH 4 F . The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-024-13089-z</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Acetic acid ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Deionization ; Glass substrates ; Hall effect ; Materials Science ; Morphology ; Optical and Electronic Materials ; Precursors ; Thin films ; Wurtzite ; Zinc acetate ; Zinc oxide</subject><ispartof>Journal of materials science. Materials in electronics, 2024-07, Vol.35 (19), p.1366, Article 1366</ispartof><rights>The Author(s) 2024</rights><rights>The Author(s) 2024. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c244t-8804203c66c758a62a12d15ffd75ce7c7aa6361ede0cb528ff3faca37570a4603</cites><orcidid>0009-0002-6976-9048</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-024-13089-z$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-024-13089-z$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,27923,27924,41487,42556,51318</link.rule.ids></links><search><creatorcontrib>Barrón, Gabriela B.</creatorcontrib><creatorcontrib>Olvera, M. de la L.</creatorcontrib><title>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared NH 4 F . The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</description><subject>Acetic acid</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Deionization</subject><subject>Glass substrates</subject><subject>Hall effect</subject><subject>Materials Science</subject><subject>Morphology</subject><subject>Optical and Electronic Materials</subject><subject>Precursors</subject><subject>Thin films</subject><subject>Wurtzite</subject><subject>Zinc acetate</subject><subject>Zinc oxide</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNp9kD1PwzAURS0EEqXwB5gsMQeev2KXDVUUkCp1gEqIxXIdG1ylSbCTIf31pA0SG9Nb7rlP9yB0TeCWAMi7REAJngHlGWGgZtn-BE2IkCzjir6fognMhMy4oPQcXaS0BYCcMzVB69e2K3pce7z4WOH2K1TYh3KXcOGaOoXWFXjT465so0l1FSxOTTT9PQ6VLztXWXdAm-hsF1Md8S6UZag-L9GZN2VyV793itaLx7f5c7ZcPb3MH5aZpZy3mVLAKTCb51YKZXJqCC2I8L6QwjpppTE5y4krHNiNoMp75o01TAoJhufApuhm7G1i_d251Opt3cVqeKkZyFzRGTmm6JiysU4pOq-bGHYm9pqAPujToz496NNHfXo_QGyEhsHDIhf_qv-hfgBffXPy</recordid><startdate>20240701</startdate><enddate>20240701</enddate><creator>Barrón, Gabriela B.</creator><creator>Olvera, M. de la L.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>F28</scope><scope>FR3</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0009-0002-6976-9048</orcidid></search><sort><creationdate>20240701</creationdate><title>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</title><author>Barrón, Gabriela B. ; Olvera, M. de la L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c244t-8804203c66c758a62a12d15ffd75ce7c7aa6361ede0cb528ff3faca37570a4603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>Acetic acid</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Deionization</topic><topic>Glass substrates</topic><topic>Hall effect</topic><topic>Materials Science</topic><topic>Morphology</topic><topic>Optical and Electronic Materials</topic><topic>Precursors</topic><topic>Thin films</topic><topic>Wurtzite</topic><topic>Zinc acetate</topic><topic>Zinc oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Barrón, Gabriela B.</creatorcontrib><creatorcontrib>Olvera, M. de la L.</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Barrón, Gabriela B.</au><au>Olvera, M. de la L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2024-07-01</date><risdate>2024</risdate><volume>35</volume><issue>19</issue><spage>1366</spage><pages>1366-</pages><artnum>1366</artnum><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>In this work, the results of the study of ZnO:F (FZO) films deposited on glass substrates using the ultrasonic chemical spray technique are reported. For the preparation of the films, starting solutions were used at a concentration of 0.2 M of zinc acetate dihydrate [Zn(CH 3 COO) 2 .2H 2 O]) dissolved in a mixture of deionized water:methanol:acetic acid. The precursor was previously ground in a planetary ball mill at 500 rpm at different times. For the addition of the dopant, a 1.6 M solution of ammonium fluoride in deionized water was prepared NH 4 F . The atomic ratio of [F]/[F + Zn] remained constant at 30 at%. Structural characterizations by X-ray diffraction, morphological by scanning electron microscopy, optical by UV–Vis spectroscopy, and electrical by Hall effect were performed on all deposited films. From the analysis of results, the hexagonal wurtzite phase was confirmed, and a variation of the morphology was observed depending on the deposit conditions. In general, the films presented high optical transmittance in the visible region and the n-type conductivity was confirmed.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-024-13089-z</doi><orcidid>https://orcid.org/0009-0002-6976-9048</orcidid><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0957-4522
ispartof Journal of materials science. Materials in electronics, 2024-07, Vol.35 (19), p.1366, Article 1366
issn 0957-4522
1573-482X
language eng
recordid cdi_proquest_journals_3076829160
source SpringerLink Journals - AutoHoldings
subjects Acetic acid
Characterization and Evaluation of Materials
Chemistry and Materials Science
Deionization
Glass substrates
Hall effect
Materials Science
Morphology
Optical and Electronic Materials
Precursors
Thin films
Wurtzite
Zinc acetate
Zinc oxide
title Study of FZO thin films deposited by ultrasonic spray: influence of precursor milling
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T16%3A15%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Study%20of%20FZO%20thin%20films%20deposited%20by%20ultrasonic%20spray:%20influence%20of%20precursor%20milling&rft.jtitle=Journal%20of%20materials%20science.%20Materials%20in%20electronics&rft.au=Barr%C3%B3n,%20Gabriela%20B.&rft.date=2024-07-01&rft.volume=35&rft.issue=19&rft.spage=1366&rft.pages=1366-&rft.artnum=1366&rft.issn=0957-4522&rft.eissn=1573-482X&rft_id=info:doi/10.1007/s10854-024-13089-z&rft_dat=%3Cproquest_cross%3E3076829160%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3076829160&rft_id=info:pmid/&rfr_iscdi=true