45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation

45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation

Organic light‐emitting diodes (OLEDs) feature flexible and homogeneous large area emission. Although, in terms of performance, OLEDs are typically characterized by an efficiency drop at high brightness levels. This phenomenon, usually addressed as efficiency roll‐off, is mainly caused by exciton que...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:SID International Symposium Digest of technical papers 2024-04, Vol.55 (S1), p.401-404
Hauptverfasser: Stanzani, Edoardo, Sem, Stefano, Zeder, Simon, Georgakopoulos, Vasileios, Züfle, Simon, Jenatsch, Sandra, Ruhstaller, Beat
Format: Artikel
Sprache:eng
Schlagworte:
charge injection
efficiency roll-off
exciton quenching
Excitons
MPLS
OLED
Organic light emitting diodes
Quenching
recombination profile
TPQ
TTA
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 404
container_issue S1
container_start_page 401
container_title SID International Symposium Digest of technical papers
container_volume 55
creator Stanzani, Edoardo
Sem, Stefano
Zeder, Simon
Georgakopoulos, Vasileios
Züfle, Simon
Jenatsch, Sandra
Ruhstaller, Beat
description Organic light‐emitting diodes (OLEDs) feature flexible and homogeneous large area emission. Although, in terms of performance, OLEDs are typically characterized by an efficiency drop at high brightness levels. This phenomenon, usually addressed as efficiency roll‐off, is mainly caused by exciton quenching processes. Here, we introduce an improved methodology for exploring exciton quenching in OLEDs, which integrates both characterization and device simulation. Through a multitarget optimization process, we effectively distinguish between triplet‐polaron quenching (TPQ) and triplet‐triplet annihilation (TTA).
doi_str_mv 10.1002/sdtp.17093
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_3072722900</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3072722900</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1053-921e8066b87bc1c3392feb94402a2e384deb5b52a63fbb5398f05843d6581acc3</originalsourceid><addsrcrecordid>eNp9kMtKw0AUhgdRsFY3PkHAnZA6l0yScSexXqBQpRXcDTOTSTMlTeJMotaF-Ag-o09imrh2dc4P3384fACcIjhBEOILlzb1BEWQkT0wwiiMfYgo2wcjCFnkszB8PgRHzq0hJCQI2Ah8BvTn65tcekm1qa3OdenMq_am73VRWdGYqvSqrIvKNN362OpS5aZceab05rPptfOa3FbtKt_1pSl16iW5sEI12pqPoS_KtL_eNn0Whbcwm7bowzE4yETh9MnfHIOnm-kyufNn89v75GrmKwQp8RlGOoZhKONIKqQIYTjTkgUBxAJrEgepllRSLEKSSUkJizNI44CkIY2RUIqMwdlwt7bVS6tdw9dVa7tfHCcwwhHGrFMyBucDpWzlnNUZr63ZCLvlCPKdX77zy3u_HYwG-M0UevsPyRfXy4eh8wv_MH_C</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>3072722900</pqid></control><display><type>article</type><title>45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation</title><source>Access via Wiley Online Library</source><creator>Stanzani, Edoardo ; Sem, Stefano ; Zeder, Simon ; Georgakopoulos, Vasileios ; Züfle, Simon ; Jenatsch, Sandra ; Ruhstaller, Beat</creator><creatorcontrib>Stanzani, Edoardo ; Sem, Stefano ; Zeder, Simon ; Georgakopoulos, Vasileios ; Züfle, Simon ; Jenatsch, Sandra ; Ruhstaller, Beat</creatorcontrib><description>Organic light‐emitting diodes (OLEDs) feature flexible and homogeneous large area emission. Although, in terms of performance, OLEDs are typically characterized by an efficiency drop at high brightness levels. This phenomenon, usually addressed as efficiency roll‐off, is mainly caused by exciton quenching processes. Here, we introduce an improved methodology for exploring exciton quenching in OLEDs, which integrates both characterization and device simulation. Through a multitarget optimization process, we effectively distinguish between triplet‐polaron quenching (TPQ) and triplet‐triplet annihilation (TTA).</description><identifier>ISSN: 0097-966X</identifier><identifier>EISSN: 2168-0159</identifier><identifier>DOI: 10.1002/sdtp.17093</identifier><language>eng</language><publisher>Campbell: Wiley Subscription Services, Inc</publisher><subject>charge injection ; efficiency roll-off ; exciton quenching ; Excitons ; MPLS ; OLED ; Organic light emitting diodes ; Quenching ; recombination profile ; TPQ ; TTA</subject><ispartof>SID International Symposium Digest of technical papers, 2024-04, Vol.55 (S1), p.401-404</ispartof><rights>2024 The Society for Information Display</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1053-921e8066b87bc1c3392feb94402a2e384deb5b52a63fbb5398f05843d6581acc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fsdtp.17093$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fsdtp.17093$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><creatorcontrib>Stanzani, Edoardo</creatorcontrib><creatorcontrib>Sem, Stefano</creatorcontrib><creatorcontrib>Zeder, Simon</creatorcontrib><creatorcontrib>Georgakopoulos, Vasileios</creatorcontrib><creatorcontrib>Züfle, Simon</creatorcontrib><creatorcontrib>Jenatsch, Sandra</creatorcontrib><creatorcontrib>Ruhstaller, Beat</creatorcontrib><title>45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation</title><title>SID International Symposium Digest of technical papers</title><description>Organic light‐emitting diodes (OLEDs) feature flexible and homogeneous large area emission. Although, in terms of performance, OLEDs are typically characterized by an efficiency drop at high brightness levels. This phenomenon, usually addressed as efficiency roll‐off, is mainly caused by exciton quenching processes. Here, we introduce an improved methodology for exploring exciton quenching in OLEDs, which integrates both characterization and device simulation. Through a multitarget optimization process, we effectively distinguish between triplet‐polaron quenching (TPQ) and triplet‐triplet annihilation (TTA).