Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy

We present direct evidence, for the first time, for the flash‐induced generation of crystal defects in single‐crystal cubic zirconia. The defects are characterized by multiple techniques. The crystals were flashed and then cooled down to ambient temperature in Ar atmosphere to preserve the electroni...

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Veröffentlicht in:	Journal of the American Ceramic Society 2024-09, Vol.107 (9), p.5786-5800
Hauptverfasser:	Jo, Seohyeon, Kindelmann, Moritz, Jennings, Dylan, Balice, Luca, Sohn, Yoo Jung, Scheld, Walter Sebastian, Bram, Martin, Guillon, Olivier, Mayer, Joachim, Raj, Rishi
Format:	Artikel
Sprache:	eng
Schlagworte:	Ambient temperature Crystal defects Crystal structure Cubic lattice defects Electron diffraction Electron energy loss spectroscopy Electronic structure Electrons flash sintering Mechanical polishing microstructure Oxygen ions Parameters Raman spectroscopy Spectrum analysis Stoichiometry Surface layers transmission electron microscopy Workpieces zirconia Zirconium dioxide zirconium suboxide
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