</description><subject>charge injection</subject><subject>efficiency roll-off</subject><subject>exciton quenching</subject><subject>Excitons</subject><subject>MPLS</subject><subject>OLED</subject><subject>Organic light emitting diodes</subject><subject>Quenching</subject><subject>recombination profile</subject><subject>TPQ</subject><subject>TTA</subject><issn>0097-966X</issn><issn>2168-0159</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKw0AUhgdRsFY3PkHAnZA6l0yScSexXqBQpRXcDTOTSTMlTeJMotaF-Ag-o09imrh2dc4P3384fACcIjhBEOILlzb1BEWQkT0wwiiMfYgo2wcjCFnkszB8PgRHzq0hJCQI2Ah8BvTn65tcekm1qa3OdenMq_am73VRWdGYqvSqrIvKNN362OpS5aZceab05rPptfOa3FbtKt_1pSl16iW5sEI12pqPoS_KtL_eNn0Whbcwm7bowzE4yETh9MnfHIOnm-kyufNn89v75GrmKwQp8RlGOoZhKONIKqQIYTjTkgUBxAJrEgepllRSLEKSSUkJizNI44CkIY2RUIqMwdlwt7bVS6tdw9dVa7tfHCcwwhHGrFMyBucDpWzlnNUZr63ZCLvlCPKdX77zy3u_HYwG-M0UevsPyRfXy4eh8wv_MH_C</recordid><startdate>202404</startdate><enddate>202404</enddate><creator>Stanzani, Edoardo</creator><creator>Sem, Stefano</creator><creator>Zeder, Simon</creator><creator>Georgakopoulos, Vasileios</creator><creator>Züfle, Simon</creator><creator>Jenatsch, Sandra</creator><creator>Ruhstaller, Beat</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope></search><sort><creationdate>202404</creationdate><title>45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation</title><author>Stanzani, Edoardo ; Sem, Stefano ; Zeder, Simon ; Georgakopoulos, Vasileios ; Züfle, Simon ; Jenatsch, Sandra ; Ruhstaller, Beat</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1053-921e8066b87bc1c3392feb94402a2e384deb5b52a63fbb5398f05843d6581acc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><topic>charge injection</topic><topic>efficiency roll-off</topic><topic>exciton quenching</topic><topic>Excitons</topic><topic>MPLS</topic><topic>OLED</topic><topic>Organic light emitting diodes</topic><topic>Quenching</topic><topic>recombination profile</topic><topic>TPQ</topic><topic>TTA</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Stanzani, Edoardo</creatorcontrib><creatorcontrib>Sem, Stefano</creatorcontrib><creatorcontrib>Zeder, Simon</creatorcontrib><creatorcontrib>Georgakopoulos, Vasileios</creatorcontrib><creatorcontrib>Züfle, Simon</creatorcontrib><creatorcontrib>Jenatsch, Sandra</creatorcontrib><creatorcontrib>Ruhstaller, Beat</creatorcontrib><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>SID International Symposium Digest of technical papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Stanzani, Edoardo</au><au>Sem, Stefano</au><au>Zeder, Simon</au><au>Georgakopoulos, Vasileios</au><au>Züfle, Simon</au><au>Jenatsch, Sandra</au><au>Ruhstaller, Beat</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation</atitle><jtitle>SID International Symposium Digest of technical papers</jtitle><date>2024-04</date><risdate>2024</risdate><volume>55</volume><issue>S1</issue><spage>401</spage><epage>404</epage><pages>401-404</pages><issn>0097-966X</issn><eissn>2168-0159</eissn><abstract>Organic light‐emitting diodes (OLEDs) feature flexible and homogeneous large area emission. Although, in terms of performance, OLEDs are typically characterized by an efficiency drop at high brightness levels. This phenomenon, usually addressed as efficiency roll‐off, is mainly caused by exciton quenching processes. Here, we introduce an improved methodology for exploring exciton quenching in OLEDs, which integrates both characterization and device simulation. Through a multitarget optimization process, we effectively distinguish between triplet‐polaron quenching (TPQ) and triplet‐triplet annihilation (TTA).</abstract><cop>Campbell</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/sdtp.17093</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0097-966X
ispartof SID International Symposium Digest of technical papers, 2024-04, Vol.55 (S1), p.401-404
issn 0097-966X
2168-0159
language eng
recordid cdi_proquest_journals_3072722900
source Access via Wiley Online Library
subjects charge injection
efficiency roll-off
exciton quenching
Excitons
MPLS
OLED
Organic light emitting diodes
Quenching
recombination profile
TPQ
TTA
title 45‐3: Comprehensive Exploration of Exciton Quenching in OLEDs through Combined Characterization and Computational Simulation
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T18%3A10%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=45%E2%80%903:%20Comprehensive%20Exploration%20of%20Exciton%20Quenching%20in%20OLEDs%20through%20Combined%20Characterization%20and%20Computational%20Simulation&rft.jtitle=SID%20International%20Symposium%20Digest%20of%20technical%20papers&rft.au=Stanzani,%20Edoardo&rft.date=2024-04&rft.volume=55&rft.issue=S1&rft.spage=401&rft.epage=404&rft.pages=401-404&rft.issn=0097-966X&rft.eissn=2168-0159&rft_id=info:doi/10.1002/sdtp.17093&rft_dat=%3Cproquest_cross%3E3072722900%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=3072722900&rft_id=info:pmid/&rfr_iscdi=true